Predictive factors for concurrent deep-vein thrombosis and symptomatic venous thromboembolic recurrence in case of superficial venous thrombosis. The OPTIMEV study

Superficial venous thrombosis (SVT) prognosis is debated and its management is highly variable. It was the objective of this study to assess predictive risk factors for concurrent deep-vein thrombosis (DVT) at presentation and for three-month adverse outcome. Using data from the prospective multicentre OPTIMEV study, we analysed SVT predictive factors associated with concurrent DVT and three-month adverse outcome. Out of 788 SVT included, 227 (28.8%) exhibited a concurrent DVT at presentation. Age >75years (odds ratio [OR]=2.9 [1.5-5.9]), active cancer (OR=2.6 [1.3-5.2]), inpatient status (OR=2.3 [1.2-4.4]) and SVT on non-varicose veins (OR=1.8 [1.1-2.7]) were significantly and independently associated with an increased risk of concurrent DVT. 39.4% of SVT on non-varicose veins presented a concurrent DVT. However, varicose vein status did not influence the three-month prognosis as rates of death, symptomatic venous thromboembolic (VTE) recurrence and major bleeding were equivalent in both non-varicose and varicose SVTs (1.4% vs. 1.1%; 3.4% vs. 2.8%; 0.7% vs. 0.3%). Only male gender (OR=3.5 [1.1-11.3]) and inpatient status (OR=4.5 [1.3-15.3]) were independent predictive factors for symptomatic VTE recurrence but the number of events was low (n=15, 3.0%). Three-month numbers of deaths (n=6, 1.2%) and of major bleedings (n=2, 0.4%) were even lower, precluding any relevant interpretation. In conclusion, SVT on non-varicose veins and some classical risk factors for DVT were predictive factors for concurrent DVT at presentation. As SVT remains mostly a clinical diagnosis, these data may help selecting patients deserving an ultrasound examination or needing anticoagulation while waiting for diagnostic tests. Larger studies are needed to evaluate predictive factors for adverse outcome

New trends in characterization and modeling of High Power devices

In this paper, we present some non exhaustive measurement techniques used for characterization and modeling of high power devices. Capabilities offered by pulsed measurements can be an efficient approach to deal with self-heating effects and sometimes trapping effects encountered in microwave high power devices. Pulsed techniques allow to separate self-heating and trapping effects, making like this the modeling process easier. A pulsed RF and pulsed bias load-pull system is then described as well as a time waveform measurement system. Capabilities of these two characterization tools are illustrated with results obtained on a high power silicon bipolar transistor and on a GaAs MESFET device

Approche du regime alimentaire hivernal du Hibou Moyen-Duc (Asiootus) dans le bassin parisien

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Donnees sur la prolificite et la croissance du mulot gris (Apodemus sylvaticus L., 1758) en elevage

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Occupation de l'espace chez le chevreuil (Careolus capreolus) II.- Cas des femelles

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Comparaison de plusieurs methodes de determination de l'age individuel chez le Cerf elaphe (Cervus elaphus L.)

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Réponses fonctionnelles de la fouine et de l'hermine aux variations de densité des campagnols prairiaux

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Recherche d'un indicateur de la cinetique demographique des populations du Campagnol des champs (Microtus arvalis)

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Technique legere d'evaluation de l'abondance des populations du Campagnol des champs (Microtus arvalis)

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Structure and kinetics of rodent populations, in a region under agricultural land abandonment

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