Growth-Induced In-Plane Uniaxial Anisotropy in V2_{2}O3_{3}/Ni Films

We report on a strain-induced and temperature dependent uniaxial anisotropy in V$_{2}$O$_{3}$/Ni hybrid thin films, manifested through the interfacial strain and sample microstructure, and its consequences on the angular dependent magnetization reversal. X-ray diffraction and reciprocal space maps identify the in-plane crystalline axes of the V$_{2}$O$_{3}$; atomic force and scanning electron microscopy reveal oriented rips in the film microstructure. Quasi-static magnetometry and dynamic ferromagnetic resonance measurements identify a uniaxial magnetic easy axis along the rips. Comparison with films grown on sapphire without rips shows a combined contribution from strain and microstructure in the V$_{2}$O$_{3}$/Ni films. Magnetization reversal characteristics captured by angular-dependent first order reversal curve measurements indicate a strong domain wall pinning along the direction orthogonal to the rips, inducing an angular-dependent change in the reversal mechanism. The resultant anisotropy is tunable with temperature and is most pronounced at room temperature, which is beneficial for potential device applications

Coherent Magnetization Rotation of a Layered System Observed by Polarized Neutron Scattering under Grazing Incidence Geometry

The in-plane magnetic structure of a layered system composed of polycrystalline grains smaller than the ferromagnetic exchange length was studied to elucidate the mechanism controlling the magnetic properties considerably different from the bulk using polarized neutron scattering under grazing incidence geometry. The measured result, together with quantitative analysis based on the distorted wave Born approximation, showed that the in-plane length of the area with a uniform orientation of moments ranging from 0.5–1.1 μ m was not significantly varied during the process of demagnetization followed by remagnetization. The obtained behavior of moments is in good agreement with the two-dimensional random anisotropy model where coherent magnetization rotation is dominant

Towards generalized data reduction on a time-of-flight neutron reflectometer

The calculation of neutron reflectivity from raw time-of-flight data including instrumental corrections and an improved resolution calculation is presented. The theoretical calculations are compared with experimental data measured on the vertical sample plane reflectometer D17 and the horizontal sample plane reflectometer FIGARO at the Institut Laue–Langevin (ILL), Grenoble, France. This article comprises the mathematical body of the time-of-flight reflectivity data-reduction software COSMOS which is used on D17 and FIGARO.</jats:p

The role of chemical structure on the magnetic and electronic properties of Co2FeAl0.5Si0.5/Si(111) interface

We show that Co2FeAl0.5Si0.5 film deposited on Si(111) has a single crystal structure and twin related epitaxial relationship with the substrate. Sub-nanometer electron energy loss spectroscopy shows that in a narrow interface region there is a mutual inter-diffusion dominated by Si and Co. Atomic resolution aberration-corrected scanning transmission electron microscopy reveals that the film has B2 ordering. The film lattice structure is unaltered even at the interface due to the substitu- tional nature of the intermixing. First-principles calculations performed using structural models based on the aberration corrected electron microscopy show that the increased Si incorporation in the film leads to a gradual decrease of the magnetic moment as well as significant spin-polarization reduction. These effects can have significant detrimental role on the spin injection from the Co2FeAl0.5Si0.5 film into the Si substrate, besides the structural integrity of this junction

Magnetic and structural depth profiles of Heusler alloy Co2FeAl0.5Si0.5 epitaxial films on Si(1 1 1)

The depth-resolved chemical structure and magnetic moment of Co2FeAl0.5Si0.5, thin films grown on Si(1 1 1) have been determined using x-ray and polarized neutron reflectometry. Bulk-like magnetization is retained across the majority of the film, but reduced moments are observed within 45˚A of the surface and in a 25˚A substrate-interface region. The reduced moment is related to compositional changes due to oxidation and diffusion, which are further quantified by elemental profiling using electron microscopy with electron energy loss spectroscopy. The accuracy of structural and magnetic depth-profiles obtained from simultaneous modeling is discussed using different approaches with different degree of constraints on the parameters. Our approach illustrates the challenges in fitting reflectometry data from these multi-component quaternary Heusler alloy thin films

Effect of increasing disorder on superconductivity of Mo/Nb superlattices

We investigated the superconducting properties of Nb/Mo superlattices (SLs). The structural changes as a function of Nb and Mo layer thickness allow us to investigate the effect of disorder on the superconducting properties in a controlled fashion. Systematic structural studies provide quantitative measures of disorder parameters, such as roughness, interdiffusion, and strain, which allow separating their effect on the individual superconducting layers. The Mo critical temperature does not change as the layer thickness decreases below its coherence length. Thus, the SL critical temperatures in the presence of disorder and proximity effects can be modeled by considering only the effects of the Nb mean free path and coherence length. With increasing layer thickness, the SL critical temperatures approach Nb bulk values. Contrary to expectations the Tc of Mo remains below the Nb Tc. We discuss the results using existing theories based on Coulomb repulsion or changes in the density of states at the Fermi surface as a function of disorder. Questions about current understanding of the effect of disorder on superconductivity arise from the results

Using polarized neutron reflectometry to resolve effects of light elements and ion exposure on magnetization

This chapter introduces the polarized neutron reflectometry (PNR) technique with a focus on its unique applications to studying the effects of light elements and ion beams in magnetic thin films. The chapter is divided into six sections. Following a brief introduction in Section 1, Section 2 introduces the operational principles and advantages of PNR. Section 3 discusses recent experiments on magnetic hydrogen sensors using in-situ magnetic measurements made on a PNR beam line. Section 4 reviews recent progress using PNR to clarify how low-energy ion beams can modulate the magnetic properties by implantation, modifying oxygen stoichiometry, interface engineering with argon, and imprinting magnetic domains by driving phase transitions. Section 5 exemplifies how PNR can be used to study lateral magnetic domain structures patterned using helium ion beams. Section 6 presents conclusions and future perspectives in form of a brief roadmap highlighting some of the latest developments in PNR, and the new technical possibilities that are anticipated over the coming decade

An improved algorithm for reducing reflectometry data involving divergent beams or non-flat samples

Reflectometry is a powerful technique for determining many physical quantities of stratified media, including length scales, densities and magnetism. However, experimentally neutron reflectometry in particular suffers from the relatively feeble brilliance of the sources compared with those of X-rays, for example. In this paper, a simple modification of existing data-reduction methods is demonstrated, allowing quantitative improvements in the quality of the data. Using the same algorithm, reflections from non-flat surfaces can be treated, leading to a full recovery of the resolution. The method involves re-binning of the data in the linear coordinates of the raw data, which leads to substantial gains in statistical quality, equivalent to a significant flux increase, and also improved resolution.</jats:p

Recent upgrades of the neutron reflectometer D17 at ILL

The vertical sample-plane reflectometer D17 at the Institut Laue–Langevin in Grenoble, France, has undergone several major upgrades since its commissioning, which are summarized in this article. The three major improvements are (i) a new focusing guide, increasing the usable flux on the sample by a factor of 2.5; (ii) a new beam polarizer and new spin flippers, allowing for the use of polarized neutrons in time-of-flight mode; and (iii) a new detector with a particularly uniform response under homogeneous exposure, improved stability and state-of-the-art detector electronics. The combination of these factors has paved the road to new possibilities in fast kinetic measurements, magnetism and off-specular scattering. Examples and scientific references for the new capabilities are presented