Atomic-scale imaging of polyvinyl alcohol crystallinity using electron ptychography

Polyvinyl alcohol (PVA) is considered to have great potential in medical, pharmaceutical, and packaging applications because of its outstanding biocompatibility, water solubility, low density and relatively low cost. PVA crystallinity, central to the materials properties, has been studied by X-ray diffraction, but two possible crystal structures are mooted. Electron microscopic techniques can potentially image PVA at high resolution. Still, it is challenging for conventional electron microscopies because of the relatively low crystallinity of PVA, its severe beam sensitivity, and the poor contrast of light elements. Electron ptychography makes use of a 4D STEM dataset comprising the intensity in the STEM detector plane recorded as a function of each probe position and has lower sample damage and better phase-contrast compared to traditional techniques. Here, we use electron ptychography to image PVA crystallinity. The reconstructed images, which show good agreement in the unit cell dimension with X-ray diffraction data, can show how the atoms order in the materials, however, deviations from previous models derived from X-ray diffraction are observed. To interpret the data, we propose a series of changes based on previous models to formulate a description of PVA crystal structure. Simulated results from this new model accord well with the experimental images. This study manages to image both carbon and oxygen atoms in PVA, which has not previously been achieved by any conventional method. The results are expected to bring a new and deeper understanding of PVA crystal structure, and illustrate the opportunity presented by this approach for directly imaging molecular order in polymer crystals

Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion

4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches. However, at present the speed of those detectors, although having drastically improved in the recent years, is still 100 to 1,000 times slower than the current PMT technology operators are used to. Regrettably, this means environmental scanning-distortion often limits the overall performance of the recorded 4D data. Here we present an extension of existing STEM distortion correction techniques for the treatment of 4D-data series. Although applicable to 4D-data in general, we use electron ptychography and electric-field mapping as model cases and demonstrate an improvement in spatial-fidelity, signal-to-noise ratio (SNR), phase-precision and spatial-resolution

How fast is your detector? The effect of temporal response on image quality

With increasing interest in high-speed imaging, there should be an increased interest in the response times of our scanning transmission electron microscope detectors. Previous works have highlighted and contrasted the performance of various detectors for quantitative compositional or structural studies, but here, we shift the focus to detector temporal response, and the effect this has on captured images. The rise and decay times of eight detectors' single-electron response are reported, as well as measurements of their flatness, roundness, smoothness, and ellipticity. We develop and apply a methodology for incorporating the temporal detector response into simulations, showing that a loss of resolution is apparent in both the images and their Fourier transforms. We conclude that the solid-state detector outperforms the photomultiplier tube-based detectors in all areas bar a slightly less elliptical central hole and is likely the best detector to use for the majority of applications. However, using the tools introduced here, we encourage users to effectively evaluate which detector is most suitable for their experimental needs

How Fast is Your Detector? The Effect of Temporal Response on Image Quality

With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous works have previously highlighted and contrasted performance of various detectors for quantitative compositional or structural studies, but here we shift the focus to detector temporal response, and the effect this has on captured images. The rise and decay times of eight detectors' single electron response are reported, as well as measurements of their flatness, roundness, smoothness, and ellipticity. We develop and apply a methodology for incorporating the temporal detector response into simulations, showing that a loss of resolution is apparent in both the images and their Fourier transforms. We conclude that the solid-state detector outperforms the photomultiplier-tube (PMT) based detectors in all areas bar a slightly less elliptical central hole and is likely the best detector to use for the majority of applications. However, using tools introduced here we encourage users to effectively evaluate what detector is most suitable for their experimental needs

Measuring the Hole State Anisotropy in MgB2 by Electron Energy-Loss Spectroscopy

We have examined polycrystalline MgB2 by electron energy loss spectroscopy (EELS) and density of state calculations. In particular, we have studied two different crystal orientations, [110] and [001] with respect to the incident electron beam direction, and found significant changes in the near-edge fine-structure of the B K-edge. Density functional theory suggests that the pre-peak of the B K-edge core loss is composed of a mixture of pxy and pz hole states and we will show that these contributions can be distinguished only with an experimental energy resolution better than 0.5 eV. For conventional TEM/STEM instruments with an energy resolution of ~1.0 eV the pre-peak still contains valuable information about the local charge carrier concentration that can be probed by core-loss EELS. By considering the scattering momentum transfer for different crystal orientations, it is possible to analytically separate pxy and pz components from of the experimental spectra With careful experiments and analysis, EELS can be a unique tool measuring the superconducting properties of MgB2, doped with various elements for improved transport properties on a sub-nanometer scale.Comment: 26 Pages, 5 figures, 1 table. Submited to PR

Smart Align—a new tool for robust non-rigid registration of scanning microscope data

AbstractMany microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias-voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the careful alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated.</jats:p

WS22D nanosheets in 3D nanoflowers

In this work it has been established that 3D nanoflowers of WS2 synthesized by chemical vapour deposition are composed of few layer WS2 along the edges of the petals. An experimental study to understand the evolution of these nanostructures shows the nucleation and growth along with the compositional changes they undergo

Subsampled STEM-ptychography

Ptychography has been shown to be an efficient phase contrast imaging technique for scanning transmission electron microscopes (STEM). STEM-ptychography uses a fast pixelated detector to collect a “4-dimensional” dataset consisting of a 2D electron diffraction pattern at every probe position of a 2D raster-scan. This 4D dataset can be used to recover the phase-image. Current camera technology, unfortunately, can only achieve a frame rate of a few thousand detector frames-per-second (fps), which means that the acquisition time of the 4D dataset is up to 1000× slower than the scanning speed in a conventional STEM, thereby limiting the potential applications of this method for dose-fragile and dynamic specimens. In this letter, we demonstrate that subsampling provides an effective method for optimizing ptychographic acquisition by reducing both the number of detector-pixels and the number of probe positions. Subsampling and recovery of the 4D dataset are shown using an experimental 4D dataset with randomly removed detector-pixels and probe positions. After compressive sensing recovery, Wigner distribution deconvolution is applied to obtain phase-images. Randomly sampling both the probe positions and the detector at 10% gives sufficient information for phase-retrieval and reduces acquisition time by 100×, thereby making STEM-ptychography competitive with conventional STEM