492 research outputs found

    Macro expectations, aggregate uncertainty, and expected term premia

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    Based on individual expectations from the Survey of Professional Forecasters, we construct a real-time proxy for expected term premium changes on long-term bonds. We empirically investigate the relation of these bond term premium expectations with expectations about key macroeconomic variables as well as aggregate macroeconomic uncertainty at the level of individual forecasters. We find that expected term premia are (i) time-varying and reasonably persistent, (ii) strongly related to expectations about future output growth, and (iii) positively affected by uncertainty about future output growth and inflation rates. Expectations about real macroeconomic variables seem to matter more than expectations about nominal factors. Additional findings on term structure factors suggest that the level and slope factor capture information related to uncertainty about real and nominal macroeconomic prospects, and that curvature is related to subjective term premium expectations themselves. Finally, an aggregate measure of forecasters' term premium expectations has predictive power for bond excess returns over horizons of up to one year

    Experimental Analysis of Proton-Induced Displacement and Ionization Damage Using Gate-Controlled Lateral PNP Bipolar Transistors

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    The electrical characteristics of proton-irradiated bipolar transistors are affected by ionization damage to the insulating oxide and displacement damage to the semiconductor bulk. While both types of damage degrade the transistor, it is important to understand the mechanisms individually and to be able to analyze them separately. In this paper, a method for analyzing the effects of ionization and displacement damage using gate-controlled lateral PNP bipolar junction transistors is described. This technique allows the effects of oxide charge, surface recombination velocity, and bulk traps to be measured independently

    Socio-cultural norms of body size in Westerners and Polynesians affect heart rate variability and emotion during social interactions

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    The perception of body size and thus weight-related stigmatization vary between cultures. Both are stronger in Western than in Polynesian societies. Negative emotional experiences alter one’s behavioral, psychological, and physiological reactions in social interactions. This study compared affective and autonomic nervous system responses to social interactions in Germany and American Samoa, two societies with different body-size related norms. German (n = 55) and Samoan (n = 56) volunteers with and without obesity participated in a virtual ball-tossing game that comprised episodes of social inclusion and social exclusion. During the experiment, heart rate was measured and parasympathetic activity (i.e., high-frequency heart rate variability) was analyzed. We found differences in both emotional experience and autonomic cardio-regulation between the two cultures: during social inclusion, Germans but not Samoans showed increased parasympathetic activity. In Germans with obesity, this increase was related to a more negative body image (comprising high rates of weight-related teasing). During social exclusion, Samoans showed parasympathetic withdrawal regardless of obesity status, while Germans with obesity showed a stronger increase in parasympathetic activity than lean Germans. Furthermore, we found fewer obesity-related differences in emotional arousal after social exclusion in Samoans as compared to Germans. Investigating the interplay of socio-cultural, psychological, and biological aspects, our results suggest influences of body size-related socio-cultural norms on parasympathetic cardio-regulation and negative emotions during social interactions

    Hoop/column antenna RF verification model. Volume 2: Analysis and correlation

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    As part of the Large Space System Technology Program, the theoretical and experimental results of the RF characteristic of a hoop/column, quad aperture antenna using an RF verification model are presented. To satisfy the primary purposes of the model, experimental pattern data is provided for the quad aperture configuration at different reflector edge illumination levels, from which the geometry and edge effects can be assessed, and experimental data which can be compared with calculations using various theoretical reflector scattering formulae are provided. It also experimentally determines the effects upon secondary patterns of scale model quartz cables, as used in the hoop/column design, upon secondary patterns in order to assess the importance of developing a scattering theory to predict such effects. In addition, a comprehensive theoretical study and the experimental pattern results of quad aperture antenna feeds, a discussion of the fundamental affect of parasitic side lobes, their amplitude, and location in space

    Hoop/Column Antenna: RF Verification Model. Volume 1: Test Results

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    As part of the Large Space System Technology Program, this report, in two volumes, presents the theoretical and experimental results of the RF characteristic of a hoop/column, quad aperture antenna using an RF verification model. To satisfy the primary purposes of the model it provides experimental pattern data for the quad aperture configuration at different reflector edge illumination levels, from which the geometry and edge effects can be assessed, and provides experimental data which can be compared with calculations using various theoretical reflector scattering formulae. It also experimentally determines the effects upon secondary patterns of scale model quartz cables, as used in the hoop/column design, upon secondary patterns in order to assess the importance of developing a scattering theory to predict such effects. In addition, this report contains a comprehensive theoretical study and the experimental pattern results of quad aperture antenna feeds, a discussion of the fundamental affect of parasitic side lobes, their amplitude, and location in space

    A first-principles approach to closing the "10-100 eV gap" for charge-carrier thermalization in semiconductors

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    The present work is concerned with studying accurately the energy-loss processes that control the thermalization of hot electrons and holes that are generated by high-energy radiation in wurtzite GaN, using an ab initio approach. Current physical models of the nuclear/particle physics community cover thermalization in the high-energy range (kinetic energies exceeding ~100 eV), and the electronic-device community has studied extensively carrier transport in the low-energy range (below ~10 eV). However, the processes that control the energy losses and thermalization of electrons and holes in the intermediate energy range of about 10-100 eV (the "10-100 eV gap") are poorly known. The aim of this research is to close this gap, by utilizing density functional theory (DFT) to obtain the band structure and dielectric function of GaN for energies up to about 100 eV. We also calculate charge-carrier scattering rates for the major charge-carrier interactions (phonon scattering, impact ionization, and plasmon emission), using the DFT results and first-order perturbation theory. With this information, we study the thermalization of electrons starting at 100 eV using the Monte Carlo method to solve the semiclassical Boltzmann transport equation. Full thermalization of electrons and holes is complete within ~1 and 0.5 ps, respectively. Hot electrons dissipate about 90% of their initial kinetic energy to the electron-hole gas (90 eV) during the first ~0.1 fs, due to rapid plasmon emission and impact ionization at high energies. The remaining energy is lost more slowly as phonon emission dominates at lower energies (below ~10 eV). During the thermalization, hot electrons generate pairs with an average energy of ~8.9 eV/pair (11-12 pairs per hot electron). Additionally, during the thermalization, the maximum electron displacement from its original position is found to be on the order of 100 nm.Comment: 23 pages, 20 figures. This LaTex file uses RevTex4.2 from AP

    Clinically Actionable Insights into Initial and Matched Recurrent Glioblastomas to Inform Novel Treatment Approaches

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    © 2019 H. P. Ellis et al. Glioblastoma is the most common primary adult brain tumour, and despite optimal treatment, the median survival is 12-15 months. Patients with matched recurrent glioblastomas were investigated to try to find actionable mutations. Tumours were profiled using a validated DNA-based gene panel. Copy number variations (CNVs) and single nucleotide variants (SNVs) were examined, and potentially pathogenic variants and clinically actionable mutations were identified. The results revealed that glioblastomas were IDH-wildtype (IDHWT; n = 38) and IDH-mutant (IDHMUT; n = 3). SNVs in TSC2, MSH6, TP53, CREBBP, and IDH1 were variants of unknown significance (VUS) that were predicted to be pathogenic in both subtypes. IDHWT tumours had SNVs that impacted RTK/Ras/PI(3)K, p53, WNT, SHH, NOTCH, Rb, and G-protein pathways. Many tumours had BRCA1/2 (18%) variants, including confirmed somatic mutations in haemangioblastoma. IDHWT recurrent tumours had fewer pathways impacted (RTK/Ras/PI(3)K, p53, WNT, and G-protein) and CNV gains (BRCA2, GNAS, and EGFR) and losses (TERT and SMARCA4). IDHMUT tumours had SNVs that impacted RTK/Ras/PI(3)K, p53, and WNT pathways. VUS in KLK1 was possibly pathogenic in IDHMUT. Recurrent tumours also had fewer pathways (p53, WNT, and G-protein) impacted by genetic alterations. Public datasets (TCGA and GDC) confirmed the clinical significance of findings in both subtypes. Overall in this cohort, potentially actionable variation was most often identified in EGFR, PTEN, BRCA1/2, and ATM. This study underlines the need for detailed molecular profiling to identify individual GBM patients who may be eligible for novel treatment approaches. This information is also crucial for patient recruitment to clinical trials

    Reliability Concerns for Flying SiC Power MOSFETs in Space

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    SiC power MOSFETs are space-ready in terms of typical reliability measures. However, single event burnout (SEB) often occurs at voltages 50% or lower than specified breakdown. Data illustrating burnout for 1200 V devices is reviewed and the space reliability of SiC MOSFETs is discussed
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