Tritium measurement of Divertor Tiles in JET by PIN-diode

In this study, a simple and easy method of PIN-diode was used to measure the tritium inventory in a tritium-contaminated sample. The results of measurements of X-ray intensities of after being shielded by Al and plastic sheets by PIN-diode method corresponded well to the results by a conventional Ge-semiconductor detector method. The surface distributions at JET Mark IIA type divertor tiles were obtained by using the PIN-diode method that demonstrated a high effectiveness in determining the tritium inventory

Untersuchungen zur Segregation in Palladium-Aluminium- und Nickel-Aluminium-Legierungen mit der Auger-Elektronen-Spektroskopie (AES), der Rutherford-Backscattering-Spektroskopie (RBS) und kernphysikalischen Methoden

SIGLECopy held by FIZ Karlsruhe; available from UB/TIB Hannover / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekDEGerman