A High-Speed and Low-Offset Dynamic Latch Comparator

Circuit intricacy, speed, low-offset voltage, and resolution are essential factors for high-speed applications like analog-to-digital converters (ADCs). The comparator circuit with preamplifier increases the power dissipation, as it requires higher amount of currents than the latch circuitry. In this research, a novel topology of dynamic latch comparator is illustrated, which is able to provide high speed, low offset, and high resolution. Moreover, the circuit is able to reduce the power dissipation as the topology is based on latch circuitry. The cross-coupled circuit mechanism with the regenerative latch is employed for enhancing the dynamic latch comparator performance. In addition, input-tracking phase is used to reduce the offset voltage. The Monte-Carlo simulation results for the designed comparator in 0.18 μm CMOS process show that the equivalent input-referred offset voltage is 720 μV with 3.44 mV standard deviation. The simulated result shows that the designed comparator has 8-bit resolution and dissipates 158.5 μW of power under 1.8 V supply while operating with a clock frequency of 50 MHz. In addition, the proposed dynamic latch comparator has a layout size of 148.80 μm×59.70 μm

Characterization & Comparative Analysis of High Speed CMOS Comparator for Pipelined ADC

In todays high speed low power era, there is an increasing demand of a High Speed Comparator for ADC, DAC and various other applications in an analog and digital domain. This paper describes and analyzes five different architecture for low power and high speed comparators. In this paper, authors have analyzed and simulated the designs using TSMC 0.35 m CMOS technology with 2.0V for preamplifier based comparator and 1.8V power supply for dynamic comparators. The simulation results allow the circuit designer to fully explore the tradeoffs in comparator design, such as offset voltage, speed, power and area for Pipelined A/D Converters. Prelayout and postlayout simulations are carried out using Eldo SPICE tool and layout using IC Station

Performance Analysis of a High-Speed High-Precision Dynamic Comparator

238-245Comparators are the key structure of any analog-to-digital-converters (ADCs). In recent days various low power and high-speed comparators have been introduced and reported by many researchers. This paper presents an examination of various kinds of comparators which is the second most generally utilized hardware block. The preamplifier stage is mainly concerned with the power of the comparator, while latch structure defines the overall comparison speed. Hence, both the stages of dynamic comparator need to be designed efficiently for achieving optimized performance. Proper optimization of transistors in the comparator circuit helps to achieve low power dissipation and operate at a sufficiently low offset voltage. All the circuit has been implemented and simulated using cadence virtuoso tool in 180 nm technology and uses a clock of frequency 500 MHz to control the two stages of the comparator and provides rail to rail input common-mode voltage. The power and delay of different comparator circuits have been analyzed. The results obtained from the analysis show that there is a 32% reduction in power and the comparator design was 29% faster as compared to the conventional circuit

Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

Neuro-fuzzy chip to handle complex tasks with analog performance

This paper presents a mixed-signal neuro-fuzzy controller chip which, in terms of power consumption, input–output delay, and precision, performs as a fully analog implementation. However, it has much larger complexity than its purely analog counterparts. This combination of performance and complexity is achieved through the use of a mixed-signal architecture consisting of a programmable analog core of reduced complexity, and a strategy, and the associated mixed-signal circuitry, to cover the whole input space through the dynamic programming of this core. Since errors and delays are proportional to the reduced number of fuzzy rules included in the analog core, they are much smaller than in the case where the whole rule set is implemented by analog circuitry. Also, the area and the power consumption of the new architecture are smaller than those of its purely analog counterparts simply because most rules are implemented through programming. The Paper presents a set of building blocks associated to this architecture, and gives results for an exemplary prototype. This prototype, called multiplexing fuzzy controller (MFCON), has been realized in a CMOS 0.7 um standard technology. It has two inputs, implements 64 rules, and features 500 ns of input to output delay with 16-mW of power consumption. Results from the chip in a control application with a dc motor are also provided

Neuro-fuzzy chip to handle complex tasks with analog performance

This Paper presents a mixed-signal neuro-fuzzy controller chip which, in terms of power consumption, input-output delay and precision performs as a fully analog implementation. However, it has much larger complexity than its purely analog counterparts. This combination of performance and complexity is achieved through the use of a mixed-signal architecture consisting of a programmable analog core of reduced complexity, and a strategy, and the associated mixed-signal circuitry, to cover the whole input space through the dynamic programming of this core [1]. Since errors and delays are proportional to the reduced number of fuzzy rules included in the analog core, they are much smaller than in the case where the whole rule set is implemented by analog circuitry. Also, the area and the power consumption of the new architecture are smaller than those of its purely analog counterparts simply because most rules are implemented through programming. The Paper presents a set of building blocks associated to this architecture, and gives results for an exemplary prototype. This prototype, called MFCON, has been realized in a CMOS 0.7μm standard technology. It has two inputs, implements 64 rules and features 500ns of input to output delay with 16mW of power consumption. Results from the chip in a control application with a DC motor are also provided