46 research outputs found
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Radially localized measurements of superthermal electrons using oblique electron cyclotron emission
It is shown that radial localization of optically tin Electron Cyclotron Emission from superthermal electrons can be imposed by observation of emission upshifted from the thermal cyclotron resonance in the horizontal midplane of a tokamak. A new and unique diagnostic has been proposed and operated to make radially localized measurements of superthermal electrons during Lower Hybrid Current Drive on the PBX-M tokamak. The superthermal electron density profile as well as moments of the electron energy distribution as a function of radius are measured during Lower Hybrid Current Drive. The time evolution of these measurements after the Lower Hybrid power is turned off are given and the observed behavior reflects the collisional isotropization of the energy distribution and radial diffusion of the spatial profile
New electron cyclotron emission diagnostic based upon the electron Bernstein wave
Most magnetically confined plasma devices cannot take advantage of standard Electron Cyclotron Emission (ECE) diagnostics to measure temperature. They either operate at high density relative to their magnetic field or they do not have sufficient density and temperature to reach the blackbody condition. The standard ECE technique measures the electromagnetic waves emanating from the plasma. Here we propose to measure electron Bernstein waves (EBW) to ascertain the local electron temperature in these plasmas. The optical thickness of EBW is extremely high because it is an electrostatic wave with a large k(subscript i). One can reach the blackbody condition with a plasma density approximately equal to 10(superscript 11) cm(superscript -3) and electron temperature approximately equal to 1 eV. This makes it attractive to most plasma devices. One serious issue with using EBW is the wave accessibility. EBW may be accessible by either direct coupling or mode conversion through an extremely narrow layer (approximately 1-2 mm) in low field devices