No evidence for an effect of testosterone administration on delay discounting in male university students

SummaryIntertemporal choices between a smaller sooner and a larger delayed reward are one of the most important types of decisions humans face in their everyday life. The degree to which individuals discount delayed rewards correlates with impulsiveness. Steep delay discounting has been associated with negative outcomes over a wide range of behaviors such as addiction. However, little is known about the biological foundations of delay discounting. Here, we examine a potential causal link between delay discounting and testosterone, a hormone which has been associated with other types of impulsive behavior. In our double-blind placebo-controlled study 91 healthy young men either received a topical gel containing 50mg of testosterone (N=46) or a placebo (N=45) before participating in a delay discounting task with real incentives. Our main finding is that a single dose administration of testosterone did not lead to significant differences in discount rates between the placebo and the testosterone group. Within groups and in the pooled sample, no significant relationship between testosterone and discount rates was observed. At the same time, we do replicate standard findings from the delay discounting literature such as a magnitude-of-rewards effect on discount rates. In sum, our findings suggest that circulating testosterone does not have a significant effect on delay discounting in young men

Inequality and risk preference

This paper studies the relationship between income inequality and risk taking. Increased income inequality is likely to enlarge the scope for upward comparisons and, in the presence of reference-dependent preferences, to increase willingness to take risks. Using a globally representative dataset on risk preference in 76 countries, we empirically document that the distribution of income in a country has a positive and significant link with the preference for risk. This relationship is remarkably precise and holds across countries and individuals, as well as alternate measures of inequality. We find evidence that individuals who are more able to understand inequality and individuals who fall behind their inherent point of reference increase their preference for risk. Two complementary instrumental variable approaches support a causal interpretation of our results

Point-Contact Conductances from Density Correlations

We formulate and prove an exact relation which expresses the moments of the two-point conductance for an open disordered electron system in terms of certain density correlators of the corresponding closed system. As an application of the relation, we demonstrate that the typical two-point conductance for the Chalker-Coddington model at criticality transforms like a two-point function in conformal field theory.Comment: 4 pages, 2 figure

Robust DC and efficient time-domain fast fault simulation

Purpose – Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, "golden", design of an electronic circuit. By fault simulation one simulates all situations. Normally this leads to a large list of simulations in which for each defect a steady-state (DC) solution is determined followed by a transient simulation. We improve the robustness and the e¿iciency of these simulations. Design/methodology/approach – Determining the DC solution can be very hard. For this we present an adaptive time domain source stepping procedure that can deal with controlled sources. The method can easily be combined with existing pseudo-transient procedures. The method is robust and e¿cient. In the subsequent transient simulation the solution of a fault is compared to a golden, fault-free, solution. A strategy is developed to e¿ciently simulate the faulty solutions until their moment of detection. Finding – We fully exploit the hierarchical structure the circuit in the simulation process to bypass parts of the circuit that appear to be una¿ected by the fault. Accurate prediction and e¿cient solution procedures lead to fast fault simulation. Originality/value – Our fast fault simulation helps to store a database with detectable deviations for each fault. If such a detectable output "matches" a result of a product that has been returned because of malfunctioning it helps to identify the subcircuit that may contain the real fault. One aims to detect as much as possible candidate faults. Because of the many options the simulations must be very e¿cient

Robust DC and efficient time-domain fast fault simulation

Purpose – Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, "golden", design of an electronic circuit. By fault simulation one simulates all situations. Normally this leads to a large list of simulations in which for each defect a steady-state (DC) solution is determined followed by a transient simulation. We improve the robustness and the e¿iciency of these simulations. Design/methodology/approach – Determining the DC solution can be very hard. For this we present an adaptive time domain source stepping procedure that can deal with controlled sources. The method can easily be combined with existing pseudo-transient procedures. The method is robust and e¿cient. In the subsequent transient simulation the solution of a fault is compared to a golden, fault-free, solution. A strategy is developed to e¿ciently simulate the faulty solutions until their moment of detection. Finding – We fully exploit the hierarchical structure the circuit in the simulation process to bypass parts of the circuit that appear to be una¿ected by the fault. Accurate prediction and e¿cient solution procedures lead to fast fault simulation. Originality/value – Our fast fault simulation helps to store a database with detectable deviations for each fault. If such a detectable output "matches" a result of a product that has been returned because of malfunctioning it helps to identify the subcircuit that may contain the real fault. One aims to detect as much as possible candidate faults. Because of the many options the simulations must be very e¿cient