Longtitudinal electron beam diagnostics via upconversion of THz to visible radiation

Longitudinal electro-optic electron bunch diagnostics has been successfully applied at several accelerators. The electro-optic effect can be seen as an upconversion of the Coulomb field of the relativistic electron bunch (THz radiation) to the visible spectral range, where a variety of standard diagnostic tools are available. Standard techniques to characterise femtosecond optical laser pulses (auto- and cross-correlators) have led to the schemes that can measure electron bunch profiles with femtosecond resolution. These techniques require, however, well synchronized femtosecond laser pulses, in order to obtain the desired temporal resolution. Currently, we are exploring other electro-optic variants which require less advanced laser systems and will be more amenable to beam based longitudinal feedback applications. The first results of one such new scheme will be presented in this paper

The Transverse Crack Tension test revisited: An experimental and numerical study

Several problems arise when measuring the mode II interlaminar fracture toughness using a Transverse Crack Tension specimen; in particular, the fracture toughness depends on the geometry of the specimen and cannot be considered a material parameter. A preliminary experimental campaign was conducted on TCTs of different sizes but no fracture toughness was measured because the TCTs failed in an unacceptable way, invalidating the tests. A comprehensive numerical and experimental investigation is conducted to identify the main causes of this behaviour and a modification of the geometry of the specimen is proposed. It is believed that the obtained results represent a significant contribution in the understanding of the TCT test as a mode II characterization procedure and, at the same time, provide new guidelines to characterize the mode II crack propagation under tensile loads

Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

Precise measurements of the temporal profile of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time profile of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deflecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process

Electro-optic techniques for longitudinal electron bunch diagnostics

Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH

Single shot longitudinal bunch profile measurements by temporally resolved electro-optical detection

For the high gain operation of a SASE FEL, extremely short electron bunches are essential to generate sufficiently high peak currents. At the superconducting linac of FLASH at DESY, we have installed an electro- optic measurement system to probe the time structure of the electric field of single ~100 fs electron bunches. In this technique, the field induced birefringence in an electro-optic crystal is encoded on a chirped picosecond laser pulse. The longitudinal electric field profile of the electron bunch is then obtained from the encoded optical pulse by a single shot cross correlation with a 35 fs laser pulse using a second harmonic crystal (temporal decoding). An electro-optical signal exhibiting a feature with 118 fs FWHM was observed, and this is close to the limit of resolution due to the material properties of the particular electro-optic crystal used. The measured electro-optic signals are compared to bunch shapes simultaneously measured with a transverse deflecting cavity

Benchmarking of electro-optic monitors for femtosecond electron bunches

The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties