Spatial-SpinDrop: Spatial Dropout-based Binary Bayesian Neural Network with Spintronics Implementation

Recently, machine learning systems have gained prominence in real-time, critical decision-making domains, such as autonomous driving and industrial automation. Their implementations should avoid overconfident predictions through uncertainty estimation. Bayesian Neural Networks (BayNNs) are principled methods for estimating predictive uncertainty. However, their computational costs and power consumption hinder their widespread deployment in edge AI. Utilizing Dropout as an approximation of the posterior distribution, binarizing the parameters of BayNNs, and further to that implementing them in spintronics-based computation-in-memory (CiM) hardware arrays provide can be a viable solution. However, designing hardware Dropout modules for convolutional neural network (CNN) topologies is challenging and expensive, as they may require numerous Dropout modules and need to use spatial information to drop certain elements. In this paper, we introduce MC-SpatialDropout, a spatial dropout-based approximate BayNNs with spintronics emerging devices. Our method utilizes the inherent stochasticity of spintronic devices for efficient implementation of the spatial dropout module compared to existing implementations. Furthermore, the number of dropout modules per network layer is reduced by a factor of $9\times$ and energy consumption by a factor of $94.11\times$, while still achieving comparable predictive performance and uncertainty estimates compared to related works

One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection

Neural networks (NNs) are capable of learning complex patterns and relationships in data to make predictions with high accuracy, making them useful for various tasks. However, NNs are both computation-intensive and memory-intensive methods, making them challenging for edge applications. To accelerate the most common operations (matrix-vector multiplication) in NNs, hardware accelerator architectures such as computation-in-memory (CiM) with non-volatile memristive crossbars are utilized. Although they offer benefits such as power efficiency, parallelism, and nonvolatility, they suffer from various faults and variations, both during manufacturing and lifetime operations. This can lead to faulty computations and, in turn, degradation of post-mapping inference accuracy, which is unacceptable for many applications, including safety-critical applications. Therefore, proper testing of NN hardware accelerators is required. In this paper, we propose a \emph{one-shot} testing approach that can test NNs accelerated on memristive crossbars with only one test vector, making it very suitable for online testing applications. Our approach can consistently achieve $100\%$ fault coverage across several large topologies with up to $201$ layers and challenging tasks like semantic segmentation. Nevertheless, compared to existing methods, the fault coverage is improved by up to $24\%$, the memory overhead is only $0.0123$ MB, a reduction of up to $19980\times$ and the number of test vectors is reduced by $10000\times$

POS2 - Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric

Neural Networks (NN) can be efficiently accelerated using emerging resistive non-volatile memories (eNVM), such as Spin Transfer Torque Magnetic RAM(STT-MRAM). However, process variations and runtime temperature fluctuations can lead to miss-quantizing the sensed state and in turn, degradation of inference accuracy. We propose a design-time reference current generation method to improve the robustness of the implemented NN under different thermal and process variation scenarios with no additional runtime hardware overhead compared to existing solutions

Scalable Spintronics-based Bayesian Neural Network for Uncertainty Estimation

International audienc

SpinBayes: Algorithm-Hardware Co-Design for Uncertainty Estimation Using Bayesian In-Memory Approximation on Spintronic-Based Architectures

International audienceRecent development in neural networks (NNs) has led to their widespread use in critical and automated decision-making systems, where uncertainty estimation is essential for trustworthiness. Although conventional NNs can solve many problems accurately, they do not capture the uncertainty of the data or the model during optimization. In contrast, Bayesian neural networks (BNNs), which learn probabilistic distributions for their parameters, offer a sound theoretical framework for estimating uncertainty. However, traditional hardware implementations of BNNs are expensive in terms of computational and memory resources, as they (i) are realized with inefficient von Neumann architectures, (ii) use a significantly large number of random number generators (RNGs) to implement the distributions of BNNs, and (iii) have a substantially greater number of parameters than conventional NNs. Computing-in-memory (CiM) architectures with emerging resistive non-volatile memories (NVMs) are promising candidates for accelerating classical NNs. In particular, spintronic technology, which is distinguished by its low latency and high endurance, aligns very well with these requirements. In the specific context of Bayesian neural networks (BNNs), spintronics technologies are very valuable, thanks to their inherent potential to act as stochastic or as deterministic devices. Consequently, BNNs mapped on spintronic-based CiM architectures could be a highly efficient implementation strategy. However, the direct implementation on CiM hardware of the learned probabilistic distributions of BNN may not be feasible and can incur high overhead. In this work, we propose a new Bayesian neural network topology, named SpinBayes , that is able to perform efficient sampling during the Bayesian inference process. Moreover, a Bayesian approximation method, called in-memory approximation , is proposed that approximates the original probabilistic distributions of BNN with a distribution that can be efficiently mapped to spintronic-based CiM architectures. Compared to state-of-the-art methods, the memory overhead is reduced by 8× and the energy consumption by 80×. Our method has been evaluated on several classification and semantic segmentation tasks and can detect up to 100% of various types of out-of-distribution data, highlighting the robustness of our approach, without any performance sacrifice