Cross-layer system reliability assessment framework for hardware faults

System reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction layers (technology, circuit, microarchitecture, software) are factored in such an estimation model, the delivered reliability reports must be excessively pessimistic and thus lead to unacceptably expensive, over-designed systems. We propose a scalable, cross-layer methodology and supporting suite of tools for accurate but fast estimations of computing systems reliability. The backbone of the methodology is a component-based Bayesian model, which effectively calculates system reliability based on the masking probabilities of individual hardware and software components considering their complex interactions. Our detailed experimental evaluation for different technologies, microarchitectures, and benchmarks demonstrates that the proposed model delivers very accurate reliability estimations (FIT rates) compared to statistically significant but slow fault injection campaigns at the microarchitecture level.Peer ReviewedPostprint (author's final draft

Mechanistic modeling of architectural vulnerability factor

Reliability to soft errors is a significant design challenge in modern microprocessors owing to an exponential increase in the number of transistors on chip and the reduction in operating voltages with each process generation. Architectural Vulnerability Factor (AVF) modeling using microarchitectural simulators enables architects to make informed performance, power, and reliability tradeoffs. However, such simulators are time-consuming and do not reveal the microarchitectural mechanisms that influence AVF. In this article, we present an accurate first-order mechanistic analytical model to compute AVF, developed using the first principles of an out-of-order superscalar execution. This model provides insight into the fundamental interactions between the workload and microarchitecture that together influence AVF. We use the model to perform design space exploration, parametric sweeps, and workload characterization for AVF

Statistical Reliability Estimation of Microprocessor-Based Systems

What is the probability that the execution state of a given microprocessor running a given application is correct, in a certain working environment with a given soft-error rate? Trying to answer this question using fault injection can be very expensive and time consuming. This paper proposes the baseline for a new methodology, based on microprocessor error probability profiling, that aims at estimating fault injection results without the need of a typical fault injection setup. The proposed methodology is based on two main ideas: a one-time fault-injection analysis of the microprocessor architecture to characterize the probability of successful execution of each of its instructions in presence of a soft-error, and a static and very fast analysis of the control and data flow of the target software application to compute its probability of success. The presented work goes beyond the dependability evaluation problem; it also has the potential to become the backbone for new tools able to help engineers to choose the best hardware and software architecture to structurally maximize the probability of a correct execution of the target softwar

Evaluating application vulnerability to soft errors in multi-level cache hierarchy

As the capacity of cache increases dramatically with new processors, soft errors originating in cache has become a major reliability concern for high performance processors. This paper presents application specific soft error vulnerability analysis in order to understand an application's responses to soft errors from different levels of caches. Based on a high-performance processor simulator called Graphite, we have implemented a fault injection framework that can selectively inject bit flips to different levels of caches. We simulated a wide range of relevant bit error patterns and measured the applications' vulnerabilities to bit errors. Our experimental results have shown the various vulnerabilities of applications to bit errors from different levels of caches; the results have also indicated the probabilities of different behaviors from the applications

A systematic review of software development cost estimation studies

This paper aims to provide a basis for the improvement of software estimation research through a systematic review of previous work. The review identifies 304 software cost estimation papers in 76 journals and classifies the papers according to research topic, estimation approach, research approach, study context and data set. A web-based library of these cost estimation papers is provided to ease the identification of relevant estimation research results. The review results combined with other knowledge provide support for recommendations for future software cost estimation research, including: 1) Increase the breadth of the search for relevant studies, 2) Search manually for relevant papers within a carefully selected set of journals when completeness is essential, 3) Conduct more studies on estimation methods commonly used by the software industry, and, 4) Increase the awareness of how properties of the data sets impact the results when evaluating estimation methods

Annotated bibliography of software engineering laboratory literature

An annotated bibliography is presented of technical papers, documents, and memorandums produced by or related to the Software Engineering Laboratory. The bibliography was updated and reorganized substantially since the original version (SEL-82-006, November 1982). All materials were grouped into eight general subject areas for easy reference: (1) The Software Engineering Laboratory; (2) The Software Engineering Laboratory: Software Development Documents; (3) Software Tools; (4) Software Models; (5) Software Measurement; (6) Technology Evaluations; (7) Ada Technology; and (8) Data Collection. Subject and author indexes further classify these documents by specific topic and individual author