Phase-contrast imaging and tomography at 60 keV using a conventional x-ray tube source

Phase-contrast imaging at laboratory-based x-ray sources using grating interferometers has been developed over the last few years for x-ray energies of up to 28 keV. Here, we show first phase-contrast projection and tomographic images recorded at significantly higher x-ray energies, produced by an x-ray tube source operated at 100 kV acceleration voltage. We find our measured tomographic phase images in good agreement with tabulated data. The extension of phase-contrast imaging to this significantly higher x-ray energy opens up many applications of the technique in medicine and industrial nondestructive testing

Generation and measurement of sub-micrometer relativistic electron beams

The generation of low-emittance electron beams has received significant interest in recent years. Driven by the requirements of X-ray-free electron lasers, the emittance of photocathode injectors has been reduced significantly, with corresponding increase in beam brightness. This has put increasingly stringent requirements on the instrumentation to measure the beam size. These requirements are even more stringent for novel accelerator developments, such as laser-driven accelerators based on dielectric structures or on a plasma. We present here the generation and measurement of a sub-micrometer electron beam, at a particle energy of 330 MeV, and a bunch charge below 1 pC. An electron-beam optics with a vertical beta-function of a few millimeters has been setup. The beam is characterized through a wire scanner that employs a 1 mu m wide metallic structure fabricated using the electron-beam lithography. The smallest (rms) transverse beam size presented here is <500 nm

Generation and measurement of sub-micrometer relativistic electron beams

The generation of low-emittance electron beams has received significant interest in recent years. Driven by the requirements of X-ray-free electron lasers, the emittance of photocathode injectors has been reduced significantly, with corresponding increase in beam brightness. This has put increasingly stringent requirements on the instrumentation to measure the beam size. These requirements are even more stringent for novel accelerator developments, such as laser-driven accelerators based on dielectric structures or on a plasma. We present here the generation and measurement of a sub-micrometer electron beam, at a particle energy of 330 MeV, and a bunch charge below 1 pC. An electron-beam optics with a vertical β-function of a few millimeters has been setup. The beam is characterized through a wire scanner that employs a 1 μm wide metallic structure fabricated using the electron-beam lithography. The smallest (rms) transverse beam size presented here is &lt;500 nm

The ACHIP experimental chambers at the Paul Scherrer Institut

The Accelerator on a Chip International Program (ACHIP) is an international collaboration, funded by the Gordon and Betty Moore Foundation, with the goal of demonstrating that laser-driven accelerator can be integrated on a chip to fully build an accelerator based on dielectric structures. PSI will provide access to the high brightness electron beam of SwissFEL to test structures, approaches and methods towards achieving the final goal of the project. In this contribution, we will describe the two interaction chambers installed on SwissFEL to perform the proof-of-principle experiments. In particular, we will present the positioning system for the samples, the magnets needed to focus the beam to sub-micrometer dimensions and the diagnostics to measure beam properties at the interaction point