27 research outputs found

    Synthesis and Complexation Study of New Aminoalkynyl−amidinate Ligands

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    Abstract The current library of amidinate ligands has been extended by the synthesis of two novel dimethylamino‐substituted alkynylamidinate anions of the composition [Me 2 N−CH 2 −C≡C−C(NR) 2 ] − (R = i Pr, cyclohexyl (Cy)). The unsolvated lithium derivatives Li[Me 2 N−CH 2 −C≡C−C(NR) 2 ] ( 1 : R = i Pr, 2 : R = Cy) were obtained in good yields by treatment of in situ‐ prepared Me 2 N−CH 2 −C≡C−Li with the respective carbodiimides, R−N=C=N−R. Recrystallization of 1 and 2 from THF afforded the crystalline THF adducts Li[Me 2 N−CH 2 −C≡C−C(NR) 2 ] ⋅  n THF ( 1 a : R = i Pr, n =1; 2 a : R = Cy, n =1.5). Precursor 2 was subsequently used to study initial complexation reactions with selected di‐ and trivalent transition metals. The dark red homoleptic vanadium(III) tris(alkynylamidinate) complex V[Me 2 N−CH 2 −C≡C−C(NCy) 2 ] 3 ( 3 ) was prepared by reaction of VCl 3 (THF) 3 with 3 equiv. of 2 (75 % yield). A salt‐metathesis reaction of 2 with anhydrous FeCl 2 in a molar ratio of 2 : 1 afforded the dinuclear homoleptic iron(II) alkynylamidinate complex Fe 2 [Me 2 N−CH 2 −C≡C−C(NCy) 2 ] 4 ( 4 ) in 69 % isolated yield. Similarly, treatment of Mo 2 (OAc) 4 with 3 or 4 equiv. of 2 provided the dinuclear, heteroleptic molybdenum(II) amidinate complex Mo 2 (OAc)[Me 2 N−CH 2 −C≡C−C(NCy) 2 ] 3 ( 5 ; yellow crystals, 50 % isolated yield). The cyclohexyl‐substituted title compounds 2 a , 4 , and 5 were structurally characterized through single‐crystal X‐ray diffraction studies.imag

    In-situ study and modeling of the reaction kinetics during molecular beam epitaxy of GeO2 and its etching by Ge

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    Rutile GeO2 has been predicted to be an ultra-wide bandgap semiconductor suitable for future power electronics devices while quartz-like GeO2 shows piezoelectric properties. To explore these crystalline phases for application and fundamental materials investigations, molecular beam epitaxy (MBE) is a well-suited thin film growth technique. In this study, we investigate the reaction kinetics of GeO2 during plasma-assisted MBE using elemental Ge and plasma-activated oxygen fluxes. The growth rate as a function of oxygen flux is measured in-situ by laser reflectometry at different growth temperatures. A flux of the suboxide GeO desorbing off the growth surface is identified and quantified in-situ by the line-of-sight quadrupole mass spectrometry. Our measurements reveal that the suboxide formation and desorption limits the growth rate under metal-rich or high temperature growth conditions, and leads to etching of the grown GeO2 layer under Ge flux in the absence of oxygen. The quantitative results fit the sub-compound mediated reaction model, indicating the intermediate formation of the suboxide at the growth front. This model is further utilized to delineate the GeO2-growth window in terms of oxygen-flux and substrate temperature. Our study can serve as a guidance for the thin film synthesis of GeO2 and defect-free mesa etching in future GeO2-device processing

    Epitaxial synthesis of unintentionally doped p-type SnO (001) via suboxide molecular beam epitaxy

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    By employing a mixed SnO2_2+Sn source, we demonstrate suboxide molecular beam epitaxy growth of phase-pure single crystalline metastable SnO(001) thin films at a growth rate of ~1.0nm/min without the need for additional oxygen. These films grow epitaxially across a wide substrate temperature range from 150 to 450{\deg}C. Hence, we present an alternative pathway to overcome the limitations of high Sn or SnO2_2 cell temperatures and narrow growth windows encountered in previous MBE growth of metastable SnO. In-situ laser reflectometry and line-of-sight quadrupole mass spectrometry were used to investigate the rate of SnO desorption as a function of substrate temperature. While SnO ad-molecules desorption at Ts = 450{\deg}C was growth-rate limiting,the SnO films did not desorb at this temperature after growth in vacuum. The SnO (001) thin films are transparent and unintentionally p-type doped, with hole concentrations and mobilities in the range of 0.9 to 6.0x1018^{18}cm3^{-3} and 2.0 to 5.5 cm2^2/V.s, respectively. These p-type SnO films obtained at low temperatures are promising for back-end-of-line (BEOL) compatible applications and for integration with n-type oxides in p-n heterojunction and field-effect transistorsComment: 18 pages, 10 figure
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