Design of narrowband infrared emitters by hybridizing guided-mode resonance structures with van der Waals materials

In this paper, narrowband emitters have been designed using particle swarm optimization (PSO) in the 10-20 {\mu}m infrared range. The device structure consists of an anisotropic {\alpha}-MoO3 layer combined with the one- and two-dimensional guided-mode resonance structures. Well-defined absorption lines are present in the reflection spectrum for both TE and TM polarizations, thereby yielding narrowband emissivity at desired wavelengths. The band structure of the designed emitters under TM polarization demonstrates distinct features unlike its TE counterpart. These features are attributed to the interaction between guided-mode resonances and phonon polaritons. The results are relevant for applications in active and passive photonic elements in mid- and long-wave IR bands

Deep-subwavelength Phase Retarders at Mid-Infrared Frequencies with van der Waals Flakes

Phase retardation is a cornerstone of modern optics, yet, at mid-infrared (mid-IR) frequencies, it remains a major challenge due to the scarcity of simultaneously transparent and birefringent crystals. Most materials resonantly absorb due to lattice vibrations occurring at mid-IR frequencies, and natural birefringence is weak, calling for hundreds of microns to millimeters-thick phase retarders for sufficient polarization rotation. We demonstrate mid-IR phase retardation with flakes of $\alpha$-molybdenum trioxide ($\alpha$-MoO$_3$) that are more than ten times thinner than the operational wavelength, achieving 90 degrees polarization rotation within one micrometer of material. We report conversion ratios above 50% in reflection and transmission mode, and wavelength tunability by several micrometers. Our results showcase that exfoliated flakes of low-dimensional crystals can serve as a platform for mid-IR miniaturized integrated polarization control.Comment: 8 pages, 5 figure

Retrieving optical parameters of emerging van der Waals flakes

High-quality low-dimensional layered and van der Waals materials are typically exfoliated, with sample cross sectional areas on the order of tens to hundreds of microns. The small size of flakes makes the experimental characterization of their dielectric properties unsuitable with conventional spectroscopic ellipsometry, due to beam-sample size mismatch and non-uniformities of the crystal axes. Previously, the experimental measurement of the dielectrirc permittivity of such microcrystals was carried out with near-field tip-based scanning probes. These measurements are sensitive to external conditions like vibrations and temperature, and require non-deterministic numerical fitting to some a priori known model. We present an alternative method to extract the in-plane dielectric permittivity of van der Waals microcrystals, based on identifying reflectance minima in spectroscopic measurements. Our method does not require complex fitting algorithms nor near field tip-based measurements and accommodates for small-area samples. We demonstrate the robustness of our method using hexagonal boron nitride and {\alpha}-MoO3, and recover their dielectric permittivities that are close to literature values.Comment: 10 pages, 4 figure and 3 table

High-performance Bragg gratings in chalcogenide rib waveguides written with a modified Sagnac interferometer

This paper was published in Journal of the Optical Society of America B-Optical Physics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/abstract.cfm?URI=josab-23-7-1323. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.Mehrdad Shokooh-Saremi, Vahid G. Ta'eed, Neil J. Baker, Ian C. M. Littler, David J. Moss, Benjamin J. Eggleton, Yinlan Ruan, and Barry Luther-Davie

Integrated all-optical pulse regenerator in chalcogenide waveguides

This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/abstract.cfm?URI=ol-30-21-2900. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.Vahid G. Ta’eed, Mehrdad Shokooh-Saremi, Libin Fu, David J. Moss, Martin Rochette, Ian C. M. Littler, Benjamin J. Eggleton, Yinlan Ruan, and Barry Luther-Davie

Ultra-strong, well-apodised Bragg gratings in chalcogenide rib waveguides

The first ultra-strong, near-perfect, raised-apodised Bragg gratings in As2S3 chalcogenide rib waveguides using λ = 532 nm light and a modified Sagnac holographic writing setup are demonstrated. Good agreement is achieved between the experimental result

Deeply subwavelength mid-infrared phase retardation with α-MoO3 flakes

Abstract Phase retardation is a cornerstone of modern optics, yet, at mid-infrared (mid-IR) frequencies, it remains a major challenge due to the scarcity of simultaneously transparent and birefringent crystals. Most materials resonantly absorb due to lattice vibrations occurring at mid-IR frequencies, and natural birefringence is weak, calling for hundreds of microns to millimeters-thick phase retarders for sufficient polarization rotation. Here, we demonstrate mid-IR phase retardation with flakes of α-MoO3 that are more than ten times thinner than the operational wavelength, achieving 90 degrees polarization rotation within one micrometer of material. We report conversion ratios above 50% in reflection or transmission mode, and wavelength tunability by several micrometers. Our results showcase that exfoliated flakes of low-dimensional crystals can serve as a platform for mid-IR miniaturized integrated low-loss polarization control