Techniques of Energy-Efficient VLSI Chip Design for High-Performance Computing

How to implement quality computing with the limited power budget is the key factor to move very large scale integration (VLSI) chip design forward. This work introduces various techniques of low power VLSI design used for state of art computing. From the viewpoint of power supply, conventional in-chip voltage regulators based on analog blocks bring the large overhead of both power and area to computational chips. Motivated by this, a digital based switchable pin method to dynamically regulate power at low circuit cost has been proposed to make computing to be executed with a stable voltage supply. For one of the widely used and time consuming arithmetic units, multiplier, its operation in logarithmic domain shows an advantageous performance compared to that in binary domain considering computation latency, power and area. However, the introduced conversion error reduces the reliability of the following computation (e.g. multiplication and division.). In this work, a fast calibration method suppressing the conversion error and its VLSI implementation are proposed. The proposed logarithmic converter can be supplied by dc power to achieve fast conversion and clocked power to reduce the power dissipated during conversion. Going out of traditional computation methods and widely used static logic, neuron-like cell is also studied in this work. Using multiple input floating gate (MIFG) metal-oxide semiconductor field-effect transistor (MOSFET) based logic, a 32-bit, 16-operation arithmetic logic unit (ALU) with zipped decoding and a feedback loop is designed. The proposed ALU can reduce the switching power and has a strong driven-in capability due to coupling capacitors compared to static logic based ALU. Besides, recent neural computations bring serious challenges to digital VLSI implementation due to overload matrix multiplications and non-linear functions. An analog VLSI design which is compatible to external digital environment is proposed for the network of long short-term memory (LSTM). The entire analog based network computes much faster and has higher energy efficiency than the digital one

A Parallel Programmer for Non-Volatile Analog Memory Arrays

Since their introduction in 1967, floating-gate transistors have enjoyed widespread success as non-volatile digital memory elements in EEPROM and flash memory. In recent decades, however, a renewed interest in floating-gate transistors has focused on their viability as non-volatile analog memory, as well as programmable voltage and current sources. They have been used extensively in this capacity to solve traditional problems associated with analog circuit design, such as to correct for fabrication mismatch, to reduce comparator offset, and for amplifier auto-zeroing. They have also been used to implement adaptive circuits, learning systems, and reconfigurable systems. Despite these applications, their proliferation has been limited by complex programming procedures, which typically require high-precision test equipment and intimate knowledge of the programmer circuit to perform.;This work strives to alleviate this limitation by presenting an improved method for fast and accurate programming of floating-gate transistors. This novel programming circuit uses a digital-to-analog converter and an array of sample-and-hold circuits to facilitate fast parallel programming of floating-gate memory arrays and eliminate the need for high accuracy voltage sources. Additionally, this circuit employs a serial peripheral interface which digitizes control of the programmer, simplifying the programming procedure and enabling the implementation of software applications that obscure programming complexity from the end user. The efficient and simple parallel programming system was fabricated in a 0.5?m standard CMOS process and will be used to demonstrate the effectiveness of this new method

Quiescent current testing of CMOS data converters

Power supply quiescent current (IDDQ) testing has been very effective in VLSI circuits designed in CMOS processes detecting physical defects such as open and shorts and bridging defects. However, in sub-micron VLSI circuits, IDDQ is masked by the increased subthreshold (leakage) current of MOSFETs affecting the efficiency of I¬DDQ testing. In this work, an attempt has been made to perform robust IDDQ testing in presence of increased leakage current by suitably modifying some of the test methods normally used in industry. Digital CMOS integrated circuits have been tested successfully using IDDQ and IDDQ methods for physical defects. However, testing of analog circuits is still a problem due to variation in design from one specific application to other. The increased leakage current further complicates not only the design but also testing. Mixed-signal integrated circuits such as the data converters are even more difficult to test because both analog and digital functions are built on the same substrate. We have re-examined both IDDQ and IDDQ methods of testing digital CMOS VLSI circuits and added features to minimize the influence of leakage current. We have designed built-in current sensors (BICS) for on-chip testing of analog and mixed-signal integrated circuits. We have also combined quiescent current testing with oscillation and transient current test techniques to map large number of manufacturing defects on a chip. In testing, we have used a simple method of injecting faults simulating manufacturing defects invented in our VLSI research group. We present design and testing of analog and mixed-signal integrated circuits with on-chip BICS such as an operational amplifier, 12-bit charge scaling architecture based digital-to-analog converter (DAC), 12-bit recycling architecture based analog-to-digital converter (ADC) and operational amplifier with floating gate inputs. The designed circuits are fabricated in 0.5 μm and 1.5 μm n-well CMOS processes and tested. Experimentally observed results of the fabricated devices are compared with simulations from SPICE using MOS level 3 and BSIM3.1 model parameters for 1.5 μm and 0.5 μm n-well CMOS technologies, respectively. We have also explored the possibility of using noise in VLSI circuits for testing defects and present the method we have developed

First order sigma-delta modulator of an oversampling ADC design in CMOS using floating gate MOSFETS

We report a new architecture for a sigma-delta oversampling analog-to-digital converter (ADC) in which the first order modulator is realized using the floating gate MOSFETs at the input stage of an integrator and the comparator. The first order modulator is designed using an 8 MHz sampling clock frequency and implemented in a standard 1.5µm n-well CMOS process. The decimator is an off-chip sinc-filter and is programmed using the VERILOG and tested with Altera Flex EPF10K70RC240 FPGA board. The ADC gives an 8-bit resolution with a 65 kHz bandwidth