Characterization of digital dispersive spectrometers by low coherence interferometry

We propose a procedure to determine the spectral response of digital dispersive spectrometers without previous knowledge of any parameter of the system. The method consists of applying the Fourier transform spectroscopy technique to each pixel of the detection plane, a CCD camera, to obtain its individual spectral response. From this simple procedure, the system-point spread function and the effect of the finite pixel width are taken into account giving rise to a response matrix that fully characterizes the spectrometer. Using the response matrix information we find the resolving power of a given spectrometer, predict in advance its response to any virtual input spectrum and improve numerically the spectrometer's resolution. We consider that the presented approach could be useful in most spectroscopic branches such as in computational spectroscopy, optical coherence tomography, hyperspectral imaging, spectral interferometry and analytical chemistry, among others.Fil: Martínez Matos, Ó.. Universidad Complutense de Madrid; EspañaFil: Rickenstorff, C.. Universidad Complutense de Madrid; EspañaFil: Zamora, S.. Universidad Complutense de Madrid; EspañaFil: Izquierdo, J. G.. Universidad Complutense de Madrid; EspañaFil: Vaveliuk, Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentin

Characterization of digital dispersive spectrometers by low coherence interferometry

We propose a procedure to determine the spectral response of digital dispersive spectrometers without previous knowledge of any parameter of the system. The method consists of applying the Fourier transform spectroscopy technique to each pixel of the detection plane, a CCD camera, to obtain its individual spectral response. From this simple procedure, the system-point spread function and the effect of the finite pixel width are taken into account giving rise to a response matrix that fully characterizes the spectrometer. Using the response matrix information we find the resolving power of a given spectrometer, predict in advance its response to any virtual input spectrum and improve numerically the spectrometer's resolution. We consider that the presented approach could be useful in most spectroscopic branches such as in computational spectroscopy, optical coherence tomography, hyperspectral imaging, spectral interferometry and analytical chemistry, among others.Facultad de Ciencias ExactasCentro de Investigaciones Óptica

Characterization of digital dispersive spectrometers by low coherence interferometry

We propose a procedure to determine the spectral response of digital dispersive spectrometers without previous knowledge of any parameter of the system. The method consists of applying the Fourier transform spectroscopy technique to each pixel of the detection plane, a CCD camera, to obtain its individual spectral response. From this simple procedure, the system-point spread function and the effect of the finite pixel width are taken into account giving rise to a response matrix that fully characterizes the spectrometer. Using the response matrix information we find the resolving power of a given spectrometer, predict in advance its response to any virtual input spectrum and improve numerically the spectrometer's resolution. We consider that the presented approach could be useful in most spectroscopic branches such as in computational spectroscopy, optical coherence tomography, hyperspectral imaging, spectral interferometry and analytical chemistry, among others.Facultad de Ciencias ExactasCentro de Investigaciones Óptica

Structured light illumination for order sorting in Echelle spectrometers

We report on the operation of an echelle spectrometer under structured light illumination. Each diffraction order of the spectrometer is encoded with a certain periodic structure allowing for order sorting by numerical analysis after detection. In contrast to cross-dispersed echelle spectrometers, in this approach the orders overlap at the detection plane so that the spectral calibration can be performed easily with a single reference wavelength. This operational simplification makes it possible to measure simultaneously the light source under study and the calibration wavelength giving rise to a self-calibrated echelle spectrometer. In this way the device compensates for the spectral drift due to temporal changes of environmental conditions in real time. Our proposal can be useful in a large number of applications requiring moderate, high or very high resolving power for a wide bandwidth in a non-isolated environment.Fil: Martínez Matos, Ó.. Universidad Complutense de Madrid; EspañaFil: Vaveliuk, Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; ArgentinaFil: Rickenstorff, C.. Universidad Complutense de Madrid; Españ