Prepare for the Expected Worst: Algorithms for Reconfigurable Resources Under Uncertainty

In this paper we study how to optimally balance cheap inflexible resources with more expensive, reconfigurable resources despite uncertainty in the input problem. Specifically, we introduce the MinEMax model to study "build versus rent" problems. In our model different scenarios appear independently. Before knowing which scenarios appear, we may build rigid resources that cannot be changed for different scenarios. Once we know which scenarios appear, we are allowed to rent reconfigurable but expensive resources to use across scenarios. Although computing the objective in our model might seem to require enumerating exponentially-many possibilities, we show it is well estimated by a surrogate objective which is representable by a polynomial-size LP. In this surrogate objective we pay for each scenario only to the extent that it exceeds a certain threshold. Using this objective we design algorithms that approximately-optimally balance inflexible and reconfigurable resources for several NP-hard covering problems. For example, we study variants of minimum spanning and Steiner trees, minimum cuts, and facility location. Up to constants, our approximation guarantees match those of previously-studied algorithms for demand-robust and stochastic two-stage models. Lastly, we demonstrate that our problem is sufficiently general to smoothly interpolate between previous demand-robust and stochastic two-stage problems

Comparisons of Force Measurement Methods for DBD Plasma Actuators in Quiescent Air

We have performed measurements of the force induced by both single (one electrode insulated) and double (both electrodes insulated) dielectric barrier discharge plasma actuators in quiescent air. We have shown that, for single barrier actuators with cylindrical exposed electrodes, as the electrode diameter decrease the force efficiencies increase much faster than a previously reported linear trend. This behavior has been experimentally verified using two different measurement techniques: stagnation probe measurements of the induced flow velocity and direct measurement of the force using an electronic balance. Actuators with rectangular cross-section exposed electrodes do not show the same rapid increase at small thicknesses. We have also shown that the induced force is independent of the material used for the exposed electrode. The same techniques have shown that the induced force of a double barrier actuator increases with decreasing narrow electrode diameter

Force Measurements of Single and Double Barrier DBD Plasma Actuators in Quiescent Air

We have performed measurements of the force induced by both single (one electrode insulated) and double (both electrodes insulated) dielectric barrier discharge plasma actuators in quiescent air. We have shown that, for single barrier actuators, as the electrode diameter decreased below those values previously studied the induced Force increases exponentially rather than linearly. This behavior has been experimentally verified using two different measurement techniques: stagnation probe measurements of the induced flow velocity and direct measurement of the force using an electronic balance. In addition, we have shown the the induced force is independent of the material used for the exposed electrode. The same techniques have shown that the induced force of a double barrier actuator increases with decreasing narrow electrode diameter

Communications Biophysics

Contains reports on five research projects.National Institutes of Health (Grant 1 P01 GM-14940-01)Joint Services Electronics Program under Contract DA 28-043-AMC-02536(E

Real-Time Measurement of Thin Film Thickness During Plasma Processing

An in situ single point two-color laser interferometer is used to monitor in real-time the thickness of thin transparent films during processing. The instantaneous change of film thickness is determined by comparing the measured laser reflection interference to that calculated by a model. The etch or deposition rates of the film are determined within 1–2 seconds. The film thickness is also determined in real-time from the phase difference of the reflected laser intensity between the two laser colors. Use of two-color laser interferometry improves the accuracy of the calculated etch or growth rates of the film considerably. Moreover, the two colors provide a clear distinction between film etching and deposition, which may often occur during the same process, and can not be determined by a single color interferometer. The uniformity of the film's etch or deposition rates across the substrate is monitored by an in situ full-wafer image interferometer. The combined use of these two sensors provide instantaneous information of the film thickness, etch or growth rates, as well as time averaged uniformity of the process rates. This diagnostic setup is very useful for process development and monitoring, which is also suitable for manufacturing environment, and can be used for real-time process control.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/45461/1/11088_2004_Article_412642.pd