4,459 research outputs found

    Development of optical modulators for measurements of solar magnetic fields

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    The measurement of polarized light allows solar astronomers to infer the magnetic field on the Sun. The accuracy of these measurements is dependent on the stable retardation characteristics of the polarization modulators used to minimize the atmospheric effects seen in ground-based observations. This report describes the work by the Space Science Laboratory at Marshall Space Flight Center to improve two types of polarization modulators. As a result, the timing characteristics for both electrooptic crystals (KD*Ps) and liquid crystal devices (LCDs) have been studied and will be used to enhance the capabilities of the MSFC Vector Magnetograph

    Cathodoluminescence and electron microscopy of red quantum dots used for display applications

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    Cathodoluminescent imaging of the visible light emitted from quantum dots is reported. The shape and uniformity of individual particles is observed in the STEM electron image and the image of the particles created from their visible light collected simultaneously is shown. Visible light images of the 13nm sized particles are reported for clusters of particles. Emission spectra collected from a small clusters of QDs are also reported

    On the Reversible Effects of Bias-Stress Applied to Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors

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    The role of amorphous IGZO (Indium Gallium Zinc Oxide) in Thin Film Transistors (TFT) has found its application in emerging display technologies such as active matrix liquid crystal display (LCD) and active matrix organic light-emitting diode (AMOLED) due to factors such as high mobility 10-20 cm2/(V.s), low subthreshold swing (~120mV/dec), overall material stability and ease of fabrication. However, prolonged application of gate bias on the TFT results in deterioration of I-V characteristics such as sub-threshold distortion and a distinct shift in threshold voltage. Both positive-bias and negative-bias affects have been investigated. In most cases positive-stress was found to have negligible influence on device characteristics, however a stress induced trap state was evident in certain cases. Negative stress demonstrated a pronounced influence by donor like interface traps, with significant transfer characteristics shift that was reversible over a period of time at room temperature. It was also found that the reversible mechanism to pre-stress conditions was accelerated when samples were subjected to cryogenic temperature (77 K). To improve device performance BG devices were subjected to extended anneals and encapsulated with ALD alumina. These devices were found to have excellent resistance to bias stress. Double gate devices that were subjected to extended anneals and alumina capping revealed similar results with better electrostatics compared to BG devices. The cause and effect of bias stress and its reversible mechanisms on IGZO TFTs has been studied and explained with supporting models

    ํ”Œ๋ผ์ฆˆ๋งˆ ํ™”ํ•™ ๊ธฐ์ƒ ์ฆ์ฐฉ๋ฒ•์„ ์ด์šฉํ•œ ๋ฒ ๋ฆฌ์–ด ํ•„๋ฆ„ ํ•ฉ์„ฑ๊ณผ ๋””์Šคํ”Œ๋ ˆ์ด ์‘์šฉ

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    ํ•™์œ„๋…ผ๋ฌธ (๋ฐ•์‚ฌ)-- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ์ž์—ฐ๊ณผํ•™๋Œ€ํ•™ ํ™”ํ•™๋ถ€, 2019. 2. ํ™๋ณ‘ํฌ.์ž๋ฐœ๊ด‘ํ˜• ๋””์Šคํ”Œ๋ ˆ์ด์ด๋ฉฐ, ์ €์ „์•• ๊ตฌ๋™์ด ๊ฐ€๋Šฅํ•˜๊ณ  ์–‡์€ ๋‘๊ป˜๋กœ ์ œ์ž‘์ด ๊ฐ€๋Šฅํ•˜๋ฉฐ ๋™์ž‘์†๋„๊ฐ€ ๋งค์šฐ ๋น ๋ฅผ ๋ฟ๋งŒ ์•„๋‹ˆ๋ผ ๋†’์€ ํ•ด์ƒ๋„ ๊ตฌํ˜„์ด ๊ฐ€๋Šฅํ•œ OLED๋Š” ๋””์Šคํ”Œ๋ ˆ์ด์—์„œ ๋น ๋ฅธ ์„ฑ์žฅ์„ธ๋ฅผ ๋ณด์ด๊ณ  ์žˆ๋‹ค. ์ตœ๊ทผ OLED์˜ ๊ฐ€์žฅ ํฐ ๊ด€์‹ฌ ๋ถ„์•ผ๋Š” ๋ชจ๋ฐ”์ผ์šฉ ๋””์Šคํ”Œ๋ ˆ์ด์™€ ๋Œ€๋ฉด์  TV, ๊ทธ๋ฆฌ๊ณ  ํ”Œ๋ ‰์‹œ๋ธ” ๋ฐ ํˆฌ๋ช… ๋””์Šคํ”Œ๋ ˆ์ด ๊ตฌํ˜„์ด๋‹ค. ๋””์Šคํ”Œ๋ ˆ์ด๋ฅผ ๊ตฌ๋™ํ•˜๊ธฐ ์œ„ํ•œ ๊ตฌ๋™์†Œ์ž๋Š” ์ˆ˜๋™ํ˜•(passive matrix)๊ณผ ๋Šฅ๋™ํ˜•(active matrix, AM)๋กœ ๋‚˜๋‰˜๋ฉฐ, ์ˆ˜๋™ํ˜•์— ๋น„ํ•˜์—ฌ ๊ณ ํ™”์งˆ, ๋‚ฎ์€ ์†Œ๋น„ ์ „๋ ฅ, ๋Œ€ํ˜•ํ™”์— ์œ ๋ฆฌํ•œ ๋Šฅ๋™ํ˜• ๋””์Šคํ”Œ๋ ˆ์ด๊ฐ€ ์„ ํ˜ธ๋œ๋‹ค. ํ‘œ์‹œ์†Œ์ž๋ฅผ ๋Šฅ๋™ ๊ตฌ๋™ํ•˜๊ธฐ ์œ„ํ•ด์„œ๋Š” ๊ฐ ํ™”์†Œ๋งˆ๋‹ค ๋ฐ•๋ง‰ ํŠธ๋žœ์ง€์Šคํ„ฐ(thin-film transistor, TFT)์™€ ๊ฐ™์€ ์Šค์œ„์นญ ์†Œ์ž๋ฅผ ๋ถ€์ฐฉ์‹œ์ผœ์•ผ ํ•œ๋‹ค. ๋Šฅ๋™ํ˜• ๊ตฌ๋™์†Œ์ž์˜ ๊ฒฝ์šฐ ํ˜„์žฌ์˜ TFT-LCD๋‚˜ AMOLED์šฉ ๋ฐฑํ”Œ๋ ˆ์ธ์— ์ฃผ๋กœ ์‚ฌ์šฉ๋˜๋Š” ๋น„์ •์งˆ ์‹ค๋ฆฌ์ฝ˜(a-Si), ์ €์˜จ ๋‹ค๊ฒฐ์ • ์‹ค๋ฆฌ์ฝ˜ (LTPS) ๊ธฐ์ˆ ์ด ์šฐ์„  ๊ฐœ๋ฐœ๋˜์–ด ์‘์šฉ๋˜๊ณ  ์žˆ๋‹ค. ์ตœ๊ทผ์—๋Š” ํฐ ๋ฐด๋“œ ๊ฐญ์„ ๊ฐ€์ง€๋Š” ๋น„์ •์งˆ ์‚ฐํ™”๋ฌผ ๋ฐ˜๋„์ฒด๋ฅผ ์ด์šฉํ•ด ํˆฌ๋ช…ํ•˜๋ฉด์„œ ๋น ๋ฅธ ์‘๋‹ต์†๋„์˜ ๋””์Šคํ”Œ๋ ˆ์ด ๊ตฌ๋™์†Œ์ž์— ๋Œ€ํ•œ ์—ฐ๊ตฌ๊ฐ€ ํ™œ๋ฐœํžˆ ์ง„ํ–‰๋˜๊ณ  ์žˆ๋‹ค. ๋˜ํ•œ ๋ฐฐ์„ ์˜ RC Delay๋ฅผ ์ตœ์†Œํ™” ์‹œ์ผœ์•ผ ํ•˜๊ณ , ํŒŒ์›Œ์†Œ๋น„๋Ÿ‰์„ ์ค„์—ฌ์•ผ ํ•˜๋Š” ๊ธฐ์ˆ ์ ์ธ ๋ฌธ์ œ๊ฐ€ ์žˆ๋‹ค. ๋””์Šคํ”Œ๋ ˆ์ด์˜ ๊ณ ํ•ด์ƒ๋„์ธ UHD (Ultra High Definition)์˜ backplane์—์„œ ๊ณ ์† TFT ๊ตฌํ˜„์„ ์œ„ํ•˜์—ฌ SD(Source-Drain) ๋ฉ”ํƒˆ ๋ฐฐ์„  ๊ตฌํ˜„์€ ํ•„์ˆ˜์ ์ธ ์š”์†Œ์ด๋‹ค. ๋ณธ ์—ฐ๊ตฌ์—์„œ๋Š” SD ๋ฉ”ํƒˆ ๋ฐฐ์„ ์œผ๋กœ์จ ์ €์ €ํ•ญ ๋ฐฐ์„ ์ธ Copper ๋ฐฐ์„ ์˜ diffusion barrier ์—ญํ• ์„ ํ•˜๋Š” Graphite ์„ฑ์žฅ์„ ๋‹ค๋ฃจ๊ณ  ์žˆ๋‹ค. ๊ธฐ์กด์˜ Graphene ํ•ฉ์„ฑ์€ ๊ธฐ๊ณ„์  ๋ฐ ํ™”ํ•™์  ๋ฐ•๋ฆฌ ๋ฐฉ๋ฒ•์—๋Š” ๋Œ€๋ฉด์  ํŒจ๋„ ๊ตฌํ˜„์œผ๋กœ์จ ํ•œ๊ณ„๊ฐ€ ์žˆ๋‹ค. ํ˜„์žฌ๊นŒ์ง€ ๋Œ€ํ˜• Size scale Graphene ์‹œ๋„๋Š” ์ „๊ทน์œผ๋กœ์จ Graphene ํ™œ์šฉ์€ ์žˆ์ง€๋งŒ, ์ด ๊ตฌํ˜„์€ Thermal CVD (900~1000โ„ƒ)์—์„œ Graphene ์„ ํ•ฉ์„ฑํ•˜๊ณ , Glass์— transfer ํ•œ ๋…ผ๋ฌธ์œผ๋กœ์จ ์‹ค์ œ ๋Œ€๋ฉด์ ์œผ๋กœ ๋งŒ๋“œ๋Š” ๊ณต์ • ์ ์šฉ์—๋Š” ํ•œ๊ณ„๊ฐ€ ์žˆ๋‹ค. ์ด์— ํ˜„์žฌ ๋งŽ์ด ์—ฐ๊ตฌ๋Š” ์ง„ํ–‰ ์ค‘์ด๊ณ  ์žˆ์ง€๋งŒ, PECVD (Plasma Enhanced Chemical Vapor Deposition)๋ฅผ ์ด์šฉํ•œ graphite ๋ฐ•๋ง‰ ํ•ฉ์„ฑ์€ ๋Œ€ํ˜• size, mass production์„ ๊ฐ€๋Šฅํ•˜๊ฒŒ ํ•˜๋ฉฐ, ์•„์ง mass production ์ ์šฉ์„ ์œ„ํ•ด ์—ฐ๊ตฌํ•ด์•ผ ํ•  ์ ์€ ๋งŽ์ง€๋งŒ, ์ €์˜จ ๊ณต์ • Graphite ํ•ฉ์„ฑ์ด ๊ฐ€๋Šฅํ•˜๋‹ค๋ฉด, large scale device ๊ตฌํ˜„์— ํ•œ์ธต ๋” ์ง„๋ณด๋œ ๊ธฐ์ˆ ์ด ๋  ๊ฒƒ์ž„์„ ํ™•์‹ ํ•œ๋‹ค. ๋ณธ ์—ฐ๊ตฌ์—์„œ Copper diffusion barrier ์œผ๋กœ์จ์˜ ์—ญํ• ์„ ๊ฒ€์ฆํ•˜๊ณ , ์ฆ์ฐฉ ์˜จ๋„๋ฅผ ์ €์˜จ์œผ๋กœ ํ•ฉ์„ฑํ•จ์œผ๋กœ์จ TEM ๋ฐ EDAX ๋ถ„์„์œผ๋กœ Graphite barrier ๋ฐ mass production์˜ ๊ฐ€๋Šฅ์„ฑ์„ ๊ฒ€์ฆํ•˜์˜€๋‹ค. ๋ณธ ์—ฐ๊ตฌ์˜ ์ง์ ‘์ ์ธ PECVD ํ•ฉ์„ฑ ๋ฐฉ๋ฒ•์„ ํ†ตํ•ด ๋Œ€๋ฉด์ ์ด ๊ฐ€๋Šฅํ•จ์„ ์ œ์‹œํ•จ์œผ๋กœ์จ ๊ธฐ์กด์˜ ๋Œ€๋ฉด์  ํ•ฉ์„ฑ ๋ฌธ์ œ์ ์„ ํ•ด๊ฒฐํ•ด ์ค„ ์ˆ˜ ์žˆ๋Š” ๋ฐฉ์•ˆ์ด ๋  ๊ฒƒ์ด๋‹ค. ๋˜ํ•œ ๋””์Šคํ”Œ๋ ˆ์ด์˜ TFT ํŠน์„ฑ๋„ ๊ธฐ์กด์˜ Active material ์ธ a-Si TFT๋ณด๋‹ค ํ›จ์”ฌ ๋” ๋†’์€ ๊ณ ์ด๋™๋„ ์†Œ์ž๋ฅผ ์š”๊ตฌํ•˜๋ฉฐ, ํŠนํžˆ ํˆฌ๋ช… ๋””์Šคํ”Œ๋ ˆ์ด์˜ ์ ์šฉ ๊ฐ€๋Šฅํ•˜๋ฉฐ, ๊ณ ์ด๋™๋„ ํŠน์„ฑ์„ ๊ท ์ผํ•˜๊ฒŒ ๊ฐ€์งˆ ์ˆ˜ ์žˆ๋Š” ์‹ ๊ทœ TFT๋ฅผ ์š”๊ตฌํ•˜๊ฒŒ ๋˜์—ˆ๋‹ค. ์ด์— ๋Œ€ํ•œ ๋ฐฉ์•ˆ์œผ๋กœ ์‚ฐํ™”๋ฌผ TFT๋กœ์จ ZnO (Zinc Oxide), IZO (Indium Zinc Oxide), a-IGZO (Amorphous Indium Gallium Zinc Oxide) ๋“ฑ์˜ ์žฌ๋ฃŒ๊ฐ€ ์—ฐ๊ตฌ๋˜๊ณ  ์žˆ๋‹ค. ๊ธฐ์กด์˜ a-Si์˜ ์ด๋™๋„ (<1cm2/VยทS) ๋ณด๋‹ค ๋†’์€ ์ด๋™๋„๋ฅผ ๊ฐ€์ง„ IGZO ์žฌ๋ฃŒ๋Š” ํˆฌ๋ช…ํ•œ ์†Œ์ž๋กœ์จ ํˆฌ๋ช…๋””์Šคํ”Œ๋ ˆ์ด์—์„œ๋„ ํ™œ์šฉ์ด ๊ฐ€๋Šฅํ•˜์—ฌ, ์‘์šฉ์„ฑ์„ ํ™•๋Œ€ํ•˜๊ณ  ์žˆ๋‹ค. ๋ณธ ์—ฐ๊ตฌ์—์„œ๋Š” ํˆฌ๋ช…๋””์Šคํ”Œ๋ ˆ์ด ์—์„œ๋„ ํ™œ์šฉ์ด ๊ฐ€๋Šฅํ•˜๋„๋ก a-IGZO๋ฅผ substrate๋กœ ํ•˜๋Š” Graphite ๋ฐ•๋ง‰์„ ํ•ฉ์„ฑ ๋ฐฉ๋ฒ•์„ ์ œ์‹œํ•˜๊ณ , ๋Œ€๋ฉด์  ๊ตฌํ˜„์œผ๋กœ์จ ๊ทธ ์‘์šฉ์„ฑ์„ ๊ธฐ๋Œ€ํ•˜๊ณ  ์žˆ๋‹ค. Graphite์˜ ์ €์˜จ ํ•ฉ์„ฑ ๊ธฐ์ˆ  ๊ฐœ๋ฐœ์€ ๊ธฐ์กด ๋ผ์ธ์˜ CVD ์žฅ๋น„ ๊ต์ฒด ์—†์ด ๋‹จ์ง€ Graphene Gas ์‚ฌ์šฉ๋งŒ์œผ๋กœ ๊ณต์ •์„ ๊ตฌํ˜„ํ•œ๋‹ค๋Š” ์ ์ด cost ๋ฐ ๊ณต์ • ๋‹จ์ˆœํ™”์˜ ๊ด€์ ์—์„œ ๋งŽ์€ ์žฅ์ ์ด ์žˆ๋‹ค. ๋˜ํ•œ ๊ณ ์† ๊ตฌ๋™์„ ์œ„ํ•˜์—ฌ SD ๋ฐฐ์„ ์œผ๋กœ metal๋ฟ ์•„๋‹ˆ๋ผ ์‚ฐํ™”๋ฌผ ๋ฐ˜๋„์ฒด๋กœ๋„ Graphite ํ•ฉ์„ฑ์˜ catalyst๋กœ์จ ์‚ฌ์šฉ๋˜์–ด, ํŒจ๋„ ๊ตฌํ˜„์„ ๊ฐ€๋Šฅํ•˜๊ฒŒ ํ•ด์ค€๋‹ค๋Š” ๊ด€์ ์—์„œ ์˜๋ฏธ๊ฐ€ ์žˆ๋‹ค. ๋˜ํ•œ Graphite ํ•ฉ์„ฑ ๊ธฐ์ˆ ์„ thin film ๋ฐ•๋ง‰์„ ๋งŒ๋“ค์–ด ๋‹ค๋ฅธ application ์—์„œ๋„ ํ™œ์šฉ ๊ฐ€๋Šฅํ•จ์„ ๋ณด์—ฌ์คŒ์œผ๋กœ์จ ํŒŒ๊ธ‰ ํšจ๊ณผ๊ฐ€ ํฌ๋‹ค๊ณ  ํŒ๋‹จ๋œ๋‹ค. ๋‹ค์Œ ์—ฐ๊ตฌ์—์„œ๋Š” LCD ๋””์Šคํ”Œ๋ ˆ์ด์—์„œ Backlight ์‚ฌ์šฉ์ด ํ•„์ˆ˜์ ์ด๋‹ค. Back light๋Š” ๊ฐ€์‹œ๊ด‘์„  ์˜์—ญ ๋ฟ ์•„๋‹ˆ๋ผ UV ํŒŒ์žฅ์˜์—ญ๋„ ํฌํ•จํ•˜๊ณ  ์žˆ์œผ๋ฉฐ, Active ์žฌ๋ฃŒ์ธ a-IGZO ์†Œ์ž์—์„œ TFT ํŠน์„ฑ์˜ ๋ถˆ์•ˆ์ •์„ฑ์˜ ๋ฌธ์ œ๋ฅผ ๊ฐ€์ง€๊ณ  ์žˆ๋‹ค. IGZO์˜ ํŠน์„ฑ์ƒ UV ํŒŒ์žฅ๋Œ€์—์„œ์˜ ๋น›๊ณผ์˜ ๋ฐ˜์‘์œผ๋กœ TFT ์†Œ์ž์˜ ์‹ ๋ขฐ์„ฑ ํŠน์„ฑ์ด ์•…ํ™”๋˜๋Š” ๋ฌธ์ œ์ ์„ ํ•ด๊ฒฐํ•˜๊ณ ์ž Barrier ๋ฐ•๋ง‰์„ ์‚ฌ์šฉ์ด ํ•„์ˆ˜์ ์ธ ์š”์†Œ์ด๋‹ค. ๋ณธ ์—ฐ๊ตฌ์—์„œ๋Š” TFT์˜ ์‹ ๋ขฐ์„ฑ ๋ฐ ์•ˆ์ •์„ฑ์„ ์œ ์ง€ํ•˜๊ธฐ ์œ„ํ•ด์„œ Photo blocking barrier๋กœ์จ SiGe (Silicon Germanium) ๋ฐ•๋ง‰ ์žฌ๋ฃŒ ํ•ฉ์„ฑ์„ ํ†ตํ•˜์—ฌ TFT ์‹ ๋ขฐ์„ฑ์˜ ํŠน์„ฑ ๋ณ€ํ™” ์—†๋Š” ๊ฒƒ์„ ์—ฐ๊ตฌํ•˜์˜€๋‹ค. ์ด์ „ SiGe ์—ฐ๊ตฌ๋˜์–ด์ง„ ๋ฐ”๋กœ๋Š” ํƒœ์–‘์ „์ง€์—์„œ P-I(intrinsic layer)-Nํ˜• ๊ตฌ์กฐ์—์„œ ์ค‘๊ฐ„ ์‚ฝ์ž…์ธต์—์„œ ๋ถˆ์ˆœ๋ฌผ์ด ์ฒจ๊ฐ€๋˜์ง€ ์•Š์€ ๋ฌด์ฒจ๊ฐ€์ธต (Intrinsic layer)์—์„œ SiGe ์ด ๊ด‘ํก์ˆ˜์ธต์œผ๋กœ ์‚ฌ์šฉ๋˜์–ด์ง„ ์—ฐ๊ตฌ๊ฐ€ ์žˆ์—ˆ๋‹ค. ๋ณธ ์—ฐ๊ตฌ์—์„œ๋Š” TFT ์†Œ์ž์—์„œ a-IGZO ๊ฐ€ ๊ด‘๋ฐ˜์‘์œผ๋กœ ์ธํ•ด ์‚ฐ์†Œ ๊ฒฐํ• (Oxygen Vacancy)์„ ๋ง‰์•„ TFT ํŠน์„ฑ์˜ ์ €ํ•˜ ํšจ๊ณผ๋ฅผ ๋ง‰๊ณ ์ž SiGe์˜ ๊ด‘ ์ฐจ๋‹จ ๋ฐ•๋ง‰ ํ˜•์„ฑ์„ ํ†ตํ•ด ๊ด‘๋ฐ˜์‘์œผ๋กœ ์ธํ•œa-IGZOํŠน์„ฑ ๋ณ€ํ™”๊ฐ€ ๋˜์ง€ ์•Š๋„๋ก ํ•˜์˜€๋‹ค. ๋˜ํ•œ ๋ฐ•๋ง‰ ํ˜•์„ฑ ๋ฐ ์ ์ธต ๊ตฌ์กฐ์—์„œ SiGe ์™€ IGZO์˜ ๋ฐ•๋ง‰ ์‚ฌ์ด์— Capacitance ํ˜•์„ฑ์œผ๋กœ ์ „์ž์˜ charge๊ฐ€ IGZO ๋ฐ•๋ง‰ ๊ณ„๋ฉด์— ๋ˆ„์ ๋˜์–ด, ํŠธ๋žœ์ง€์Šคํ„ฐ ํŠน์„ฑ์ด ๋‹จ๋ฝ(short) ํ˜„์ƒ์ด ๋ฐœ์ƒ ํ•˜์˜€์œผ๋ฉฐ, ์ด๋ฅผ ๋ฐฉ์ง€ํ•˜๊ธฐ ์œ„ํ•ด Buffer layer ์˜ ๋‘๊ป˜ ์กฐ์ ˆ์ด ์ค‘์š”ํ•˜์˜€๋‹ค. ์ด์— Buffer layer์˜ ๋‘๊ป˜ ์ตœ์ ํ™”๋ฅผ ํ†ตํ•ด ํ•˜๋ถ€์—์„œ ๋“ค์–ด์˜ค๋Š” ๋น›์—๋„ ์ฐจ๋‹จ์„ ํ•  ์ˆ˜ ์žˆ๋Š” Barrier ์ ์ธต ๊ตฌ์กฐ๋ฅผ ๋งŒ๋“ค์–ด TFT ์†Œ์ž์˜ ์‹ ๋ขฐ์„ฑ ๊ฐœ์„ ๋จ์„ ๋ณด์—ฌ์ฃผ๊ณ ์ž ํ•˜์˜€๋‹ค. ์Šค๋งˆํŠธ Window ๋ฐ ๋ƒ‰์žฅ๊ณ ์—์„œ ๋ฌธ์„ ์—ด์ง€ ์•Š๊ณ  ๋‚ด์šฉ๋ฌผ์„ ํ™•์ธํ•  ์ˆ˜ ์žˆ๋Š” ํˆฌ๋ช… ๋””์Šคํ”Œ๋ ˆ์ด ๋ฐ ํ”Œ๋ ‰์‹œ๋ธ” ๋””์Šคํ”Œ๋ ˆ์ด ๊ตฌํ˜„์„ ์œ„ํ•ด ์—ฌ๋Ÿฌ ์š”์†Œ์˜ ๊ธฐ์ˆ  ์—ฐ๊ตฌ๊ฐ€ ์ง„ํ–‰๋˜๊ณ  ์žˆ์œผ๋ฉฐ, ์ด ๊ตฌํ˜„์„ ์œ„ํ•ด ๋ณธ ์—ฐ๊ตฌ์˜ Barrier ๋ฐ•๋ง‰ ๊ตฌํ˜„์€ ํ•„์ˆ˜์ ์ธ ์š”์†Œ๋กœ ์‘์šฉ์„ฑ์ด ํ™•๋Œ€๋˜์–ด ํ™œ์šฉ๋จ์„ ๊ธฐ๋Œ€ํ•ด ๋ณธ๋‹ค.OLED is a self-emissive display can be driven at low voltage and manufactured in a thin layer. In addition, this display operates at a very high speed and emit a color that can be rapidly implemented. Recently, OLEDs main interest is mobile screen, large screen TV, flexible and transparent display. The driving device for display is classified to the passive matrix and active matrix. Active matrix is preferred because of higher resolution, lower energy consumption, and large size screen. To apply active matrix on display device, a switching device such as thin-film transistor (TFT) is attached to each pixel. For active driving devices, amorphous silicon (a-Si) and low-temperature polycrystalline silicon (LTPS) technologies are applied in current TFT โ€“LCD or AMOLED back frame. Recently, there is an ongoing research on using amorphous oxide semiconductors with large bandgaps to research transparent and fast responsive display driving devices. Moreover, RC delay has a technical problem that must be minimized and reduce power consumption. Implementation of Source Drain (SD) is a metal wiring essential element for high-speed TFT execution in high-resolution UHD (Ultra High Definition) displays backplane. In this study, the graphite growth plays the role of diffusion barrier of copper wiring that has low resistance wiring with SD metal wiring. The chemical and mechanical stripping methods of conventional graphene synthesis application on large area panels is limited. Up to now, the large size graphene has been used as an electrode, but this implementation is limited to making the large-scale process by synthesizing graphene at thermal CVD (900~1000ยฐC) and transferring it to the glass. Despite the fact, a lot of ongoing studies, graphites thin film synthesis using Plasma Enhanced Chemical Vapor Deposition (PECVD) enables large size and mass production. Furthermore, this area still requires more research on mass production. If low-temperature process for graphite synthesis is possible, this will become a more advanced technology for device implementation. In this study, the role of copper diffusion barrier was verified, and the possibility of graphite barrier and mass production was verified by TEM and EDAX analysis by synthesizing the deposition temperature at low temperature. In addition, this study suggests the large size display can be obtained through direct PECVD synthesis that will solve the existing problems of large size synthesis. The displays TFT characteristics also require a high mobility device that is much higher than the conventional active material a-Si TFT. In particular, a new TFT capable of applying a transparent display and uniformly having high mobility characteristics is required. Materials such as ZnO (Zinc Oxide), IZO (Indium Zinc Oxide) and IGZO (Indium Gallium Zinc Oxide) have been studied as oxide TFTs. IGZO materials with higher mobility than conventional a-Si mobility (<1 cm2 / V ยท s) are transparent devices and can be used in transparent displays, thus extending applicability. In this study, we propose a graphite synthesis based on IGZO to be applicable to transparent display and expect the application on large size displays. The low-temperature Graphite synthesis has many advantages in terms of cost and process simplification because it implements the process only by using Graphene gas without replacing existing CVD equipment. In addition, it can be used as a graphite synthesis catalyst not only for metal but also for the oxide semiconductor, to raise activation. Moreover, the graphite synthesis to make a thin film can be applied to other fields. In the next study, it is essential to use backlight in LCD display. The backlight not only includes the visible light but also the UV region, and has instability of TFT characteristics in the active material IGZO device. Due to IGZOs reaction to light in UV region, it is essential to use a barrier film in order to solve the reliability characteristics of the TFT device deterioration. To maintain the reliability and stability of the TFT, this study on reliability of the TFT was not changed by SiGe (Silicon Germanium) synthesis thin film as a photo blocking barrier. Based on previous research on SiGe has been used as the light absorbing layer in the intrinsic layer in which a P-I (intrinsic layer)-N type structure in a solar cell that is not doped with an impurity in an intermediate insertion layer. In this study, in order to prevent oxygen vacancy during a-IGZO photoreaction on TFT device, the formation of a light-shielding film of Si-Ge prevents oxygen deficiency. Capacitance formation between SiGe and IGZO thin film in the thin film formation and lamination structure accumulates electrons charge on the IGZO thin film interface. The characteristics of the transistor were short, and to prevent this shortness, it is important to control the thickness of the buffer layer. Therefore, this shows that the reliability of the TFT device is improved by making the barrier laminate structure that can block the light from the bottom through the optimization of the thickness of the buffer layer. There are various ongoing technological studies on transparent and flexible displays that to observe the contents without opening the door through the smart window and refrigerator. For this application, the thin film barrier is an essential element and expect to be implemented.Table of Contents Abstract.........................................................................1 Contents........................................................................6 List of Figures.................................................................9 List of Tables................................................................15 Chapter 1. Introduction................................................16 1.1. Graphene characteristics 1.2. Amorphous Si:H and LTPS TFT backplane technology in display 1.3. High performance amorphous In-Ga-Zn-O TFTs 1.4. Overview of PECVD system 1.5. References Chapter 2. Growth of thin graphite films for solid diffusion barriers .......................................................60 2.1. Large-scale transfer-free growth of thin graphite films at low temperature for solid diffusion barriers 2.1.1. Introduction 2.1.2. Experimental 2.1.3. Results and discussion 2.1.4. Conclusion 2.1.5. References Chapter 3. Growth of silicon germanium films for photo-blocking layers in industrial display.................99 3.1. Silicon germanium photo-blocking layers for a-IGZO based industrial display 3.1.1. Introduction 3.1.2. Experimental 3.1.3. Results and Discussion 3.1.4. Conclusion 3.1.5. References Abstract in Koreanโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆ130 Appendixโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆโ€ฆ135Docto

    Test Targets 7.0: A Collaborative effort exploring the use of scientific methods for color imaging and process control

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    Test Targets is a culmination of teaching and learning that reflects quality and analytic aspects of printing systems and their optimization. The creation of the Test Targets publication is a total experience that reflects the innovation, problem solving, and teamwork of the diverse team of faculty, staff, students, and professionals responsible for its contents and production

    Appearance-based image splitting for HDR display systems

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    High dynamic range displays that incorporate two optically-coupled image planes have recently been developed. This dual image plane design requires that a given HDR input image be split into two complementary standard dynamic range components that drive the coupled systems, therefore there existing image splitting issue. In this research, two types of HDR display systems (hardcopy and softcopy HDR display) are constructed to facilitate the study of HDR image splitting algorithm for building HDR displays. A new HDR image splitting algorithm which incorporates iCAM06 image appearance model is proposed, seeking to create displayed HDR images that can provide better image quality. The new algorithm has potential to improve image details perception, colorfulness and better gamut utilization. Finally, the performance of the new iCAM06-based HDR image splitting algorithm is evaluated and compared with widely spread luminance square root algorithm through psychophysical studies

    Evaluation of changes in image appearance with changes in displayed image size

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    This research focused on the quantification of changes in image appearance when images are displayed at different image sizes on LCD devices. The final results provided in calibrated Just Noticeable Differences (JNDs) on relevant perceptual scales, allowing the prediction of sharpness and contrast appearance with changes in the displayed image size. A series of psychophysical experiments were conducted to enable appearance predictions. Firstly, a rank order experiment was carried out to identify the image attributes that were most affected by changes in displayed image size. Two digital cameras, exhibiting very different reproduction qualities, were employed to capture the same scenes, for the investigation of the effect of the original image quality on image appearance changes. A wide range of scenes with different scene properties was used as a test-set for the investigation of image appearance changes with scene type. The outcomes indicated that sharpness and contrast were the most important attributes for the majority of scene types and original image qualities. Appearance matching experiments were further conducted to quantify changes in perceived sharpness and contrast with respect to changes in the displayed image size. For the creation of sharpness matching stimuli, a set of frequency domain filters were designed to provide equal intervals in image quality, by taking into account the systemโ€™s Spatial Frequency Response (SFR) and the observation distance. For the creation of contrast matching stimuli, a series of spatial domain S-shaped filters were designed to provide equal intervals in image contrast, by gamma adjustments. Five displayed image sizes were investigated. Observers were always asked to match the appearance of the smaller version of each stimulus to its larger reference. Lastly, rating experiments were conducted to validate the derived JNDs in perceptual quality for both sharpness and contrast stimuli. Data obtained by these experiments finally converted into JND scales for each individual image attribute. Linear functions were fitted to the final data, which allowed the prediction of image appearance of images viewed at larger sizes than these investigated in this research

    High-dynamic-range displays : contributions to signal processing and backlight control

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    ์•ก์ •๊ธฐ๋ฐ˜ ๋ฐœ๊ด‘ํ˜• ๋””์Šคํ”Œ๋ ˆ์ด๋ฅผ ์œ„ํ•œ ์šฉ์•ก๊ณต์ • ๋‚ด์žฌํ˜• ํŽธ๊ด‘ํŒ์— ๊ด€ํ•œ ์—ฐ๊ตฌ

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    ํ•™์œ„๋…ผ๋ฌธ (์„์‚ฌ) -- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ๊ณต๊ณผ๋Œ€ํ•™ ์ „๊ธฐยท์ •๋ณด๊ณตํ•™๋ถ€, 2020. 8. ์ด์‹ ๋‘.Recently, the advancement of the liquid crystal display (LCD) technology has greatly focused on the clear image quality together with the natural color. According to the demand for the image quality, the in-cell polarizers have been attracted much attention owing to the advantages of improving the contrast ratio and reducing the thickness of LCD. In this work, we proposed the QD-based emissive LCD with the in-cell polarizer composed of dichroic dyes. The in-cell polarizer was fabricated through the solution-processing of a dichroic dye solution. The QD layer was constructed on the inner surface of the top substrate, and the in-cell polarizer was subsequently prepared on the QD layer to prevent the depolarization of the emission light and the degradation of the QDs. The intensity of the incident light for exciting QDs was modulated by the phase retardation through the LC layer, depending on the magnitude of the applied voltage. This leads directly to the modulation of the emission spectra of QDs with the color gamut extended to about 80 % of the BT.2020 standard. The architecture based on the in-cell polarizer will provide a simple and viable method of constructing the QD-based emissive LCD with high color purity in a cost-effective manner.์ตœ๊ทผ ์•ก์ • ๋””์Šคํ”Œ๋ ˆ์ด(LCD) ๊ธฐ์ˆ ๋“ค์€ ์ž์—ฐ์Šค๋Ÿฌ์šด ์ƒ‰์ƒ๊ณผ ๋”๋ถˆ์–ด ์„ ๋ช…ํ•œ ํ™”์งˆ์„ ์ค‘์‹ฌ์œผ๋กœ ํฌ๊ฒŒ ๋ฐœ์ „ํ–ˆ๋‹ค. ๊ณ ํ™”์งˆ ์˜์ƒ์— ๋Œ€ํ•œ ์ˆ˜์š”์™€ ํ•จ๊ป˜, ๋‚ด์žฌํ˜• ํŽธ๊ด‘ํŒ (in-cell polarizer)๋Š” ๋Œ€์กฐ์œจ ํ–ฅ์ƒ๊ณผ LCD ๋‘๊ป˜ ๊ฐ์†Œ๋ผ๋Š” ๋‹ค์–‘ํ•œ ์žฅ์ ๋“ค๋กœ ์ธํ•ด ๋” ๋งŽ์€ ๊ด€์‹ฌ์„ ๋Œ์—ˆ๋‹ค. ๋ณธ ์—ฐ๊ตฌ์—์„œ๋Š” ์ด์ƒ‰์„ฑ ์—ผ๋ฃŒ๋กœ ๊ตฌ์„ฑ๋œ, ๋‚ด์žฌํ˜• ํŽธ๊ด‘ํŒ๋ฅผ ์ ์šฉํ•œ ์–‘์ž์  ๊ธฐ๋ฐ˜ ๊ด‘ ๋ฐœ๊ด‘ ์•ก์ • ๋””์Šคํ”Œ๋ ˆ์ด๋ฅผ ์ œ์•ˆํ•˜์˜€๋‹ค. ์–‘์ž์  ์ธต์€ ์ƒ๋‹จ ๊ธฐํŒ์˜ ๋‚ด๋ถ€ ํ‘œ๋ฉด์— ๊ตฌ์„ฑ๋˜์—ˆ๊ณ , ์ดํ›„ ์–‘์ž์  ์ธต์— ๋‚ด์žฌํ˜• ํŽธ๊ด‘ํŒ๋ฅผ ๋„์ž…ํ•˜์—ฌ ์ž…์‚ฌ๊ด‘์˜ ํŽธ๊ด‘์ƒํƒœ๋ฅผ ์œ ์ง€ํ•˜๊ณ  ์–‘์ž์ ์˜ ์„ฑ๋Šฅ ์ €ํ•˜๋ฅผ ๋ฐฉ์ง€ํ•˜์˜€๋‹ค. ๋‚ด์žฌํ˜• ํŽธ๊ด‘ํŒ์€ ์šฉ์•ก ๊ณต์ •์„ ํ†ตํ•ด ์ด์ƒ‰์„ฑ ์—ผ๋ฃŒ๋ฅผ ์ •๋ ฌํ•˜์—ฌ ์ œ์ž‘๋˜์—ˆ๋‹ค. ์–‘์ž์  ๊ด‘ ๋ฐœ๊ด‘์„ ์œ„ํ•œ ์ž…์‚ฌ๊ด‘์˜ ์„ธ๊ธฐ๋Š” ์ ์šฉ๋œ ์ „์••์˜ ์„ธ๊ธฐ์— ๋”ฐ๋ผ ์•ก์ • ์…€์„ ํ†ตํ•œ ์œ„์ƒ ์ง€์—ฐ์— ์˜ํ•ด ๋ณ€์กฐ๋˜์—ˆ๋‹ค. ์ด๋Š” ์ƒ‰ ์˜์—ญ์ด BT.2020 ํ‘œ์ค€์˜ ์•ฝ 80%๊นŒ์ง€ ํ™•์žฅ๋œ ๋†’์€ ์ƒ‰ ์ˆœ๋„๋ฅผ ๋ณด์—ฌ์ค€๋‹ค. ๋‚ด์žฌํ˜• ํŽธ๊ด‘ํŒ์— ๊ธฐ๋ฐ˜ํ•œ ์•ก์ • ๋””์Šคํ”Œ๋ ˆ์ด ๊ตฌ์กฐ๋Š” ๋น„์šฉ-ํšจ์œจ์ ์ธ ๋ฐฉ๋ฒ•์œผ๋กœ ๋†’์€ ์ƒ‰ ์ˆœ๋„๋ฅผ ๊ฐ€์ง„ ์–‘์ž์  ๊ธฐ๋ฐ˜ ๊ด‘ ๋ฐœ๊ด‘ ์•ก์ • ๋””์Šคํ”Œ๋ ˆ์ด๋ฅผ ๊ตฌ์„ฑํ•˜๋Š” ๊ฐ„๋‹จํ•˜๊ณ  ์‹คํ–‰๊ฐ€๋Šฅํ•œ ๋ฐฉ๋ฒ•์„ ์ œ๊ณตํ•  ๊ฒƒ์ด๋‹ค.1. Introduction 1 1.1. Overview of liquid crystal-based displays 1 1.1.1. Main LCD Modes 3 1.1.2. Types of backlight unit for LCDs 9 1.2. Outline of thesis 15 2. LCD with QD color filters 16 2.1. Types of polarizers 16 2.2. Architecture of QD-LCD with in-cell polarizer 19 3. Experiments 24 3.1. Fabrication of photoluminescence QD patterns 24 3.2. Dichroic dye-based in-cell polarizer 26 3.3. Solution-processed in-cell polarizer with QD-based LC cell 29 3.4. Measurements of optical and photoluminescence characteristics 30 4. Results and Discussion 31 4.1. Analysis of polarizing characteristics of in-cell polarizer 31 4.2. Photoluminescence characteristics of QD-based LC cell with in-cell polarizer 34 4.3. Microscopic images of QD-based LC cell with in-cell polarizer 35 5. Conclusion 38 Bibliography 39 ๊ตญ๋ฌธ ์ดˆ๋ก 43Maste
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