A 1 GS/s, 31 MHz BW, 76.3 dB Dynamic Range, 34 mW CT-ΔΣ ADC with 1.5 Cycle Quantizer Delay and Improved STF

A 1 GS/s continuous-time delta-sigma modulator (CT- ΔΣM) with 31 MHz bandwidth, 76.3 dB dynamic range and 72.5 dB peak-SNDR is reported in a 0.13 μm CMOS technology. The design employs an excess loop delay (ELD) of more than one clock cycle for achieving higher sampling rate. The ELD is compensated using a fast-loop formed around the last integrator by using a sample-and-hold. Further, the effect of this ELD compensation scheme on the signal transfer function (STF) of a feedforward CT- ΔΣ architecture has been analyzed and reported. In this work, an improved STF is achieved by using a combination of feed-forward, feed-back and feed-in paths and power consumption is reduced by eliminating the adder opamp. This CT- ΔΣ M has a conversion bandwidth of 31 MHz and consumes 34 mW from the 1.2 V power supply. The relevant design trade-offs have been investigated and presented along with simulation results

Low Noise, Jitter Tolerant Continuous-Time Sigma-Delta Modulator

The demand for higher data rates in receivers with carrier aggregation (CA) such as LTE, increases the efforts to integrate large number of wireless services into single receiving path, so it needs to digitize the signal in intermediate or high frequencies. It relaxes most of the front-end blocks but makes the design of ADC very challenging. Solving the bottleneck associated with ADC in receiver architecture is a major focus of many ongoing researches. Recently, continuous time Sigma-Delta analog-to-digital converters (ADCs) are getting more attention due to their inherent filtering properties, lower power consumption and wider input bandwidth. But, it suffers from several non-idealities such as clock jitter and ELD which decrease the ADC performance. This dissertation presents two projects that address CT-ΣΔ modulator non-idealities. One of the projects is a CT- ΣΔ modulator with 10.9 Effective Number of Bits (ENOB) with Gradient Descent (GD) based calibration technique. The GD algorithm is used to extract loop gain transfer function coefficients. A quantization noise reduction technique is then employed to improve the Signal to Quantization Noise Ratio (SQNR) of the modulator using a 7-bit embedded quantizer. An analog fast path feedback topology is proposed which uses an analog differentiator in order to compensate excess loop delay. This approach relaxes the requirements of the amplifier placed in front of the quantizer. The modulator is implemented using a third order loop filter with a feed-forward compensation paths and a 3-bit quantizer in the feedback loop. In order to save power and improve loop linearity a two-stage class-AB amplifier is developed. The prototype modulator is implemented in 0.13μm CMOS technology, which achieves peak Signal to Noise and Distortion Ratio (SNDR) of 67.5dB while consuming total power of 8.5-mW under a 1.2V supply with an over sampling ratio of 10 at 300MHz sampling frequency. The prototype achieves Walden's Figure of Merit (FoM) of 146fJ/step. The second project addresses clock jitter non-ideality in Continuous Time Sigma Delta modulators (CT- ΣΔM), the modulator suffer from performance degradation due to uncertainty in timing of clock at digital-to-analog converter (DAC). This thesis proposes to split the loop filter into two parts, analog and digital part to reduce the sensitivity of feedback DAC to clock jitter. By using the digital first-order filter after the quantizer, the effect of clock jitter is reduced without changing signal transfer function (STF). On the other hand, as one pole of the loop filter is implemented digitally, the power and area are reduced by minimizing active analog elements. Moreover, having more digital blocks in the loop of CT- ΣΔM makes it less sensitive to process, voltage, and temperature variations. We also propose the use of a single DAC with a current divider to implement feedback coefficients instead of two DACs to decrease area and clock routing. The prototype is implemented in TSMC 40 nm technology and occupies 0.06 mm^2 area; the proposed solution consumes 6.9 mW, and operates at 500 MS/s. In a 10 MHz bandwidth, the measured dynamic range (DR), peak signal-to-noise-ratio (SNR), and peak signal-to-noise and distortion (SNDR) ratios in presence of 4.5 ps RMS clock jitter (0.22% clock period) are 75 dB, 68 dB, and 67 dB, respectively. The proposed structure is 10 dB more tolerant to clock jitter when compared to the conventional ΣΔM design for similar loop filter

Multi-Stage Noise-Shaping Continuous-Time Sigma-Delta Modulator

The design of a single-loop continuous-time ∑∆ modulator (CT∑∆M) with high resolution, wide bandwidth, and low power consumption is very challenging. The multi-stage noise-shaping (MASH) CT∑∆M architecture is identified as an advancement to the single-loop CT∑∆M architecture in order to satisfy the ever stringent requirements of next generation wireless systems. However, it suffers from the problems of quantization noise leakage and non-ideal interstage interfacing which hinder its widespread adoption. To solve these issues, this dissertation proposes a MASH CT∑∆M with on-chip RC time constant calibration circuits, multiple feedforward interstage paths, and a fully integrated noise cancellation filter (NCF). The prototype core modulator architecture is a cascade of two single-loop second- order CT∑∆M stages, each of which consists of an integrator-based active-RC loop filter, current-steering feedback digital-to-analog converters, and a four-bit flash quantizer. On-chip RC time constant calibration circuits and high gain multi-stage operational amplifiers are realized to mitigate quantization noise leakage due to process variation. Multiple feedforward interstage paths are introduced to (i) synthesize a fourth-order noise transfer function with DC zeros, (ii) simplify the design of NCF, and (iii) reduce signal swings at the second-stage integrator outputs. Fully integrated in 40 nm CMOS, the prototype chip achieves 74.4 dB of signal-to-noise and distortion ratio (SNDR), 75.8 dB of signal-to-noise ratio, and 76.8 dB of dynamic range in 50.3 MHz of bandwidth (BW) at 1 GHz of sampling frequency with 43.0 mW of power consumption (P). It does not require external software calibration and possesses minimal out-of-band signal transfer function peaking. The figure-of-merit (FOM), defined as FOM = SNDR + 10 log10(BW/P), is 165.1 dB

Wide-bandwidth, high-resolution delta-sigma analog-to-digital converters

There is a significant need in recent mobile communication and wireless broadband systems for high-performance analog-to-digital converters (ADCs) that have wide bandwidth (BW>5-MHz) and high data rate (>100-Mbps). A delta-sigma ADC is recognized as a power-efficient ADC architecture when high resolution (>12-b) is required. This is due to several advantages of the delta-sigma ADC including relaxed anti-aliasing filter requirements, high signal-to-noise and distortion ratio (SNDR) and most importantly, reduced sensitivity to analog imperfections. In this thesis, several structures and design techniques are developed for the implementation of continuoustime (CT) and discrete-time (DT) delta-sigma ADCs. These techniques save the total power consumption, reduce the design complexity, and decrease the chip die area of delta-sigma modulators. First a 4th-order single stage CT delta-sigma ADC with a novel single-amplifier-biquad (SAB) based loop filter is presented. By utilizing the SAB networks in the loop filter of an Nth-order CT delta-sigma modulator, it requires only half the number of active amplifiers and feed-forward branches used in the conventional modulator architecture, thus decreasing the power consumption and area by reducing the number of amplifiers. The proposed scheme also enables the modulator to use a switch-capacitor (SC) adder due to the reduced number of feedforward branches to its summing block. As a sequence, it consumes less power compared to a conventional CT adder. With a 130-nm CMOS technology, the fabricated prototype IC achieves a dynamic range of 80 dB with 10 MHz signal bandwidth and analog power dissipation lower than 12 mW. Presented as the second scheme to save power consumption and chip die area in ΔΣ modulators is a new stage-sharing technique in a discrete-time 2-2 MASH ΔΣ ADC. The proposed technique shares all the active blocks of the modulator second stage with its first stage during the two non-overlapping clock phases. Measurement results show that the modulator designed in a 0.13-um CMOS technology achieves 76 dB SNDR over a 10 MHz conversion bandwidth dissipating less than 9 mW analog power

Design of sigma-delta modulators for analog-to-digital conversion intensively using passive circuits

This thesis presents the analysis, design implementation and experimental evaluation of passiveactive discrete-time and continuous-time Sigma-Delta (ΣΔ) modulators (ΣΔMs) analog-todigital converters (ADCs). Two prototype circuits were manufactured. The first one, a discrete-time 2nd-order ΣΔM, was designed in a 130 nm CMOS technology. This prototype confirmed the validity of the ultra incomplete settling (UIS) concept used for implementing the passive integrators. This circuit, clocked at 100 MHz and consuming 298 μW, achieves DR/SNR/SNDR of 78.2/73.9/72.8 dB, respectively, for a signal bandwidth of 300 kHz. This results in a Walden FoMW of 139.3 fJ/conv.-step and Schreier FoMS of 168 dB. The final prototype circuit is a highly area and power efficient ΣΔM using a combination of a cascaded topology, a continuous-time RC loop filter and switched-capacitor feedback paths. The modulator requires only two low gain stages that are based on differential pairs. A systematic design methodology based on genetic algorithm, was used, which allowed decreasing the circuit’s sensitivity to the circuit components’ variations. This continuous-time, 2-1 MASH ΣΔM has been designed in a 65 nm CMOS technology and it occupies an area of just 0.027 mm2. Measurement results show that this modulator achieves a peak SNR/SNDR of 76/72.2 dB and DR of 77dB for an input signal bandwidth of 10 MHz, while dissipating 1.57 mW from a 1 V power supply voltage. The ΣΔM achieves a Walden FoMW of 23.6 fJ/level and a Schreier FoMS of 175 dB. The innovations proposed in this circuit result, both, in the reduction of the power consumption and of the chip size. To the best of the author’s knowledge the circuit achieves the lowest Walden FOMW for ΣΔMs operating at signal bandwidth from 5 MHz to 50 MHz reported to date

High-Speed Delta-Sigma Data Converters for Next-Generation Wireless Communication

In recent years, Continuous-time Delta-Sigma(CT-ΔΣ) analog-to-digital converters (ADCs) have been extensively investigated for their use in wireless receivers to achieve conversion bandwidths greater than 15 MHz and higher resolution of 10 to 14 bits. This dissertation investigates the current state-of-the-art high-speed single-bit and multi-bit Continuous-time Delta-Sigma modulator (CT-ΔΣM) designs and their limitations due to circuit non-idealities in achieving the performance required for next-generation wireless standards. Also, we presented complete architectural and circuit details of a high-speed single-bit and multi-bit CT-ΔΣM operating at a sampling rate of 1.25 GSps and 640 MSps respectively (the highest reported sampling rate in a 0.13 μm CMOS technology node) with measurement results. Further, we propose novel hybrid ΔΣ architecture with two-step quantizer to alleviate the bandwidth and resolution bottlenecks associated with the contemporary CT-ΔΣM topologies. To facilitate the design with the proposed architecture, a robust systematic design method is introduced to determine the loop-filter coefficients by taking into account the non-ideal integrator response, such as the finite opamp gain and the presence of multiple parasitic poles and zeros. Further, comprehensive system-level simulation is presented to analyze the effect of two-step quantizer non-idealities such as the offset and gain error in the sub-ADCs, and the current mismatch between the MSB and LSB elements in the feedback DAC. The proposed novel architecture is demonstrated by designing a high-speed wideband 4th order CT-ΔΣ modulator prototype, employing a two-step quantizer with 5-bits resolution. The proposed modulator takes advantage of the combination of a high-resolution two-step quantization technique and an excess-loop delay (ELD) compensation of more than one clock cycle to achieve lower-power consumption (28 mW), higher dynamic range (\u3e69 dB) with a wide conversion bandwidth (20 MHz), even at a lower sampling rate of 400 MHz. The proposed modulator achieves a Figure of Merit (FoM) of 340 fJ/level