Cicadulina (Idyia) fijiensis Linnavuori (Hemiptera: Cicadellidae: Deltocephalinae: Macrostelini), a new leafhopper record for China

Cicadulina (Idyia) fijiensis Linnavuori, bisher nur aus dem paszifischen Raum und aus Nepal bekannt, wird hier erstmals für China angegeben. Neue intraspezfische Variabilität in den männlichen Genitalien der Art und von C. bipunctata (Melichar) werden diskutiert, einschließlich der Ähnlichkeiten einer Population dieser Art mit der pazifischen Art C. bimaculata (Evans). Abbildungen und ein Schlüssel zur Trennung der beiden chinesischen Arten weren vorgestellt.Cicadulina (Idyia) fijiensis Linnavuori, formally known only from the Pacific and Nepal, is reported for the first time from China. New intraspecific variation in the male genitalia of this species and C. bipunctata (Melichar) is discussed, including the similarity of a population of the latter species to the Pacific C. bimaculata (Evans). Figures and a key to separate the two Chinese species are provided

Measurement of the Intertablet Coating Uniformity of a Pharmaceutical Pan Coating Process With Combined Terahertz and Optical Coherence Tomography In-Line Sensing.

We present in-line coating thickness measurements acquired simultaneously using two independent sensing modalities: terahertz pulsed imaging (TPI) and optical coherence tomography (OCT). Both techniques are sufficiently fast to resolve the coating thickness of individual pharmaceutical tablets in-situ during the film coating operation and both techniques are direct structural imaging techniques that do not require multivariate calibration. The TPI sensor is suitable to measure coatings greater than 50 μm and can penetrate through thick coatings even in the presence of pigments over a wide range of excipients. Due to the long wavelength, terahertz radiation is not affected by scattering from dust within the coater. In contrast, OCT can resolve coating layers as thin as 20 μm and is capable of measuring the intra-tablet coating uniformity as well as the inter-tablet coating thickness distribution within the coating pan. ¬-However, the OCT technique is less robust when it comes to the compatibility with excipients, dust and potentially the maximum coating thickness that can be resolved. Using a custom built laboratory scale coating unit, the coating thickness measurements were acquired independently by the TPI and OCT sensors throughout a film coating operation. Results of the in-line TPI and OCT measurements were compared against one another and validated with off-line TPI and weight gain measurements. Compared to other process analytical technology (PAT) sensors, such as near-infrared and Raman spectroscopy, the TPI/OCT sensors can resolve the inter-tablet thickness distribution based on sampling a significant fraction of the tablet populations in the process. By combining two complementary sensing modalities it was possible to seamlessly monitor the coating process over the range of film thickness from 20 μm to greater than 250 μm.The authors would like to acknowledge the financial support from UK EPSRC Research Grant EP/L019787/1 and EP/L019922/1. The authors acknowledge BASF for providing the materials used in this study, Colorcon Ltd. (Dartford, UK) for coating process recommendations, Hüttlin GmbH (Bosch Packaging Technology, Schopfheim, Germany) for advice on the coating unit design and the staff of the electronics and mechanical workshops in Department of Chemical Engineering and Biotechnology at University of Cambridge. HL also acknowledges travel support from Joy Welch Educational Charitable Trust

Measurement of the Intertablet Coating Uniformity of a Pharmaceutical Pan Coating Process With Combined Terahertz and Optical Coherence Tomography In-Line Sensing.

We present in-line coating thickness measurements acquired simultaneously using 2 independent sensing modalities: terahertz pulsed imaging (TPI) and optical coherence tomography (OCT). Both techniques are sufficiently fast to resolve the coating thickness of individual pharmaceutical tablets in situ during the film coating operation, and both techniques are direct structural imaging techniques that do not require multivariate calibration. The TPI sensor is suitable to measure coatings greater than 50 μm and can penetrate through thick coatings even in the presence of pigments over a wide range of excipients. Due to the long wavelength, terahertz radiation is not affected by scattering from dust within the coater. In contrast, OCT can resolve coating layers as thin as 20 μm and is capable of measuring the intratablet coating uniformity and the intertablet coating thickness distribution within the coating pan. However, the OCT technique is less robust when it comes to the compatibility with excipients, dust, and potentially the maximum coating thickness that can be resolved. Using a custom-built laboratory scale coating unit, the coating thickness measurements were acquired independently by the TPI and OCT sensors throughout a film coating operation. Results of the in-line TPI and OCT measurements were compared against one another and validated with off-line TPI and weight gain measurements. Compared with other process analytical technology sensors, such as near-infrared and Raman spectroscopy, the TPI and OCT sensors can resolve the intertablet thickness distribution based on sampling a significant fraction of the tablet populations in the process. By combining 2 complementary sensing modalities, it was possible to seamlessly monitor the coating process over the range of film thickness from 20 μm to greater than 250 μm.The authors would like to acknowledge the financial support from UK EPSRC Research Grant EP/L019787/1 and EP/L019922/1. The authors acknowledge BASF for providing the materials used in this study, Colorcon Ltd. (Dartford, UK) for coating process recommendations, Hüttlin GmbH (Bosch Packaging Technology, Schopfheim, Germany) for advice on the coating unit design and the staff of the electronics and mechanical workshops in Department of Chemical Engineering and Biotechnology at University of Cambridge. HL also acknowledges travel support from Joy Welch Educational Charitable Trust

Improvement of Manik et al.¡¦s remote user authentication scheme

In 2005, Manik et al. propose a novel remote user authentication scheme using bilinear pairings which allows a valid user to login to the remote system but prohibits too many users to login with the same login-ID. It also provides a flexible password change function. In this paper, we will show that this remote user authentication scheme is not secure, an adversary can always pass the authentication

A Novel Non-interactive Deniable Authentication Protocol with Designated Verifier on elliptic curve cryptosystem

Recently, many non-interactive deniable authentication (NIDA) protocols have been proposed. They are mainly composed of two types, signature-based and shared-secrecy based. After reviewing these schemes, we found that the signature-based approach can not deny the source of the message and thus can not achieve full deniability; and that, the shared-secrecy based approach suffers KCI attack although it can achieve full deniability. In addition, both types of schemes lack efficiency consideration for they mainly base on DLP, factoring, or bilinear pairing. Due to this observation, in this paper, we use the Fiat-Shamir heuristic method to propose a new ECC-based NIDA protocol which not only can achieve full deniability but also is more efficient than all of the proposed schemes due to the inheritent property of elliptic curve cryptosystem. Further, we prove the properties of full deniability and KCI resistance conflict for a NIDA protocol. Besides, we deduce that a NIDA protocol is deniable if and only if it is perfect zero-knowledge

A Novel RFID Authentication Protocol based on Elliptic Curve Cryptosystem

Recently, many researchers have proposed RFID authentication protocols. These protocols are mainly consists of two types: symmetric key based and asymmetric key based. The symmetric key based systems usually have some weaknesses such as suffering brute force, de-synchronization, impersonation, and tracing attacks. In addition, the asymmetric key based systems usually suffer from impersonation, man-in-the-middle, physical, and tracing attacks. To get rid of those weaknesses and reduce the system workload, we adopt elliptic curve cryptosystem (ECC) to construct an asymmetric key based RFID authentication system. Our scheme needs only two passes and can resist various kinds of attacks. It not only outperforms the other RFID schemes having the same security level but also is the most efficient