A review of thin-film transistors/circuits fabrication with 3D self-aligned imprint lithography

Nanoimprint lithography (NIL) is a promising method for the fabrication of micro/nanostructures through a simple, low-cost, and high throughput process. Imprinted 2D structure with high resolution has been demonstrated successfully for certain applications including magnetic hard disks and optical gratings. Manufacturing low-cost electronic devices that require patterned multi-layers with NIL is very challenging, particularly for those requiring different patterns. In recent years, considerable effort has been made using the self-aligned imprinting technique, opening an alternative way to develop and fabricate complementary flexible electronics. In this paper we review thin film transistor (TFT) fabrication with 3D self-aligned imprint lithography (SAIL), which enables the patterning and alignment of submicron features on meter-scale flexible substrates in the roll-to-roll configuration. The 3D SAIL solves the problem of precision interlayer registry of devices on a moving web by encoding all geometric information required for all device patterning steps into a monolithic imprinted 3D structure.The authors acknowledge support from the Marie-Curie Fellowship (IEF): project number 301028

Supplement 1. A summary of data and a list of references.

<h2>File List</h2><p> <a href="MA_Data.txt">MA_Data.txt</a> (md5: 0e737a7606064d123a53ae961663aa9b) </p><h2>Description</h2><div> <p>MA_data.txt is a text file (tab delimited, with headers) containing a summary of data included in the meta-analysis.</p> <p>nr: sample size used to calculate variance of effect size, for correlations</p> <p>nb: sample size used to calculate variance of effect size, for slopes</p> <p>r: correlation coefficient</p> <p>b: regression slope</p> <p>V(b): variance of b</p> <p>NA: Not Available data.</p> <p>Difference in n: indicates whether the sample size used in the meta-analysis was different or equal to the number of replicates reported by authors. n values were sometimes "Different" when r and b had to be re-calculated from tables or digitized from figures.</p> <p>Type of r: r values directly extracted from original publications or re-calculated from tables or figures</p> <p>Source of r, b, extent: Text, figures, tables or appendices used to extract r, b or spatial extent values</p> <p>In the last five columns, the marks indicate the case studies used for a specific meta-analysis. E.g. Case 1 was used in the test of the spatial extent, the habitat, the taxon and the diversity metric effects but not in the test of the trophic level effect on plant-animals correlations.</p> </div> <br

Appendix A. A comparison of the outputs of the meta-analyses based on the full data set and on data averaged at the publication level.

A comparison of the outputs of the meta-analyses based on the full data set and on data averaged at the publication level

Table S2_Data

Insect herbivory and leaf traits data of birch trees along a tree diversity gradient under irrigated vs. water stress conditions, in the ORPHEE experimen

Locations of the studies included in this meta-analysis reporting on the relationship between the four aspects of insect herbivory and tree Shannon/Simpson diversity (circles), tree species richness (squares) or the comparison between single vs. mixed stands (triangles).

<p>The colouring indicates the different aspects of insect herbivory. Made with Natural Earth. Free vector and raster map data (<a href="http://naturalearthdata.com" target="_blank">naturalearthdata.com</a>).</p

Flow chart of the study search and selection process.

<p>Flow chart of the study search and selection process.</p

Intercept-only and most parsimonious mixed-effects meta-regression models.

<p>Intercept-only and most parsimonious mixed-effects meta-regression models.</p

Effect of mother tree identity on insect herbivores in monocultures.

<p>(A) Effect of mother tree identity on damage (% leaf area removed) due to ectophagous herbivores. (B) Effect of mother tree identity on the abundance of endophagous insect herbivores. Semi transparent coloured circles represent individual saplings. Darkest circles represent overlapping datapoints. Solid black circled dots indicate the mean values in monocultures for all saplings and all blocks. Same letter above two lines of dots indicates that the corresponding means were not significantly different (LMM and GLMM on monoculture plots).</p

Summary of <i>t</i> values from <i>t</i>-tests for net genetic diversity effect (NGDE), complementarity effect (CE) and selection effect (SE) on damage of ectophagous and abundance of endophagous (leaf-miners) insects, and on sapling height, for all mixtures (grand mean) and for each level of genetic diversity (GD).

<p>Significant t-values are in bold: (***) P-value <0.001, (**) 0.001< P-value <0.01, (*) 0.01< P-value <0.05.</p

JAPPL-2016-00231_data

A csv file containing plot and vine stock ID, number of attacked lures per vine stock, main bird community metrics and habitat heterogeneity variable