Noise suppression in inverse weak value based phase detection

We examine the effect of different sources of technical noise on inverse weak value-based precision phase measurements. We find that this type of measurement is similarly robust to technical noise as related experiments in the weak value regime. In particular, the measurements considered here are robust to additive Gaussian white noise and angular jitter noise commonly encountered in optical experiments. Additionally, we show the same techniques used for precision phase measurement can be used with the same technical advantages for optical frequency measurements.Comment: 6 pages, 4 figure

Integrated photo-responsive metal oxide semiconductor circuit

An infrared photoresponsive element (RD) is monolithically integrated into a source follower circuit of a metal oxide semiconductor device by depositing a layer of a lead chalcogenide as a photoresistive element forming an ohmic bridge between two metallization strips serving as electrodes of the circuit. Voltage from the circuit varies in response to illumination of the layer by infrared radiation

The Apocalypse According to Johnny Cash: Examining the ‘Effect’ of the Book of Revelation on a Contemporary Apocalyptic Writer

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