Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy

High energy X-rays (115.56 keV) were used to measure the HIPed interface of F82H steel. The X-ray energy spectra of the samples were analyzed focusing on W and Ta fluorescence X-rays, Compton scattering and elastic scattering X-rays. The results suggest the presence of SiOx and TaOx at the HIP interface and the accumulation of W near the HIP interface. These results indicate that high-energy X-ray spectrum analysis can be a non-destructive testing technique (NDT) to evaluate precipitates at the HIP interface of F82H steel