Low power data-dependent transform video and still image coding

Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.Includes bibliographical references (p. 139-144).This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.This work introduces the idea of data dependent video coding for low power. Algorithms for the Discrete Cosine Transform (DCT) and its inverse are introduced which exploit statistical properties of the input data in both the space and spatial frequency domains in order to minimize the total number of arithmetic operations. Two VLSI chips have been built as a proof-of-concept of data dependent processing implementing the DCT and its inverse (IDCT). The IDCT core processor exploits the presence of a large number of zerovalued spectral coefficients in the input stream when stimulated with MPEG-compressed video sequences. Adata-driven IDCT computation algorithm along with clock gating techniques are used to reduce the number of arithmetic operations for video inputs. The second chip is a DCT core processor that exhibits two innovative techniques for arithmetic operation reduction in the DCT computation context along with standard voltage scaling techniques such as pipelining and parallelism. The first method reduces the bitwidth of arithmetic operations in the presence of data spatial correlation. The second method trades off power dissipation and image compression quality (arithmetic precision.) Both chips are fully functional and exhibit the lowest switched capacitance per sample among past DCT/IDCT chips reported in the literature. Their power dissipation profile shows a strong dependence with certain statistical properties of the data that they operate on, according to the design goal.by Thucydides Xanthopoulos.Ph.D

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

The Fifth NASA Symposium on VLSI Design

The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design

Multilevel Runtime Verification for Safety and Security Critical Cyber Physical Systems from a Model Based Engineering Perspective

Advanced embedded system technology is one of the key driving forces behind the rapid growth of Cyber-Physical System (CPS) applications. CPS consists of multiple coordinating and cooperating components, which are often software-intensive and interact with each other to achieve unprecedented tasks. Such highly integrated CPSs have complex interaction failures, attack surfaces, and attack vectors that we have to protect and secure against. This dissertation advances the state-of-the-art by developing a multilevel runtime monitoring approach for safety and security critical CPSs where there are monitors at each level of processing and integration. Given that computation and data processing vulnerabilities may exist at multiple levels in an embedded CPS, it follows that solutions present at the levels where the faults or vulnerabilities originate are beneficial in timely detection of anomalies. Further, increasing functional and architectural complexity of critical CPSs have significant safety and security operational implications. These challenges are leading to a need for new methods where there is a continuum between design time assurance and runtime or operational assurance. Towards this end, this dissertation explores Model Based Engineering methods by which design assurance can be carried forward to the runtime domain, creating a shared responsibility for reducing the overall risk associated with the system at operation. Therefore, a synergistic combination of Verification & Validation at design time and runtime monitoring at multiple levels is beneficial in assuring safety and security of critical CPS. Furthermore, we realize our multilevel runtime monitor framework on hardware using a stream-based runtime verification language

2-wire time independent asynchronous communications

Communications both to and between low end microprocessors represents a real cost in a number of industrial and consumer products. This thesis starts by examining the properties of protocols that help to minimize these expenses and comes to the conclusion that the derived set of properties define a new category of communications protocol : Time Independent Asynchronous ( TIA) communications. To show the utility of the TIA category we develop a novel TIA protocol that uses only 2-wires and general IO pins on each host. The protocol is analyzed using the Petri net based STG ( Signal Transition Graph) which is widely use to model asynchronous logic. It is shown that STGs do not accurately model the behavior of software driven systems and so a modified form called STG-FT ( STG For Threads) is developed to better model software systems. A simulator is created to take an STG-FT model and perform a full reachability tree analysis to prove correctness and analyze livelock and deadlock properties. The simulator can also examine the full reachability tree for every possible system state ( the cross product of all sub-system states), and analyze deadlock and livelock issues related to unexpected inputs and unusual situations. Reachability pruning algorithms are developed which decrease the search tree by a factor of approximately 250 million. The 2-wire protocol is implemented between a PC and an Atmel Tiny26 microprocessor, there is also a variant that works between microprocessors. Testing verifies the simulation results including an avoidable livelock condition with data throughput peaking at a useful 50 kilobits/second in both directions. The first practical application of 2-wire TIA is part of a novel debugger for the Atmel Tiny26 microprocessor. The approach can be extended to any microprocessor with general IO pins. TIA communications, developed in this thesis, is a serious contender whenever low end microprocessors must communicate with other processors. Consumer and industrial products may be able to achieve cost saving by using this new protocol

A multiple in-camera processing system for machine vision.

In a typical machine vision application, a line-scan camera positioned on the production line captures images of the parts to be inspected and sends them to the machine vision computer. The computer then uses high-speed data acquisition devices and sophisticated analysis software to extract information from these cameras and generates decisions about the product and manufacturing system. As the manufacturing systems increasingly generate more fine featured and advanced products, the need for higher resolution and faster processing of these camera images is necessary to maintain quality control. To reduce the overwhelming amount of data from multiple camera systems to the analysis computer, an in-camera processing system is introduced. This system involves placing a computing system inside the camera which can perform similar operations to the analysis system, but without all of the additional overhead components. The work presented in this thesis describes an enhanced embedded system which is mounted into a DALSA line-scan camera. This system provides support for real-time one dimensional signal processing with the aid of integrated hardware and software resources.Dept. of Electrical and Computer Engineering. Paper copy at Leddy Library: Theses & Major Papers - Basement, West Bldg. / Call Number: Thesis1999 .M89. Source: Masters Abstracts International, Volume: 40-03, page: 0757. Adviser: Graham A. Jullien. Thesis (M.Sc.)--University of Windsor (Canada), 1999

Cost modelling and concurrent engineering for testable design

This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University.As integrated circuits and printed circuit boards increase in complexity, testing becomes a major cost factor of the design and production of the complex devices. Testability has to be considered during the design of complex electronic systems, and automatic test systems have to be used in order to facilitate the test. This fact is now widely accepted in industry. Both design for testability and the usage of automatic test systems aim at reducing the cost of production testing or, sometimes, making it possible at all. Many design for testability methods and test systems are available which can be configured into a production test strategy, in order to achieve high quality of the final product. The designer has to select from the various options for creating a test strategy, by maximising the quality and minimising the total cost for the electronic system. This thesis presents a methodology for test strategy generation which is based on consideration of the economics during the life cycle of the electronic system. This methodology is a concurrent engineering approach which takes into account all effects of a test strategy on the electronic system during its life cycle by evaluating its related cost. This objective methodology is used in an original test strategy planning advisory system, which allows for test strategy planning for VLSI circuits as well as for digital electronic systems. The cost models which are used for evaluating the economics of test strategies are described in detail and the test strategy planning system is presented. A methodology for making decisions which are based on estimated costing data is presented. Results of using the cost models and the test strategy planning system for evaluating the economics of test strategies for selected industrial designs are presented