CONTINUITY AND DISCONTINUITY IN HUNGARIAN LEGAL PHILOSOPHY

peer reviewe

Farm Inputs and Agri-Environment Measures as Indicators of Agri-Environment Quality in Hungary

The paper deals with agri-environmental indicators, examines farm inputs, on the basis of statistical data of the Organisation for Economic Co-operation and Development (OECD) (Szabo, Pomazi 2002) and the Eurostat (2004). The examined indicators are placed in the agricultural DPSIR model. The paper presents how the use of farm inputs changed in Hungary from 1980-2000. Farm inputs are related to the inputs of the EU-15, the study demonstrates that today they are below the EU- 15 average. Area under agri-environmental measures in 2003 - which covered the 4% of agricultural area of Hungary - as a response indicator is also presented and based in the land-use zone system developed by Godollo Agricultural University (Angyan et al., 1998).agri-environmental measures, farm inputs, indicators, Environmental Economics and Policy, Q01,

Electronic Structure Evidence for All-Trans Poly(methylvinylidene cyanide)

On the basis of a comparison of theoretical quantum calculations, by both semiempirical and ab initio methods, with photoemission and inverse photoemission results, we suggest that polymethylvinylidenecyanide (PMVC) adopts an all-trans conformation with few, if any, alternating trans-gauche carbon–carbon bond arrangements. The comparison of theory with the available photoemission and inverse photoemission excludes the presence of a significant fraction of gauche bonds in the polymer chains, indicative of the all-trans conformation, with dipoles all aligned

Comparison of the collagen haemostat Sangustop(R) versus a carrier-bound fibrin sealant during liver resection; ESSCALIVER-study

Background: Haemostasis in liver surgery remains a challenge despite improved resection techniques. Oozing from blood vessels too small to be ligated necessitate a treatment with haemostats in order to prevent complications attributed to bleeding. There is good evidence from randomised trials for the efficacy of fibrin sealants, on their own or in combination with a carrier material. A new haemostatic device is Sangustop(R). It is a collagen based material without any coagulation factors. Pre-clinical data for Sangustop(R) showed superior haemostatic effect. This present study aims to show that in the clinical situation Sangustop(R) is not inferior to a carrier-bound fibrin sealant (Tachosil(R)) as a haemostatic treatment in hepatic resection. Methods: This is a multi-centre, patient-blinded, intra-operatively randomised controlled trial. A total of 126 patients planned for an elective liver resection will be enrolled in eight surgical centres. The primary objective of this study is to show the non-inferiority of Sangustop(R) versus a carrier-bound fibrin sealant (Tachosil(R)) in achieving haemostasis after hepatic resection. The surgical intervention is standardised with regard to devices and techniques used for resection and primary haemostasis. Patients will be followed-up for three months for complications and adverse events. Discussion: This randomised controlled trial (ESSCALIVER) aims to compare the new collagen haemostat Sangustop(R) with a carrier-bound fibrin sealant which can be seen as a "gold standard" in hepatic and other visceral organ surgery. If non-inferiority is shown other criteria than the haemostatic efficacy (e.g. costs, adverse events rate) may be considered for the choice of the most appropriate treatment. Trial Registration: NCT0091861

Progress of Multi-Beam Long Trace-Profiler Development

The multi-beam long trace profiler (LTP) under development at NASA s Marshall Space Flight Center[1] is designed to increase the efficiency of metrology of replicated X-ray optics. The traditional LTP operates on a single laser beam that scans along the test surface to detect the slope errors. While capable of exceptional surface slope accuracy, the LTP single beam scanning has slow measuring speed. As metrology constitutes a significant fraction of the time spent in optics production, an increase in the efficiency of metrology helps in decreasing the cost of fabrication of the x-ray optics and in improving their quality. Metrology efficiency can be increased by replacing the single laser beam with multiple beams that can scan a section of the test surface at a single instance. The increase in speed with such a system would be almost proportional to the number of laser beams. A collaborative feasibility study has been made and specifications were fixed for a multi-beam long trace profiler. The progress made in the development of this metrology system is presented

Development of a new generation of optical slope measuring profiler

A collaboration, including all DOE synchrotron labs, industrial vendors of x-ray optics, and with active participation of the HBZ-BESSY-II optics group has been established to work together on a new slope measuring profiler -- the optical slope measuring system (OSMS). The slope measurement accuracy of the instrument is expected to be<50 nrad for the current and future metrology of x-ray optics for the next generation of light sources. The goals were to solidify a design that meets the needs of mirror specifications and also be affordable; and to create a common specification for fabrication of a multi-functional translation/scanning (MFTS) system for the OSMS. This was accomplished by two collaborative meetings at the ALS (March 26, 2010) and at the APS (May 6, 2010)

Binary Pseudo-random Grating Standard for Calibration of Surface Profilometers

We suggest and describe the use of a binary pseudo-random (BPR) grating as a standard test surface for measurement of the modulation transfer function (MTF) of interferometric microscopes. Knowledge of the MTF of a microscope is absolutely necessary to convert the measured height distribution of a surface undergoing metrology into an accurate power spectral density (PSD) distribution. For an'ideal' microscope with an MTF function independent of spatial frequency out to the Nyquist frequency of the detector array with zero response at higher spatial frequencies, a BPR grating would produce a flat 1D PSD spectrum, independent of spatial frequency. For a'real' instrument, the MTF is found as the square root of the ratio of the PSD spectrum measured with the BPR grating to the'ideal,' spatial frequency independent, PSD spectrum. We present the results from a measurement of the MTF of MicromapTM-570 interferometric microscope demonstrating a high efficiency for the calibration method

Development of pseudorandom binary arrays for calibration of surface profile metrology tools

Optical Metrology tools, especially for short wavelength (EUV and X-Ray), must cover a wide range of spatial frequencies from the very low, which affects figure, to the important mid-spatial frequencies and the high spatial frequency range, which produces undesirable scattering. A major difficulty in using surface profilometers arises due to the unknown Point-Spread Function (PSF) of the instruments [1] that is responsible for distortion of the measured surface profile. Generally, the distortion due to the PSF is difficult to account because the PSF is a complex function that comes to the measurement via the convolution operation, while the measured profile is described with a real function. Accounting for instrumental PSF becomes significantly simpler if the result of measurement of a profile is presented in a spatial frequency domain as a Power Spectral Density (PSD) distribution [2]. For example, the measured PSD distributions provide a closed set of data necessary for three-dimensional calculations of scattering of light by the optical surfaces [3], [4]. The distortion of the surface PSD distribution due to the PSF can be modeled with the Modulation Transfer Function (MTF), which is defined over the spatial frequency bandwidth of the instrument [1], [2]. The measured PSD distribution can be presented as a product of the squared MTF and the ideal PSD distribution inherent for the System Under Test (SUT). Therefore, the instrumental MTF can be evaluated by comparing a measured PSD distribution of a known test surface with the corresponding ideal numerically simulated PSD. The square root of the ratio of the measured and simulated PSD distributions gives the MTF of the instrument. In previous work [5], [6] the instrumental MTF of a surface profiler was precisely measured using reference test surfaces based on Binary Pseudo-Random (BPR) gratings. Here, we present results of fabricating and using two-dimensional (2D) BPR arrays that allow for a direct 2D calibration of the instrumental MTF. BPR sequences are widely used in engineering and communication applications such as Global Position System, and wireless communication protocols. The ideal BPR pattern has a flat 'white noise' response over the entire range of spatial frequencies of interest. The BPR array used here is based on the Uniformly Redundant Array prescription [7] initially used for x-ray and gamma ray astronomy applications. The URA's superior imaging capability originates from the fact that its cyclical autocorrelation function very closely approximates a delta function, which produces a flat PSD. Three different size BPR array patterns were fabricated by electron beam lithography and ICP etching of silicon. The basic size unit was 200 nm, 400 nm, and 600 nm. Two different etch processes were used, CF{sub 4}/Ar and HBr, which resulted in undercut and vertical sidewall profiles, respectively. The 2D BPR arrays were used as standard test surfaces for MTF calibration of the MicroMap{trademark}-570 interferometric microscope using all available objectives. The HBr etched two-dimensional BPR arrays have proven to be a very effective calibration standard making possible direct calibration corrections without the need of additional calculation considerations, while departures from the ideal vertical sidewall require an additional correction term for the CF{sub 4}/Ar etched samples. [8] Initial surface roughness of low cost 'prime' wafers limits low magnification calibration but should not be a limitation if better polished samples are used