2,637 research outputs found

    Frequency stabilization of an external-cavity diode laser

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    Using a hybrid optical/electronic technique, an external-cavity diode laser was frequency stabilized with respect to the sub-Doppler spectrum of cesium vapor. Laser linewidths of 65 kHz and frequency stabilities of ±10 kHz were obtained

    Shot Noise Suppression in Avalanche Photodiodes

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    We identify a new shot noise suppression mechanism in a thin (~100 nm) heterostructure avalanche photodiode. In the low-gain regime the shot noise is suppressed due to temporal correlations within amplified current pulses. We demonstrate in a Monte Carlo simulation that the effective excess noise factors can be <1, and reconcile the apparent conflict between theory and experiments. This shot noise suppression mechanism is independent of known mechanisms such as Coulomb interaction, or reflection at heterojunction interfaces.Comment: Phys. Rev. Lett., accepted for publicatio

    Breaking the Buildup-time Limit of sensitivity in Avalanche Photodiodes by Dynamic Biasing

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    Avalanche photodiodes (APDs) are the preferred photodetectors for direct-detection, high data-rate long-haul optical telecommunications. APDs can detect low-level optical signals due to their internal amplification of the photon-generated electrical current, which is attributable to the avalanche of electron and hole impact ionizations. Despite recent advances in APDs aimed at reducing the average avalanche-buildup time, which causes intersymbol interference and compromises receiver sensitivity at high data rates, operable speeds of commercially available APDs have been limited to 10Gbps. We report the first demonstration of a dynamically biased APD that breaks the traditional sensitivity-versus-speed limit by employing a data-synchronous sinusoidal reverse-bias that drastically suppresses the average avalanche-buildup time. Compared with traditional DC biasing, the sensitivity of germanium APDs at 3Gbps is improved by 4.3 dB, which is equivalent to a 3,500-fold reduction in the bit-error rate. The method is APD-type agnostic and it promises to enable operation at rates of 25Gbps and beyond

    Assessment Of Student Performance And Attitudes For Courses Taught Online Versus Onsite

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    This paper assesses the differences in performance and attitudes of students taught online versus onsite.&nbsp; Students completed a course evaluation designed to determine student satisfaction in specific areas.&nbsp; Student performance was measured by means of a comprehensive exam that tested all material covered in the course.&nbsp; Results support the contention that students in online courses learn as much or more than students in traditional onsite courses and are as satisfied with the course and the instruction as their onsite counterparts

    Impact-ionization and noise characteristics of thin III-V avalanche photodiodes

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    It is, by now, well known that McIntyre\u27s localized carrier-multiplication theory cannot explain the suppression of excess noise factor observed in avalanche photodiodes (APDs) that make use of thin multiplication regions. We demonstrate that a carrier multiplication model that incorporates the effects of dead space, as developed earlier by Hayat et al. provides excellent agreement with the impact-ionization and noise characteristics of thin InP, In/sub 0.52/Al/sub 0.48/As, GaAs, and Al/sub 0.2/Ga/sub 0.8/As APDs, with multiplication regions of different widths. We outline a general technique that facilitates the calculation of ionization coefficients for carriers that have traveled a distance exceeding the dead space (enabled carriers), directly from experimental excess-noise-factor data. These coefficients depend on the electric field in exponential fashion and are independent of multiplication width, as expected on physical grounds. The procedure for obtaining the ionization coefficients is used in conjunction with the dead-space-multiplication theory (DSMT) to predict excess noise factor versus mean-gain curves that are in excellent accord with experimental data for thin III-V APDs, for all multiplication-region widths

    Comparison of supplemented free choice corn silage rations with other forage rations for wintering dairy heifers

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    This publication is a report on Department of Dairy Husbandry research project 55, Diet and Growth--P. [2].Digitized 2007 AES.Includes bibliographical references (page 8)

    Gain-bandwidth product optimization of heterostructure avalanche photodiodes

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    A generalized history-dependent recurrence theory for the time-response analysis is derived for avalanche photodiodes with multilayer, heterojunction multiplication regions. The heterojunction multiplication region considered consists of two layers: a high-bandgap Al/sub 0.6/Ga/sub 0.4/As energy-buildup layer, which serves to heat up the primary electrons, and a GaAs layer, which serves as the primary avalanching layer. The model is used to optimize the gain-bandwidth product (GBP) by appropriate selection of the width of the energy-buildup layer for a given width of the avalanching layer. The enhanced GBP is a direct consequence of the heating of primary electrons in the energy-buildup layer, which results in a reduced first dead space for the carriers that are injected into the avalanche-active GaAs layer. This effect is akin to the initial-energy effect previously shown to enhance the excess-noise factor characteristics in thin avalanche photodiodes (APDs). Calculations show that the GBP optimization is insensitive to the operational gain and the optimized APD also minimizes the excess-noise factor

    Optimized Breakdown Probabilities in Al/sub 0.6/Ga/sub 0.4/As-GaAs Heterojunction Avalanche Photodiodes

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    Recently, it has been shown that the noise characteristics of heterojunction Al/sub 0.6/Ga/sub 0.4/As-GaAs avalanche photodiodes (APDs) can be optimized by proper selection of the width of the Al/sub 0.6/Ga/sub 0.4/As layer. Similar trends have also been shown theoretically for the bandwidth characteristics. The resulting noise reduction and potential bandwidth enhancement have been attributed to the fact that the high bandgap Al/sub 0.6/Ga/sub 0.4/As layer serves to energize the injected electrons, thereby minimizing their first dead space in the GaAs layer. We show theoretically that the same optimized structures yield optimal breakdown-probability characteristics when the APD is operated in Geiger mode. The steep breakdown-probability characteristics, as a function of the excess bias, of thick multiplication regions (e.g., in a 1000-nm GaAs homojunction) can be mimicked in much thinner optimized Al/sub 0.6/Ga/sub 0.4/As-GaAs APDs (e.g., in a 40-nm Al/sub 0.6/Ga/sub 0.4/As and 200-nm GaAs structure) with the added advantage of having a reduced breakdown voltage (e.g., from 36.5 V to 13.7 V)

    Effect of stochastic dead space on noise in avalanche photodiodes

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    A stochastic dead-space model for impact ionization is developed and used to study the effect of the soft nature of the ionization capability of carriers on the excess noise factor of avalanche photodiodes. The proposed model is based on the rationale that the gradual, or soft, transition in the probability density function (PDF) for the distance from birth to impact ionization can be viewed as that resulting from uncertainty in the dead space itself. The resulting soft PDF, which is parameterized by a tunable softness parameter, is used to establish the limitations of the existing hard-threshold ionization models in ultrathin multiplication layers. Calculations show that for a fixed operational gain and fixed average dead space, the excess noise factor tends to increase as a result of the softness in the PDF in very thin multiplication layers (viz, \u3c70 nm), or equivalently, under high applied electric fields (viz., \u3e800 kV/cm). A method is proposed for extracting the softness parameter from noise versus multiplication measurements
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