Performance Comparison of Static CMOS and Domino Logic Style in VLSI Design: A Review

Of late, there is a steep rise in the usage of handheld gadgets and high speed applications. VLSI designers often choose static CMOS logic style for low power applications. This logic style provides low power dissipation and is free from signal noise integrity issues. However, designs based on this logic style often are slow and cannot be used in high performance circuits. On the other hand designs based on Domino logic style yield high performance and occupy less area. Yet, they have more power dissipation compared to their static CMOS counterparts. As a practice, designers during circuit synthesis, mix more than one logic style judiciously to obtain the advantages of each logic style. Carefully designing a mixed static Domino CMOS circuit can tap the advantages of both static and Domino logic styles overcoming their own short comings

Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration

The scan test coverage improvement by using automatic test pattern generation (ATPG) tool configuration was investigated. Improving the test coverage is essential in detecting manufacturing defects in semiconductor industry so that high quality products can be supplied to consumers. The ATPG tool used was Mentor Graphics Tessent TestKompress (version 2014.1). The study was done by setting up a few experiments of utilizing and modifying ATPG commands and switches, observing the test coverage improvement from the statistical reports provided during pattern generation process and providing relatable discussions. By modifying the ATPG commands, it can be expected to have some improvement in the test coverage. The scan test patterns generated were stuck-at test patterns. Based on the experiments done, comparison was made on the different coverage readings and the most optimized method and flow of ATPG were determined. The most optimized flow gave an improvement of 0.91% in test coverage which is acceptable since this method does not involve a change in design. The test patterns generated were converted and tested using automatic test equipment (ATE) to observe its performance on real silicon. The test coverage improvement using ATPG tool instead of the design-based method is important as a faster workaround for back-end engineers to provide high quality test contents in such a short product development duration

Scalable algorithms for software based self test using formal methods

textTransistor scaling has kept up with Moore's law with a doubling of the number of transistors on a chip. More logic on a chip means more opportunities for manufacturing defects to slip in. This, in turn, has made processor testing after manufacturing a significant challenge. At-speed functional testing, being completely non-intrusive, has been seen as the ideal way of testing chips. However for processor testing, generating instruction level tests for covering all faults is a challenge given the issue of scalability. Data-path faults are relatively easier to control and observe compared to control-path faults. In this research we present a novel method to generate instruction level tests for hard to detect control-path faults in a processor. We initially map the gate level stuck-at fault to the Register Transfer Level (RTL) and build an equivalent faulty RTL model. The fault activation and propagation constraints are captured using Control and Data Flow Graphs of the RTL as a Liner Temporal Logic (LTL) property. This LTL property is then negated and given to a Bounded Model Checker based on a Bit-Vector Satisfiability Module Theories (SMT) solver. From the counter-example to the property we can extract a sequence of instructions that activates the gate level fault and propagates the fault effect to one of the observable points in the design. Other than the user supplying instruction constraints, this approach is completely automatic and does not require any manual intervention. Not all the design behaviors are required to generate a test for a fault. We use this insight to scale our previous methodology further. Underapproximations are design abstractions that only capture a subset of the original design behaviors. The use of RTL for test generation affords us two types of under-approximations: bit-width reduction and operator approximation. These are abstractions that perform reductions based on semantics of the RTL design. We also explore structural reductions of the RTL, called path based search, where we search through error propagation paths incrementally. This approach increases the size of the test generation problem step by step. In this way the SMT solver searches through the state space piecewise rather than doing the entire search at once. Experimental results show that our methods are robust and scalable for generating functional tests for hard to detect faults.Electrical and Computer Engineerin

NASA's Space Research and Technology Program. Report of a workshop

The status of the spacecraft and subsystem industry and the civil and military uses of space were examined. Genetic and specific enabling technologies were identified. It was found that U.S. spacecraft manufacturers support civil and commercial uses, the military and NASA and, in turn, are supported by subsystem suppliers. However, no single spacecraft program carries sufficient resources to develop advanced critical subsystem technologies and increasingly, U.S. suppliers are facing strong competition from foreign industry that is government subsidized

High-Speed Clocking Deskewing Architecture

As the CMOS technology continues to scale into the deep sub-micron regime, the demand for higher frequencies and higher levels of integration poses a significant challenge for the clock generation and distribution design of microprocessors. Hence, skew optimization schemes are necessary to limit clock inaccuracies to a small fraction of the clock period. In this thesis, a crude deskew buffer (CDB) is designed to facilitate an adaptive deskewing scheme that reduces the clock skew in an ASIC clock network under manufacturing process, supply voltage, and temperature (PVT)variations. The crude deskew buffer adopts a DLL structure and functions on a 1GHz nominal clock frequency with an operating frequency range of 800MHz to 1.2GHz. An approximate 91.6ps phase resolution is achieved for all simulation conditions including various process corners and temperature variation. When the crude deskew buffer is applied to seven ASIC clock networks with each under various PVT variations, a maximum of 67.1% reduction in absolute maximum clock skew has been achieved. Furthermore, the maximum phase difference between all the clock signals in the seven networks have been reduced from 957.1ps to 311.9ps, a reduction of 67.4%. Overall, the CDB serves two important purposes in the proposed deskewing methodology: reducing the absolute maximum clock skew and synchronizes all the clock signals to a certain limit for the fine deskewing scheme. By generating various clock phases, the CDB can also be potentially useful in high speed debugging and testing where the clock duty cycle can be adjusted accordingly. Various positive and negative duty cycle values can be generated based on the phase resolution and the number of clock phases being “hot swapped”. For a 500ps duty cycle, the following values can be achieved for both the positive and negative duty cycle: 224ps, 316ps, 408ps, 592ps, 684ps, and 776ps

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important

Integrated Circuit Design for Radiation Sensing and Hardening.

Beyond the 1950s, integrated circuits have been widely used in a number of electronic devices surrounding people’s lives. In addition to computing electronics, scientific and medical equipment have also been undergone a metamorphosis, especially in radiation related fields where compact and precision radiation detection systems for nuclear power plants, positron emission tomography (PET), and radiation hardened by design (RHBD) circuits for space applications fabricated in advanced manufacturing technologies are exposed to the non-negligible probability of soft errors by radiation impact events. The integrated circuit design for radiation measurement equipment not only leads to numerous advantages on size and power consumption, but also raises many challenges regarding the speed and noise to replace conventional design modalities. This thesis presents solutions to front-end receiver designs for radiation sensors as well as an error detection and correction method to microprocessor designs under the condition of soft error occurrence. For the first preamplifier design, a novel technique that enhances the bandwidth and suppresses the input current noise by using two inductors is discussed. With the dual-inductor TIA signal processing configuration, one can reduce the fabrication cost, the area overhead, and the power consumption in a fast readout package. The second front-end receiver is a novel detector capacitance compensation technique by using the Miller effect. The fabricated CSA exhibits minimal variation in the pulse shape as the detector capacitance is increased. Lastly, a modified D flip-flop is discussed that is called Razor-Lite using charge-sharing at internal nodes to provide a compact EDAC design for modern well-balanced processors and RHBD against soft errors by SEE.PhDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/111548/1/iykwon_1.pd

NASA SBIR abstracts of 1991 phase 1 projects

The objectives of 301 projects placed under contract by the Small Business Innovation Research (SBIR) program of the National Aeronautics and Space Administration (NASA) are described. These projects were selected competitively from among proposals submitted to NASA in response to the 1991 SBIR Program Solicitation. The basic document consists of edited, non-proprietary abstracts of the winning proposals submitted by small businesses. The abstracts are presented under the 15 technical topics within which Phase 1 proposals were solicited. Each project was assigned a sequential identifying number from 001 to 301, in order of its appearance in the body of the report. Appendixes to provide additional information about the SBIR program and permit cross-reference of the 1991 Phase 1 projects by company name, location by state, principal investigator, NASA Field Center responsible for management of each project, and NASA contract number are included