Tutkimus ympäristön vuorovaikutuksesta dispersiiviseen transmon kubittiin

One of the main ways of physically realizing quantum bits for the purposes of quantum technology is to manufacture them as superconducting circuits. These qubits are artificially built two-level systems that act as carriers of quantum information. They come in a variety of types but one of the most common in use is the transmon qubit. The transmon is a more stable, improved version of the earlier types of superconducting qubits with longer coherence times. The qubit cannot function properly on its own, as it needs other circuit elements around it for control and readout of its state. Thus the qubit is only a small part of a larger superconducting circuit interacting with the qubit. Understanding this interaction, where it comes from and how it can be modified to our liking, allows researchers to design better quantum circuits and to improve the existing ones. Understanding how the noise, travelling through the qubit drive lines to the chip, affects the time evolution of the qubit is especially important. Reducing the amount of noise leads to longer coherence times but it is also possible to engineer the noise to our advantage to uncover novel ways of quantum control. In this thesis the effects of a variable temperature noise source on the qubit drive line is studied. A theoretical model describing the time evolution of the quantum state is built. The model starts from the basic elements of the quantum circuit and leads to a master equation describing the qubit dynamics. This allows us to understand how the different choices made in the manufacturing process of the quantum circuit affect the time evolution. As a proof of concept, the model is solved numerically using QuTiP in the specific case of a fixed-frequency, dispersive transmon qubit. The solution shows a decohering qubit with no dissipation. The model is also solved in a temperature range 0K < T ≤ 1K to show how the decoherence times behave with respect to the temperature of the noise source

Dynamics of a dispersively coupled transmon qubit in the presence of a noise source embedded in the control line

We describe transmon qubit dynamics in the presence of noise introduced by an impedance-matched resistor (50 S2) that is embedded in the qubit control line. To obtain the time evolution, we rigorously derive the circuit Hamiltonian of the qubit, readout resonator and resistor by describing the latter as an infinite collection of bosonic modes through the Caldeira-Leggett model. Starting from this Jaynes-Cummings Hamiltonian with inductive coupling to the remote bath comprised of the resistor, we consistently obtain the Lindblad master equation for the qubit and resonator in the dispersive regime. We exploit the underlying symmetries of the master equation to transform the Liouvillian superoperator into a block diagonal matrix. The block diagonalization method reveals that the rate of exponential decoherence of the qubit is well-captured by the slowest decaying eigenmode of a single block of the Liouvillian superoperator, which can be easily computed. The model captures the often used dispersive strong limit approximation of the qubit decoherence rate being linearly proportional to the number of thermal photons in the readout resonator but predicts remarkably better decoherence rates when the dissipation rate of the resonator is increased beyond the dispersive strong regime. Our work provides a full quantitative description of the contribution to the qubit decoherence rate coming from the control line in chips that are currently employed in circuit QED laboratories and suggests different possible ways to reduce this source of the noise.Peer reviewe

CERN Based TcT_{c} Measurement Station for Thin-Film Coated Copper Samples and Results on Related Studies

In the framework of the Future Circular Collider (FCC) Study, the development of thin-film coated superconducting radio-frequency (SRF) cavities capable of providing higher accelerating fields (10 to 20 MV/m against 5 MV/m of LHC) represents a major challenge. The development of a test stand commissioned at CERN for the inductive measurement of the critical temperature (T$_{c}$c) of SC thin-film deposited on copper samples for SRF application is presented in this work. Based on new studies for the production of Non Evaporable Getters (NEG) coated chambers, the first results of an alternative forming method for seamless copper cavities with niobium layer integrated in the production process are also presented