Polarization-sensitive transfer matrix modeling for displacement measuring interferometry

The use of polarizing optics for both beam steering and phase measurement applications in displacement measuring interferometer designs is almost universal. Interferometer designs that employ polarizing optics in this manner are particularly sensitive to the effects of unwanted optical cavities that form within the optics due to polarization leakage and back reflections from material interfaces. Modeling techniques commonly employed in the design of such interferometers are poorly suited to the analysis of multiple passes through polarizing optics. A technique, along with an accompanying software implementation, is presented here that is capable of modeling the propagation of monochromatic plane waves through an arbitrary network of linear planar optical components

Co-Nanomet: Co-ordination of Nanometrology in Europe

Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Today’s global economy depends on reliable measurements and tests, which are trusted and accepted internationally. It must provide the ability to measure in three dimensions with atomic resolution over large areas. For industrial application this must also be achieved at a suitable speed/throughput. Measurements in the nanometre range should be traceable back to internationally accepted units of measurement (e.g. of length, angle, quantity of matter, and force). This requires common, validated measurement methods, calibrated scientific instrumentation as well as qualified reference samples. In some areas, even a common vocabulary needs to be defined. A traceability chain for the required measurements in the nm range has been established in only a few special cases. A common strategy for European nanometrology has been defined, as captured herein, such that future nanometrology development in Europe may build out from our many current strengths. In this way, European nanotechnology will be supported to reach its full and most exciting potential. As a strategic guidance, this document contains a vision for European nanometrology 2020; future goals and research needs, building out from an evaluation of the status of science and technology in 2010. It incorporates concepts for the acceleration of European nanometrology, in support of the effective commercial exploitation of emerging nanotechnologies. The field of nanotechnology covers a breadth of disciplines, each of which has specific and varying metrological needs. To this end, a set of four core technology fields or priority themes (Engineered Nanoparticles, Nanobiotechnology, Thin Films and Structured Surfaces and Modelling & Simulation) are the focus of this review. Each represents an area within which rapid scientific development during the last decade has seen corresponding growth in or towards commercial exploitation routes. This document was compiled under the European Commission Framework Programme 7 project, Co-Nanomet. It has drawn together input from industry, research institutes, (national) metrology institutes, regulatory and standardisation bodies across Europe. Through the common work of the partners and all those interested parties who have contributed, it represents a significant collaborative European effort in this important field. In the next decade, nanotechnology can be expected to approach maturity, as a major enabling technological discipline with widespread application. This document provides a guide to the many bodies across Europe in their activities or responsibilities in the field of nanotechnology and related measurement requirements. It will support the commercial exploitation of nanotechnology, as it transitions through this next exciting decade

DNA nanomapping using CRISPR-Cas9 as a programmable nanoparticle

Physical mapping of DNA can be used to detect structural variants and for whole-genome haplotype assembly. Here, the authors use CRISPR-Cas9 and high-speed atomic force microscopy to ‘nanomap’ single molecules of DNA