Scanning Electrochemical Microscopy. Theory of the Feedback Mode

The steady-state current that flows between the scanning tlp (a disk ultramicroelectrode imbedded in an Insulating sheath) and a planar sample substrate in a scannlng electrochemical microscope (SECM) operating in the feedback mode is calculated by the finite element method with an exponentlaily expandlng grld, for both conductlve and Insulating samples. For conductlve substrates the tip current, representing, for example, the oxidatkn reactlon of R to 0, is enhanced by flow of R generated at the substrate to the tlp and is a functlon of tiphubstrate distance, d , but not the radius of the lnsuiatlng sheath. For insulating substrates, the tlp current Is decreased by blockage of the diffusion of R to the tip by the substrate and depends upon d and the Insulating sheath radius. The theoretical results are compared to experimental studies