An investigation of CdZnTe thin films for photovoltagics

In the last decade, the interest in the study of thin film CdZnT e (CZT) alloys has been increased due to their important industrial applications as solar cells, photodetectors, and gamma-ray detectors. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/3495

Effect of Substrate Temperature on the Structural Properties of CdxZn1-xTe Films Grown by Close-Spaced Sublimation Method

In this work by energy dispersive analysis of X-rays, scanning electron microscopy and X-ray diffraction methods films of CdxZn1-xTe solid solution, obtained by a close-spaced vacuum sublimation technique under different temperatures of glass substrate, has been studied. Films were deposited by the co sublimation of Cadmium Telluride (CdTe) and Zinc Telluride (ZnTe) chunks, mixed in the ratio of 2:1. The effect of substrate temperature on the surface morphology, elemental and phase composition, lattice parameter, scattering domain sizes has been studied. The results of these studies can be used for obtaining absorber layers of tandem solar cells, basic layers of X-ray and gamma detectors

Effect of Substrate Temperature on the Structural Properties of CdxZn1-xTe Films Grown by Close-Spaced Sublimation Method

In this work by energy dispersive analysis of X-rays, scanning electron microscopy and X-ray diffraction methods films of CdxZn1-xTe solid solution, obtained by a close-spaced vacuum sublimation technique under different temperatures of glass substrate, has been studied. Films were deposited by the co sublimation of Cadmium Telluride (CdTe) and Zinc Telluride (ZnTe) chunks, mixed in the ratio of 2:1. The effect of substrate temperature on the surface morphology, elemental and phase composition, lattice parameter, scattering domain sizes has been studied. The results of these studies can be used for obtaining absorber layers of tandem solar cells, basic layers of X-ray and gamma detectors

Structural and microstructural properties of Cd₁-xZnxTe films deposited by close spaced vacuum sublimation

The structural properties (microstresses, texture, lattice parameter, coherent scattering domains size) and chemical composition of Cd₁₋xZnxTe (CZT) films with variable zinc concentration were studied. Films were deposited on molybdenum coated glass substrates by close spaced vacuum sublimation method. Properties of samples were investigated by X-ray diffraction, energy dispersive spectroscopy, scanning electron microscopy. Zinc concentration in CdZnTe layers was determined by the EDS and from the lattice parameter, according to the literature data. Namely, it was determined that the CZT films had following Zn concentrations: x = 0.09, x = 0.24, x = 0.30