Roughness exponents and grain shapes

In surfaces with grainy features, the local roughness $w$ shows a crossover at a characteristic length $r_c$, with roughness exponent changing from $\alpha_1\approx 1$ to a smaller $\alpha_2$. The grain shape, the choice of $w$ or height-height correlation function (HHCF) $C$, and the procedure to calculate root mean-square averages are shown to have remarkable effects on $\alpha_1$. With grains of pyramidal shape, $\alpha_1$ can be as low as 0.71, which is much lower than the previous prediction 0.85 for rounded grains. The same crossover is observed in the HHCF, but with initial exponent $\chi_1\approx 0.5$ for flat grains, while for some conical grains it may increase to $\chi_1\approx 0.7$. The universality class of the growth process determines the exponents $\alpha_2=\chi_2$ after the crossover, but has no effect on the initial exponents $\alpha_1$ and $\chi_1$, supporting the geometric interpretation of their values. For all grain shapes and different definitions of surface roughness or HHCF, we still observe that the crossover length $r_c$ is an accurate estimate of the grain size. The exponents obtained in several recent experimental works on different materials are explained by those models, with some surface images qualitatively similar to our model films.Comment: 7 pages, 6 figures and 2 table

Finite-size effects in roughness distribution scaling

We study numerically finite-size corrections in scaling relations for roughness distributions of various interface growth models. The most common relation, which considers the average roughness $$as scaling factor, is not obeyed in the steady states of a group of ballistic-like models in 2+1 dimensions, even when very large system sizes are considered. On the other hand, good collapse of the same data is obtained with a scaling relation that involves the root mean square fluctuation of the roughness, which can be explained by finite-size effects on second moments of the scaling functions. We also obtain data collapse with an alternative scaling relation that accounts for the effect of the intrinsic width, which is a constant correction term previously proposed for the scaling of$$. This illustrates how finite-size corrections can be obtained from roughness distributions scaling. However, we discard the usual interpretation that the intrinsic width is a consequence of high surface steps by analyzing data of restricted solid-on-solid models with various maximal height differences between neighboring columns. We also observe that large finite-size corrections in the roughness distributions are usually accompanied by huge corrections in height distributions and average local slopes, as well as in estimates of scaling exponents. The molecular-beam epitaxy model of Das Sarma and Tamborenea in 1+1 dimensions is a case example in which none of the proposed scaling relations works properly, while the other measured quantities do not converge to the expected asymptotic values. Thus, although roughness distributions are clearly better than other quantities to determine the universality class of a growing system, it is not the final solution for this task.Comment: 25 pages, including 9 figures and 1 tabl

Stellar archeology of the nearby LINER galaxies NGC 4579 and NGC 4736

Stellar archeology of nearby LINER galaxies may reveal if there is a stellar young population that may be responsible for the LINER phenomenon. We show results for the classical LINER galaxies NGC 4579 and NGC 4736 and find no evidence of such populations.Comment: 2 pages, 2 figures, to be published in the Proceedings of the IAU Symposium no. 26

On the use of Neumann's principle for the calculation of the polarizability tensor of nanostructures

The polarizability measures how the system responds to an applied electrical field. Computationally, there are many different ways to evaluate this tensorial quantity, some of which rely on the explicit use of the external perturbation and require several individual calculations to obtain the full tensor. In this work, we present some considerations about symmetry that allow us to take full advantage of Neumann's principle and decrease the number of calculations required by these methods. We illustrate the approach with two examples, the use of the symmetries in real space and in spin space in the calculation of the electrical or the spin response.Comment: 7 pages, 5 figures, accepted for publication in the Journal of Nanoscience and Nanotechnolog