Phase modulator Patent

Phase modulator with tuned variable length electrical lines including coupling and varactor diode circuit

Constrained Curve Fitting

We survey techniques for constrained curve fitting, based upon Bayesian statistics, that offer significant advantages over conventional techniques used by lattice field theorists.Comment: Lattice2001(plenary); plenary talk given by G.P. Lepage at Lattice 2001 (Berlin); 9 pages, 5 figures (postscript specials

Fitting Jump Models

We describe a new framework for fitting jump models to a sequence of data. The key idea is to alternate between minimizing a loss function to fit multiple model parameters, and minimizing a discrete loss function to determine which set of model parameters is active at each data point. The framework is quite general and encompasses popular classes of models, such as hidden Markov models and piecewise affine models. The shape of the chosen loss functions to minimize determine the shape of the resulting jump model.Comment: Accepted for publication in Automatic

Methods of determining loads and fiber orientations in anisotropic non-crystalline materials using energy flux deviation

An ultrasonic wave is applied to an anisotropic sample material in an initial direction and an angle of flux deviation of the ultrasonic wave front is measured from this initial direction. This flux deviation angle is induced by the unknown applied load. The flux shift is determined between this flux deviation angle and a previously determined angle of flux deviation of an ultrasonic wave applied to a similar anisotropic reference material under an initial known load condition. This determined flux shift is then compared to a plurality of flux shifts of a similarly tested, similar anisotropic reference material under a plurality of respective, known load conditions, whereby the load applied to the particular anisotropic sample material is determined. A related method is disclosed for determining the fiber orientation from known loads and a determined flux shift

GEMS: Galaxy fitting catalogues and testing parametric galaxy fitting codes

In the context of measuring structure and morphology of intermediate redshift galaxies with recent HST/ACS surveys, we tune, test, and compare two widely used fitting codes (GALFIT and GIM2D) for fitting single-component Sersic models to the light profiles of both simulated and real galaxy data. We find that fitting accuracy depends sensitively on galaxy profile shape. Exponential disks are well fit with Sersic models and have small measurement errors, whereas fits to de Vaucouleurs profiles show larger uncertainties owing to the large amount of light at large radii. We find that both codes provide reliable fits and little systematic error, when the effective surface brightness is above that of the sky. Moreover, both codes return errors that significantly underestimate the true fitting uncertainties, which are best estimated with simulations. We find that GIM2D suffers significant systematic errors for spheroids with close companions owing to the difficulty of effectively masking out neighboring galaxy light; there appears to be no work around to this important systematic in GIM2D's current implementation. While this crowding error affects only a small fraction of galaxies in GEMS, it must be accounted for in the analysis of deeper cosmological images or of more crowded fields with GIM2D. In contrast, GALFIT results are robust to the presence of neighbors because it can simultaneously fit the profiles of multiple companions thereby deblending their effect on the fit to the galaxy of interest. We find GALFIT's robustness to nearby companions and factor of >~20 faster runtime speed are important advantages over GIM2D for analyzing large HST/ACS datasets. Finally we include our final catalog of fit results for all 41,495 objects detected in GEMS.Comment: Accepted for publication in ApJS October 2007, v172n2; 25 pages, 16 Figures, 9 Tables; for hi-resolution version, see http://www.mpia.de/homes/bhaeussl/galaxy_fitting.pdf. For results, catalogues and files for code-testing, see http://www.mpia.de/GEMS/fitting_paper.htm