18 research outputs found
Growth of CdWO4 crystals by the low thermal gradient Czochralski technique and the properties of a (010) cleaved surface
Growth of CdWO4 crystals by the low thermal gradient Czochralski technique and the properties of a (010) cleaved surface
Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces
The large optical-quality MWO4 (M = Zn, Cd) crystals of mass up to 14 (ZnWO4) and 20 (CdWO4) kg were grown by Low Thermal Gradient Czochralski Technique (LTG Cz). Crystallographic properties of MWO4(010) cleaved surface were evaluated by AFM and RHEED, and electronic structure of the surface was studied using XPS. A system of Kikuchi lines has been observed for cleaved MWO4(010) by RHEED confirming high crystallographic quality of the surface. The XPS valence-band and core-level spectra of MWO4(010) have been measured. The XPS measurements reveal that W and M atoms are in the formal valences 6+ and 2+, respectively, on cleaved MWO4(010) surface
Electronic structure and optical quality of nanocrystalline Y2O3 film surfaces and interfaces on silicon
Electronic structure and optical quality of nanocrystalline Y2O3 film surfaces and interfaces on silicon
The low thermal gradient Czochralski crystal growth and microstructural properties of a Pb2MoO5(20-1) cleaved surface
Optical quality Pb2MoO5 single crystals were grown by the Low Thermal Gradient Czochralski (LTG Cz) technique. The resulting Pb2MoO5 crystals had diameters of 40β50 mm and lengths of ~100 mm. The phase composition of the grown crystals was identified by X-ray single crystal structure analysis; the space group is C2/m and a = 14.2221(11), b = 5.7852(5), c = 7.3262(6) Γ
, Ξ² = 114.168(2)Β° and Z = 4 (R1 = 0.0336). Pb2MoO5(20β1) substrates were prepared by cleavage, and the surface properties were evaluated by RHEED and AFM. The superposition of wide Kikuchi lines and crystal reflexes was found by RHEED. The AFM measurements indicate a surface roughness as low as ~0.2 nm. Thus, atomically smooth surfaces of Pb2MoO5 were formed by cleavage
The low thermal gradient Czochralski crystal growth and microstructural properties of a Pb2MoO5(20-1) cleaved surface
Optical quality Pb2MoO5 single crystals were grown by the Low Thermal Gradient Czochralski (LTG Cz) technique. The resulting Pb2MoO5 crystals had diameters of 40β50 mm and lengths of ~100 mm. The phase composition of the grown crystals was identified by X-ray single crystal structure analysis; the space group is C2/m and a = 14.2221(11), b = 5.7852(5), c = 7.3262(6) Γ
, Ξ² = 114.168(2)Β° and Z = 4 (R1 = 0.0336). Pb2MoO5(20β1) substrates were prepared by cleavage, and the surface properties were evaluated by RHEED and AFM. The superposition of wide Kikuchi lines and crystal reflexes was found by RHEED. The AFM measurements indicate a surface roughness as low as ~0.2 nm. Thus, atomically smooth surfaces of Pb2MoO5 were formed by cleavage