Polarization-modulation near-field optical microscope for quantitative local dichroism mapping

A couple of experimental techniques have been implemented to an aperture near-field scanning optical microscopy (NSOM) to obtain reliable measurement of sample dichroism on the local scale. First, a method to test NSOM tapered fiber probes toward polarization conservation into the near optical field is reported. The probes are characterized in terms of the in-plane polarization of the near field emerging from their aperture, by using a thin dichroic layer of chromophore molecules, structured along stretched polymeric chains, to probe such polarization when approached in the near-field region of the probe. Second, to assure that the light intensity coupled in the fiber is polarization independent, an active system operating in real time has been realized. Such combination of techniques allowed quantitative imaging of local dichroism degree and average orientation by means of dual-phase lock-in demodulation of the optical signal. Translation of the coupled light polarization state in the near field has been observed for one-half of the tested probes. For the others, the tip acts as a polarizer, and therefore showed it was not suitable for polarization modulation NSOM measurements

Extended model for the interaction of dielectric thin films with an electrostatic force microscope probe

To improve measurements of the dielectric permittivity of nanometric portions by means of Local Dielectric Spectroscopy (LDS), we introduce an extension to current analytical models for the interpretation of the interaction between the probe tip of an electrostatic force microscope (EFM) and a thin dielectric film covering a conducting substrate. Using the proposed models, we show how more accurate values for the dielectric constant can be obtained from single-frequency measurements at various probe/substrate distances, not limited to a few tip radii

Electrostatic force microscopy and potentiometry of realistic nanostructured systems

We investigate the dependency of electrostatic interaction forces on applied potentials in Electrostatic Force Microscopy (EFM) as well as in related local potentiometry techniques like Kelvin Probe Microscopy (KPM). The approximated expression of electrostatic interaction between two conductors, usually employed in EFM and KPM, may loose its validity when probe-sample distance is not very small, as often realized when realistic nanostructured systems with complex topography are investigated. In such conditions, electrostatic interaction does not depend solely on the potential difference between probe and sample, but instead it may depend on the bias applied to each conductor. For instance, electrostatic force can change from repulsive to attractive for certain ranges of applied potentials and probe-sample distances, and this fact cannot be accounted for by approximated models. We propose a general capacitance model, even applicable to more than two conductors, considering values of potentials applied to each of the conductors to determine the resulting forces and force gradients, being able to account for the above phenomenon as well as to describe interactions at larger distances. Results from numerical simulations and experiments on metal stripe electrodes and semiconductor nanowires supporting such scenario in typical regimes of EFM investigations are presented, evidencing the importance of a more rigorous modelling for EFM data interpretation. Furthermore, physical meaning of Kelvin potential as used in KPM applications can also be clarified by means of the reported formalism.Comment: 20 pages, 7 figures, 1 tabl

Quantitative Nanofriction Characterization of Corrugated Surfaces by Atomic Force Microscopy

Atomic Force Microscopy (AFM) is a suitable tool to perform tribological characterization of materials down to the nanometer scale. An important aspect in nanofriction measurements of corrugated samples is the local tilt of the surface, which affects the lateral force maps acquired with the AFM. This is one of the most important problems of state-of-the-art nanotribology, making difficult a reliable and quantitative characterization of real corrugated surfaces. A correction of topographic spurious contributions to lateral force maps is thus needed for corrugated samples. In this paper we present a general approach to the topographic correction of AFM lateral force maps and we apply it in the case of multi-asperity adhesive contact. We describe a complete protocol for the quantitative characterization of the frictional properties of corrugated systems in the presence of surface adhesion using the AFM.Comment: 33 pages, 9 figures, RevTex 4, submitted to Journal of Applied Physic

Nerve growth factor is an autocrine survival factor for memory B lymphocytes

AbstractProduction of nerve growth factor (NGF) was assessed in cultures of human T and B lymphocytes and macrophages. NGF was constitutively produced by B cells only, which also expressed surface p140trk-A and p75NGFR molecules and hence efficiently bound and internalized the cytokine. Neutralization of endogenous NGF caused disappearance of Bcl-2 protein and apoptotic death of resting lymphocytes bearing surface IgG or IgA, a population comprising memory cells, while surface IgM/IgD “virgin” B lymphocytes were not affected. In vivo administration of neutralizing anti-NGF antibodies caused strong reduction in the titer of specific IgG in mice immunized with tetanus toxoid, nitrophenol, or arsonate and reduced numbers of surface IgG or IgA B lymphocytes. Thus, NGF is an autocrine survival factor for memory B lymphocytes

Nanomaterials-based strategies for piezoelectric cochlear implants

Nanomaterials-based strategies for piezoelectric cochlear implant