Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults. The method is especially useful in the case of submicron grain size or nanocrystalline materials, where X-ray line broadening is a well pronounced effect, and the observation of defects with very large density is often not easy by transmission electron microscopy. The fundamentals of X-ray line broadening are summarized in terms of the different qualitative breadth methods, and the more sophisticated and more quantitative whole pattern fitting procedures. The efficiency and practical use of X-ray line profile analysis is shown by discussing its applications to metallic, ceramic, diamond-like and polymer nanomaterials

Radiation induced angiosarcoma a sequela of radiotherapy for breast cancer following conservative surgery

Radiation induced angiosarcomas (RIA) can affect breast cancer patients who had radiotherapy following conservative breast surgery. They are very rare tumors and often their diagnosis is delayed due to their benign appearance and difficulty in differentiation from radiation induced skin changes. Therefore it is very important that clinicians are aware of their existence. We report here a case of RIA followed by discussion and review of literature

Crystalline plasticity in isotactic polypropylene below and above the glass transition temperature

In-situ X-ray diffraction was applied to isotactic polypropylene with a high volume fraction of α-phase (α-iPP) while it has been compressed at temperatures below and above its glass transition temperature Tg. The diffraction patterns were evaluated by the Multi-reflection X-ray Profile Analysis (MXPA) method, revealing microstructural parameters such as the density of dislocations and the size of coherently scattering domains (CSD-size). A significant difference in the development of the dislocation density was found compared to compression at temperatures above Tg, pointing at a different plastic deformation mechanism at these temperatures. Based on the individual evolutions of the dislocation density and CSD-size observed as a function of compressive strain, suggestions for the deformation mechanisms occurring below and above Tg are made