616 research outputs found

    Algorithms for the scaling toward nanometer VLSI physical synthesis

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    Along the history of Very Large Scale Integration (VLSI), we have successfully scaled down the size of transistors, scaled up the speed of integrated circuits (IC) and the number of transistors in a chip - these are just a few examples of our achievement in VLSI scaling. It is projected to enter the nanometer (timing estimation and buffer planning for global routing and other early stages such as floorplanning. A novel path based buffer insertion scheme is also included, which can overcome the weakness of the net based approaches. Part-2 Circuit clustering techniques with the application in Field-Programmable Gate Array (FPGA) technology mapping The problem of timing driven n-way circuit partitioning with application to FPGA technology mapping is studied and a hierarchical clustering approach is presented for the latest multi-level FPGA architectures. Moreover, a more general delay model is included in order to accurately characterize the delay behavior of the clusters and circuit elements

    AI/ML Algorithms and Applications in VLSI Design and Technology

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    An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

    Power and Thermal Management of System-on-Chip

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    A survey of system level power management schemes in the dark-silicon era for many-core architectures

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    Power consumption in Complementary Metal Oxide Semiconductor (CMOS) technology has escalated to a point that only a fractional part of many-core chips can be powered-on at a time. Fortunately, this fraction can be increased at the expense of performance through the dark-silicon solution. However, with many-core integration set to be heading towards its thousands, power consumption and temperature increases per time, meaning the number of active nodes must be reduced drastically. Therefore, optimized techniques are demanded for continuous advancement in technology. Existing efforts try to overcome this challenge by activating nodes from different parts of the chip at the expense of communication latency. Other efforts on the other hand employ run-time power management techniques to manage the power performance of the cores trading-off performance for power. We found out that, for a significant amount of power to saved and high temperature to be avoided, focus should be on reducing the power consumption of all the on-chip components. Especially, the memory hierarchy and the interconnect. Power consumption can be minimized by, reducing the size of high leakage power dissipating elements, turning-off idle resources and integrating power saving materials

    Effective network grid synthesis and optimization for high performance very large scale integration system design

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    制度:新 ; 文部省報告番号:甲2642号 ; 学位の種類:博士(工学) ; 授与年月日:2008/3/15 ; 早大学位記番号:新480

    Formal and Informal Methods for Multi-Core Design Space Exploration

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    We propose a tool-supported methodology for design-space exploration for embedded systems. It provides means to define high-level models of applications and multi-processor architectures and evaluate the performance of different deployment (mapping, scheduling) strategies while taking uncertainty into account. We argue that this extension of the scope of formal verification is important for the viability of the domain.Comment: In Proceedings QAPL 2014, arXiv:1406.156

    Master of Science

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    thesisAdvances in silicon photonics are enabling hybrid integration of optoelectronic circuits alongside current complementary metal-oxide-semiconductor (CMOS) technologies. To fully exploit the capability of this integration, it is important to explore the effects of thermal gradients on optoelectronic devices. The sensitivity of optical components to temperature variation gives rise to design issues in silicon on insulator (SOI) optoelectronic technology. The thermo-electric effect becomes problematic with the integration of hybrid optoelectronic systems, where heat is generated from electrical components. Through the thermo-optic effect, the optical signals are in turn affected and compensation is necessary. To improve the capability of optical SOI designs, optical-wave-simulation models and the characteristic thermal operating environment need to be integrated to ensure proper operation. In order to exploit the potential for compensation by virtue of resynthesis, temperature characterization on a system level is required. Thermal characterization within the flow of physical design automation tools for hybrid optoelectronic technology enables device resynthesis and validation at a system level. Additionally, thermally-aware routing and placement would be possible. A simplified abstraction will help in the active design process, within the contemporary computer-aided design (CAD) flow when designing optoelectronic features. This thesis investigates an abstraction model to characterize the effect of a temperature gradient on optoelectronic circuit operation. To make the approach scalable, reduced order computations are desired that effectively model the effect of temperature on an optoelectronic layout; this is achieved using an electrical analogy to heat flow. Given an optoelectronic circuit, using a thermal resistance network to abstract thermal flow, we compute the temperature distribution throughout the layout. Subsequently, we show how this thermal distribution across the optoelectronic system layout can be integrated within optoelectronic device- and system-level analysis tools
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