Segregation and ordering at the (1×2) reconstructed Pt80Fe20(110) surface determined by low-energy electron diffraction

The surface of an ordered Pt80Fe20(110) crystal exhibits (1×2) and (1×3) reconstructions depending on the annealing treatment after ion bombardment. The (1×3) structure occurs after annealing in the range 750 to 900 K. Annealing above 1000 K leads to the (1×2) structure, which is, from the present result, unambiguously attributed to the same geometrical reconstruction as Pt(110) but with smaller relaxation amplitudes: a detailed low-energy electron-diffraction analysis concludes to a missing-row structure with row pairing in layers 2 and 4 accompanied by a buckling in layers 3 and 5. The top layer spacing is contracted by 13%, and further relaxations are detectable down to the fifth layer. The specific diffraction spots associated with the bulk chemical ordering along the dense [1¯10] rows are very weak: The I(V) analysis shows that this chemical ordering is absent in the outermost ‘‘visible’’ rows but gradually recovers over five to six layers deep. General Pt enrichment is found in the surface ‘‘visible’’ rows (in layers 1–3), but segregation and order yield a subtle redistribution of Pt and Fe atoms in deeper rows: For example, in layer 2, the visible row is Pt rich, whereas the other row (buried under layer 1) is enriched with Fe. Because of the many parameters considered, a fit procedure was applied to a large data basis to solve the structure; the results were confirmed and illustrated subsequently by a standard I(V) analysis for the most relevant parameters. The final r factors are RDE=0.36, RP=0.34, and RZJ=0.14 for two beam sets at normal and oblique incidence consisting of 26 and 21 beams, respectively

Quantitative Surface Analysis by Xps (X-Ray Photoelectron Spectroscopy): Application to Hydrotreating Catalysts

XPS is an ideal technique to provide the chemical composition of the extreme surface of solid materials, vastly applied to the study of catalysts. In this article, we will show that a quantitative approach, based upon fundamental expression of the XPS signal, has enabled us to obtain a consistent set of response factors for the elements of the periodic table. In-depth spadework has been necessary to know precisely the transmission function of the spectrometer used at IFP. The set of response factors obtained enables to perform, on a routine basis, a quantitative analysis with approximately 20% relative accuracy, which is quite acceptable for an analysis of such a nature. While using this quantitative approach, we have developed an analytical method specific to hydrotreating catalysts that allows obtaining the sulphiding degree of molybdenum quite reliably and reproducibly. The usage of this method is illustrated by two examples for which XPS spectroscopy has provided with information sufficiently accurate and quantitative to help understand the reactivity differences between certain MoS2/Al2O3 or NiMoS/Al2O3-type hydrotreating catalysts