Description of statistical methods and a routine for determining the parameters of a model in processing experimental results

A computer routine is suggested for selecting the optimum parameters of a theoretical model and determining the errors in them due to errors in physical measurements and for evaluating the conformity of theory with the experiment. The paper describes the specification sequence for the input data and the format of the calculation results. Sample printouts are appended

Spectral transformation in the SOFI complex for processing photographic images on the ES computer, part 1

A description is given of three programs catalogued in the form of object modules in the library of a system for processing photographic images computer. PFT is the subprogram of the multi-dimensional BPF of real-valued information, in the operative computer memory. INRECO is a subprogram-interface between the real and complex formats for representing two-dimensional spectra and images. FFT2 is a subprogram for calculating the correlation functions of the image using the previous subprograms

Defect-Related Luminescence in Undoped GaN Grown by HVPE

Hydride vapor phase epitaxy (HVPE) is used for the growth of low-defect GaN. We have grown undoped films on sapphire and investigated them using steady-state and time-resolved photoluminescence (PL). One of the dominant PL bands in high-quality GaN grown by HVPE is the green luminescence (GL) band with a maximum at 2.4 eV. This PL band can be easily recognized in time-resolved PL measurements due to its exponential decay even at low temperatures (\u3c50 K), with a characteristic lifetime of 1–2 μs. As the temperature increases from 70 K to 280 K, the PL lifetime for the GL band increases by an order of magnitude. This unusual phenomenon can be explained on the assumption that the electron-capture coefficient for the GL-related defect decreases with temperature as T −2.6