Two-, three-, and four-component magnetic multilayer onion nanoparticles based on iron oxides and manganese oxides

Magnetic multilayered, onion-like, heterostructured nanoparticles are interesting model systems for studying magnetic exchange coupling phenomena. In this work, we synthesized heterostructured magnetic nanoparticles composed of two, three, or four components using iron oxide seeds for the subsequent deposition of manganese oxide. The MnO layer was allowed either to passivate fully in air to form an outer layer of Mn3O4 or to oxidize partially to form MnO|Mn3O4 double layers. Through control of the degree of passivation of the seeds, particles with up to four different magnetic layers can be obtained (i.e., FeO|Fe3O4|MnO|Mn3O4). Magnetic characterization of the samples confirmed the presence of the different magnetic layers

Quantitative magnetic information from reciprocal space maps in transmission electron microscopy

One of the most challenging issues in the characterization of magnetic materials is to obtain quantitative analysis on the nanometer scale. Here we describe how electron magnetic circular dichroism (EMCD) measurements using the transmission electron microscope (TEM) can be used for that purpose, utilizing reciprocal space maps. Applying the EMCD sum rules, an orbital to spin moment ratio of $m_L/m_S=0.08 \pm 0.01$ is obtained for Fe, which is consistent with the commonly accepted value. Hence, we establish EMCD as a quantitative element specific technique for magnetic studies, using a widely available instrument with superior spatial resolution.Comment: 4 pages, 3 figure

Transmission Electron Microscopy for Characterization of Structures, Interfaces and Magnetic Moments in Magnetic Thin Films and Multilayers

Structural characterization is essential for the understanding of the magnetic properties of thin films and multilayers. In this thesis, both crystalline and amorphous thin films and multilayers were analyzed utilizing transmission electron microscopy (TEM). High resolution TEM and electron diffraction studies emphasize on the growth of amorphous Fe91Zr9 and Co68Fe24Zr8 on both Al2O3 and Al70Zr30 in multilayer structures by magnetron sputtering. The properties of the growth surfaces were found to strongly influence the formation of nano-crystallites of the magnetic material at interfaces. Field induced uniaxial magnetic anisotropy was found to be possible to imprint into both fully amorphous and partially crystallized Co68Fe24Zr8 layers, yielding similar magnetic characteristics regardless of the structure. These findings are important for the understanding of both growth and magnetic properties of these amorphous thin films. As magnetic systems become smaller, new analysis techniques need to be developed. One such important step was the realization of electron energy-loss magnetic circular dichroism (EMCD) in the TEM, where information about the ratio of the orbital to spin magnetic moment (mL/mS) of a sample can be obtained. EMCD makes use of angular dependent inelastic scattering, which is characterized using electron energy-loss spectroscopy. The work of this thesis contributes to the development of EMCD by performing quantitative measurements of the mL/mS ratio. Especially, methods for obtaining energy filtered diffraction patterns in the TEM together with analysis tools of the data were developed. It was found that plural inelastic scattering events modify the determination of the mL/mS ratio, wherefore a procedure to compensate for it was derived. Additionally, utilizing special settings of the electron gun it was shown that EMCD measurements becomes feasible on the nanometer level through real space maps of the EMCD signal.

Transmission Electron Microscopy for Characterization of Structures, Interfaces and Magnetic Moments in Magnetic Thin Films and Multilayers

Structural characterization is essential for the understanding of the magnetic properties of thin films and multilayers. In this thesis, both crystalline and amorphous thin films and multilayers were analyzed utilizing transmission electron microscopy (TEM). High resolution TEM and electron diffraction studies emphasize on the growth of amorphous Fe91Zr9 and Co68Fe24Zr8 on both Al2O3 and Al70Zr30 in multilayer structures by magnetron sputtering. The properties of the growth surfaces were found to strongly influence the formation of nano-crystallites of the magnetic material at interfaces. Field induced uniaxial magnetic anisotropy was found to be possible to imprint into both fully amorphous and partially crystallized Co68Fe24Zr8 layers, yielding similar magnetic characteristics regardless of the structure. These findings are important for the understanding of both growth and magnetic properties of these amorphous thin films. As magnetic systems become smaller, new analysis techniques need to be developed. One such important step was the realization of electron energy-loss magnetic circular dichroism (EMCD) in the TEM, where information about the ratio of the orbital to spin magnetic moment (mL/mS) of a sample can be obtained. EMCD makes use of angular dependent inelastic scattering, which is characterized using electron energy-loss spectroscopy. The work of this thesis contributes to the development of EMCD by performing quantitative measurements of the mL/mS ratio. Especially, methods for obtaining energy filtered diffraction patterns in the TEM together with analysis tools of the data were developed. It was found that plural inelastic scattering events modify the determination of the mL/mS ratio, wherefore a procedure to compensate for it was derived. Additionally, utilizing special settings of the electron gun it was shown that EMCD measurements becomes feasible on the nanometer level through real space maps of the EMCD signal.

Transmission Electron Microscopy for Characterization of Structures, Interfaces and Magnetic Moments in Magnetic Thin Films and Multilayers

Structural characterization is essential for the understanding of the magnetic properties of thin films and multilayers. In this thesis, both crystalline and amorphous thin films and multilayers were analyzed utilizing transmission electron microscopy (TEM). High resolution TEM and electron diffraction studies emphasize on the growth of amorphous Fe91Zr9 and Co68Fe24Zr8 on both Al2O3 and Al70Zr30 in multilayer structures by magnetron sputtering. The properties of the growth surfaces were found to strongly influence the formation of nano-crystallites of the magnetic material at interfaces. Field induced uniaxial magnetic anisotropy was found to be possible to imprint into both fully amorphous and partially crystallized Co68Fe24Zr8 layers, yielding similar magnetic characteristics regardless of the structure. These findings are important for the understanding of both growth and magnetic properties of these amorphous thin films. As magnetic systems become smaller, new analysis techniques need to be developed. One such important step was the realization of electron energy-loss magnetic circular dichroism (EMCD) in the TEM, where information about the ratio of the orbital to spin magnetic moment (mL/mS) of a sample can be obtained. EMCD makes use of angular dependent inelastic scattering, which is characterized using electron energy-loss spectroscopy. The work of this thesis contributes to the development of EMCD by performing quantitative measurements of the mL/mS ratio. Especially, methods for obtaining energy filtered diffraction patterns in the TEM together with analysis tools of the data were developed. It was found that plural inelastic scattering events modify the determination of the mL/mS ratio, wherefore a procedure to compensate for it was derived. Additionally, utilizing special settings of the electron gun it was shown that EMCD measurements becomes feasible on the nanometer level through real space maps of the EMCD signal.

Structural and magnetic properties of Co68Fe24Zr8/Al2O3 multilayers

The structural and magnetic properties of Co68Fe24Zr8/Al2O3 multilayers grown by using magnetron Sputtering were investigated with X-ray reflectivity, transmission electron microscopy and magnetooptical Kerr effect. The Co68Fe24Zr8 form amorphous islands when the nominal thickness of the Co68Fe24Zr8 layers is 10 angstrom, exhibiting an isotropic superparamagnetic behavior. Continuous layers with mostly a nano-crystalline structure are instead formed when the nominal thickness of the Co68Fe24Zr8 layers is increased to 20 angstrom. The continuous layers exhibit random, in-plane, magnetic anisotropy resulting from the growth Process. However, induced uniaxial anisotropy is obtained when growing the sample in the presence of an applied magnetic field, regardless of the combination of amorphous and nano-crystalline material

Structural and magnetic properties of Co68Fe24Zr8/Al2O3 multilayers

The structural and magnetic properties of Co68Fe24Zr8/Al2O3 multilayers grown by using magnetron Sputtering were investigated with X-ray reflectivity, transmission electron microscopy and magnetooptical Kerr effect. The Co68Fe24Zr8 form amorphous islands when the nominal thickness of the Co68Fe24Zr8 layers is 10 angstrom, exhibiting an isotropic superparamagnetic behavior. Continuous layers with mostly a nano-crystalline structure are instead formed when the nominal thickness of the Co68Fe24Zr8 layers is increased to 20 angstrom. The continuous layers exhibit random, in-plane, magnetic anisotropy resulting from the growth Process. However, induced uniaxial anisotropy is obtained when growing the sample in the presence of an applied magnetic field, regardless of the combination of amorphous and nano-crystalline material

Morphology of amorphous Fe91Zr9/Al2O3 multilayers : Dewetting and crystallization

Amorphous Fe91Zr9/Al2O3 multilayers grown by magnetron sputtering have been studied using x-ray reflectometry, x-ray diffraction, Rutherford backscattering spectrometry, and transmission electron microscopy. It could be demonstrated that on the interface between the Fe91Zr9 and the Al2O3, crystalline grains are formed, that for very small repetition thicknesses destroy the periodicity of the multilayers by accumulative roughness. Understanding these effects would enable substantial improvement of the quality of nanolaminated amorphous layers