Strong enhancement of magnetic ordering temperature and structural/valence transitions in EuPd3S4 under high pressure

We present a comprehensive study of the mixed valent compound, EuPd3S4, by electrical transport, X-ray diffraction, time-domain 151Eu synchrotron M\"ossbauer spectroscopy, and X-ray absorption spectroscopy measurements under high pressure. The electrical transport measurements show that the antiferromagnetic ordering temperature, TN, increases rapidly from 2.8 K at ambient pressure to 23.5 K at ~19 GPa and plateaus between ~19 and ~29 GPa after which no anomaly associated with TN is detected. A pressure-induced first order structural transition from cubic to tetragonal is observed, with a rather broad coexistence region (~20 GPa to ~32 GPa) that corresponds to the TN plateau. M\"ossbauer spectroscopy measurements show a clear valence transition from approximately 50:50 Eu2+:Eu3+ to fully Eu3+ at ~28 GPa, consistent with the vanishing of the magnetic order at the same pressure. X-ray absorption data show a transition to a fully trivalent state at a similar pressure. Our results show that pressure first greatly enhances TN, most likely via enhanced hybridization between the Eu 4f states and the conduction band, and then, second, causes a structural phase transition that coincides with the conversion of the europium to a fully trivalent state.Comment: 28 pages, 6 figures in main manuscript, 10 figures in S

Viterbi decoding of CRES signals in Project 8

Cyclotron radiation emission spectroscopy (CRES) is a modern approach for determining charged particle energies via high-precision frequency measurements of the emitted cyclotron radiation. For CRES experiments with gas within the fiducial volume, signal and noise dynamics can be modelled by a hidden Markov model. We introduce a novel application of the Viterbi algorithm in order to derive informational limits on the optimal detection of cyclotron radiation signals in this class of gas-filled CRES experiments, thereby providing concrete limits from which future reconstruction algorithms, as well as detector designs, can be constrained. The validity of the resultant decision rules is confirmed using both Monte Carlo and Project 8 data

SYNCA: A Synthetic Cyclotron Antenna for the Project 8 Collaboration

Cyclotron Radiation Emission Spectroscopy (CRES) is a technique for measuring the kinetic energy of charged particles through a precision measurement of the frequency of the cyclotron radiation generated by the particle\u27s motion in a magnetic field. The Project 8 collaboration is developing a next-generation neutrino mass measurement experiment based on CRES. One approach is to use a phased antenna array, which surrounds a volume of tritium gas, to detect and measure the cyclotron radiation of the resulting β-decay electrons. To validate the feasibility of this method, Project 8 has designed a test stand to benchmark the performance of an antenna array at reconstructing signals that mimic those of genuine CRES events. To generate synthetic CRES events, a novel probe antenna has been developed, which emits radiation with characteristics similar to the cyclotron radiation produced by charged particles in magnetic fields. This paper outlines the design, construction, and characterization of this Synthetic Cyclotron Antenna (SYNCA). Furthermore, we perform a series of measurements that use the SYNCA to test the position reconstruction capabilities of the digital beamforming reconstruction technique. We find that the SYNCA produces radiation with characteristics closely matching those expected for cyclotron radiation and reproduces experimentally the phenomenology of digital beamforming simulations of true CRES signals

Tritium Beta Spectrum and Neutrino Mass Limit from Cyclotron Radiation Emission Spectroscopy

The absolute scale of the neutrino mass plays a critical role in physics at every scale, from the particle to cosmological. Measurements of the tritium endpoint spectrum have provided the most precise direct limit on the neutrino mass scale. In this Letter, we present advances by Project 8 to the Cyclotron Radiation Emission Spectroscopy (CRES) technique culminating in the first frequency-based neutrino mass limit. With only a cm$^3$-scale physical detection volume, a limit of $m_\beta$<180 eV is extracted from the background-free measurement of the continuous tritium beta spectrum. Using $^{83{\rm m}}$Kr calibration data, an improved resolution of 1.66$\pm$0.16 eV (FWHM) is measured, the detector response model is validated, and the efficiency is characterized over the multi-keV tritium analysis window. These measurements establish the potential of CRES for a high-sensitivity next-generation direct neutrino mass experiment featuring low background and high resolution.Comment: 7 pages, 5 figures, for submission to PR

In-plane quasi-single-domain BaTiO3 via interfacial symmetry engineering

The control of the in-plane domain evolution in ferroelectric thin films is not only critical to understanding ferroelectric phenomena but also to enabling functional device fabrication. However, in-plane polarized ferroelectric thin films typically exhibit complicated multi-domain states, not desirable for optoelectronic device performance. Here we report a strategy combining interfacial symmetry engineering and anisotropic strain to design single-domain, in-plane polarized ferroelectric BaTiO3 thin films. Theoretical calculations predict the key role of the BaTiO3/PrScO3 [Formula: see text] substrate interfacial environment, where anisotropic strain, monoclinic distortions, and interfacial electrostatic potential stabilize a single-variant spontaneous polarization. A combination of scanning transmission electron microscopy, piezoresponse force microscopy, ferroelectric hysteresis loop measurements, and second harmonic generation measurements directly reveals the stabilization of the in-plane quasi-single-domain polarization state. This work offers design principles for engineering in-plane domains of ferroelectric oxide thin films, which is a prerequisite for high performance optoelectronic devices