210 research outputs found

    High Voltage and Nanoscale CMOS Integrated Circuits for Particle Physics and Quantum Computing

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    An high-speed parametric ADC and a co-designed mixer for CMOS RF receivers

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    Dissertação apresentada na faculdade de Ciências e Tecnologia da Universidade Nova de Lisboa para a obtenção do grau de Mestre em Engenharia Electrotécnica e de ComputadoresThe rapid growth of wireless communications and the massive use of wireless end-user equipments have created a demand for low-cost, low-power and low-area devices with tight specifications imposed by standards. The advances in CMOS technology allows, nowadays, designers to implement circuits that work at high-frequencies, thus, allowing the complete implementation of RF front ends in a single chip. In this work, a co-design strategy for the implementation of a fully integrated CMOS receiver for use in the ISM band is presented. The main focus is given to the Mixer and the ADC blocks of the presented architecture. The traditional approach used in RF design requires 50 matching buffers and networks and AC coupling capacitors between Mixer inputs and LNA and LO outputs. The codesign strategy avoids the use of DC choke inductors for Mixer biasing, because it is possible to use the DC level from the output of the LNA and the LO to provide bias to the Mixer. Moreover, since the entire circuit is in the same chip and the Mixer inputs are transistors gates, we should consider voltage instead of power and avoid the 50 matching networks. The proposed ADC architecture relies on a 4-bit flash converter. The main goals are to achieve low-power and high sampling frequency. To meet these goals, parametric amplification based on MOS varactors is applied to reduce the offset voltage of the comparators, avoiding the traditional and power-consuming approach of active pre-amplification gain stages

    High-Speed Analog-to-Digital Converters for Broadband Applications

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    Flash Analog-to-Digital Converters (ADCs), targeting optical communication standards, have been reported in SiGe BiCMOS technology. CMOS implementation of such designs faces two challenges. The first is to achieve a high sampling speed, given the lower gain-bandwidth (lower ft) of CMOS technology. The second challenge is to handle the wide bandwidth of the input signal with a certain accuracy. Although the first problem can be relaxed by using the time-interleaved architecture, the second problem remains as a main obstacle to CMOS implementation. As a result, the feasibility of the CMOS implementation of ADCs for such applications, or other wide band applications, depends primarily on achieving a very small input capacitance (large bandwidth) at the desired accuracy. In the flash architecture, the input capacitance is traded off for the achievable accuracy. This tradeoff becomes tighter with technology scaling. An effective way to ease this tradeoff is to use resistive offset averaging. This permits the use of smaller area transistors, leading to a reduction in the ADC input capacitance. In addition, interpolation can be used to decrease the input capacitance of flash ADCs. In an interpolating architecture, the number of ADC input preamplifiers is reduced significantly, and a resistor network interpolates the missing zero-crossings needed for an N-bit conversion. The resistive network also averages out the preamplifiers offsets. Consequently, an interpolating network works also as an averaging network. The resistor network used for averaging or interpolation causes a systematic non-linearity at the ADC transfer characteristics edges. The common solution to this problem is to extend the preamplifiers array beyond the input signal voltage range by using dummy preamplifiers. However, this demands a corresponding extension of the flash ADC reference-voltage resistor ladder. Since the voltage headroom of the reference ladder is considered to be a main bottleneck in the implementation of flash ADCs in deep-submicron technologies with reduced supply voltage, extending the reference voltage beyond the input voltage range is highly undesirable. The principal objective of this thesis is to develop a new circuit technique to enhance the bandwidth-accuracy product of flash ADCs. Thus, first, a rigorous analysis of flash ADC architectures accuracy-bandwidth tradeoff is presented. It is demonstrated that the interpolating architecture achieves a superior accuracy compared to that of a full flash architecture for the same input capacitance, and hence would lead to a higher bandwidth-accuracy product, especially in deep-submicron technologies that use low power supplies. Also, the gain obtained, when interpolation is employed, is quantified. In addition, the limitations of a previous claim, which suggests that an interpolating architecture is equivalent to an averaging full flash architecture that trades off accuracy for the input capacitance, is presented. Secondly, a termination technique for the averaging/interpolation network of flash ADC preamplifiers is devised. The proposed technique maintains the linearity of the ADC at the transfer characteristics edges and cancels out the over-range voltage, consumed by the dummy preamplifiers. This makes flash ADCs more amenable for integration in deep-submicron CMOS technologies. In addition, the elimination of this over-range voltage allows a larger least-significant bit. As a result, a higher input referred offset is tolerated, and a significant reductions in the ADC input capacitance and power dissipation are achieved at the same accuracy. Unlike a previous solution, the proposed technique does not introduce negative transconductance at flash ADC preamplifiers array edges. As a result, the offset averaging technique can be used efficiently. To prove the resulting saving in the ADC input capacitance and power dissipation that is attained by the proposed termination technique, a 6-bit 1.6-GS/s flash ADC test chip is designed and implemented in 0.13-μ\mum CMOS technology. The ADC consumes 180 mW from a 1.5-V supply and achieves a Signal-to-Noise-plus-Distortion Ratio (SNDR) of 34.5 dB and 30 dB at 50-MHz and 1450-MHz input signal frequency, respectively. The measured peak Integral-Non-Linearity (INL) and Differential-Non-Linearity (DNL) are 0.42 LSB and 0.49 LSB, respectively

    A leaky waveguide all-optical analog-to-digital converter

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    In this thesis we describe a novel all-optical analog-to-digital converter (AOADC) based on a leaky waveguide deflector. The principle of the spatial sampling AOADC is to convert an electrical signal to its corresponding optical deflection angle and then sample and quantize this angle in the spatial domain, instead of the amplitude domain. This AOADC is designed for broadband digital receivers working at frequencies above 20 GHz (a minimum 40 GS/s sampling rate) and provides a resolution higher than 6 bits. An original design based on GRISM (Grating and pRISM) is investigated for a high-resolution ADC implementation; and its challenges have been identified. The investigation provides a general model of spatial sampling AOADCs and highlights their advantages of immunity to optical intensity fluctuation. Later we proposed an AOADC that employs a leaky waveguide structure that is different from any other optical ADC. The AOADC consists of a sampler based on a mode-locked laser and a leaky waveguide deflector driven by traveling wave electrodes, a quantizer based on an integrated optical collector array and broadband photodetectors. These components provide the AOADC with a higher deflection angle and angular resolution resulting in high bit resolution without consuming significant power. The quantization of the deflection angle is done by a simple spatial quantizer that digitizes as well as encodes the signal simultaneously. A detailed design of the E-O deflector and the spatial quantizer has been analyzed and simulated; and some preliminary tests have been conducted. This thesis summarizes our contributions in designing and modeling this novel spatial sampling AOADC.Ph.D., Electrical Engineering -- Drexel University, 200

    Integrated photonic analog-to-digital converters

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    Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2011.Cataloged from PDF version of thesis.Includes bibliographical references (p. 161-172).Accurate conversion of wideband multi-GHz analog signals into the digital domain has long been a target of analog-to-digital converter (ADC) developers, driven by applications in radar systems, software radio, medical imaging, and communication systems. Aperture jitter has been a major bottleneck on the way towards higher speeds and better accuracy. Photonic ADCs, which perform sampling using ultra-stable optical pulse trains generated by mode-locked lasers, have been investigated as a promising approach to overcome the jitter problem and bring ADC performance to new levels. This work demonstrates that the photonic approach can deliver on its promise by digitizing a 41 GHz signal with 7.0 effective bits and 52 dBc spur-free dynamic range (SFDR) using a discrete-component photonic ADC. This corresponds to 15 fs jitter, a 4-5 times improvement over the jitter of the best electronic ADCs, and an order of magnitude improvement over the jitter of electronic ADCs operating above 10 GHz. The feasibility of a practical photonic ADC is demonstrated by creating an integrated ADC with a modulator, filters, and photodetectors fabricated on a single silicon chip and using it to sample a 10 GHz signal with 3.5 effective bits and 39 dBc SFDR. In both experiments, a sample rate of 2.1 GSa/s was obtained by interleaving two 1.05 GSa/s channels; higher sample rates can be achieved by increasing the channel count. A key component of a multi-channel ADC - a dual multi-channel high-performance filter bank - is successfully implemented. A concept for broadband linearization of the silicon modulator, which is another critical component of the photonic ADC, is proposed. Nonlinear phenomena in silicon microring filters and their impact on ADC performance are analyzed, and methods to reduce this impact are proposed. The results presented in the thesis suggest that a practical integrated photonic ADC, which successfully overcomes the electronic jitter bottleneck, is possible today.by Anatol Khilo.Ph.D

    Development and Analysis of Non-Delay-Line Constant-Fraction Discriminator Timing Circuits, Including a Fully-Monolithic CMOS Implementation

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    A constant-fraction discriminator (CFD) is a time pick-off circuit providing time derivation that is insensitive to input-signal amplitude and, in some cases, input-signal rise time. CFD time pick-off circuits are useful in Positron Emission Tomography (PET) systems where Bismuth Germanate (BGO)/photomultiplier scintillation detectors detect coincident, 511-keV annihilation gamma rays. Time walk and noise-induced timing jitter in time pick-off circuits are discussed along with optimal and sub-optimal timing filters designed to minimize timing jitter. Additionally, the effects of scintillation-detector statistics on timing performance are discussed, and Monte Carlo analysis is developed to provide estimated timing and energy spectra for selected detector and time pick-off circuit configurations. The traditional delay-line CFD is then described with a discussion of deterministic (non statistical) performance and statistical Monte Carlo timing performance. A new class of non-delay-line CFD circuits utilizing lowpass- and/or allpass-filter delay-line approximations is then presented. The timing performance of these non-delay-line CFD circuits is shown to be comparable to traditional delay-line CFD circuits. Following the development and analysis of non-delay-line CFD circuits, a fully-monolithic, non-delay-line CFD circuit is presented which was fabricated in a standard digital, 2-μ, double-meta], double-poly, n-well CMOS process. The CMOS circuits developed include a low time walk comparator having a time walk of approximately 175 ps for input signals with amplitudes between 10-mV to 2000-mV and a rise time (10 - 90%) of 10 ns. Additionally, a fifth-order, continuous-time filter having a bandwidth of over 100 MHz was developed to provide CFD signal shaping without a delay line. The measured timing resolution (3.26 ns FWITh1, 6.50 ns FWTM) of the fully-monolithic, CMOS CFD is comparable to measured resolution (3.30 ns FWHM, 6.40 ns FWTM) of a commercial, discrete, bipolar CFD containing an external delay line. Each CFD was tested with a PET EGO/photomultiplier scintillation detector and a preamplifier having a 10-ns (10 - 90%) rise-time. The development of a fully-monolithic, CMOS CFD circuit, believed to be the first such reported development, is significant for PET and other systems that employ many front-end CFD time pick-off circuits

    Timing distribution at the LHC

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