A review of asymptotic procedures in stress analysis: known solutions and their applications

Published versio

Comparison of X-ray diffraction measurement of residual elastic strains: monochromatic beam and image plate versus white beam energy-dispersive analysis

Published versio

Synchrotron x-ray scattering analysis of nylon-12 crystallisation variation depending on 3D printing conditions

7Nylon-12 is an important structural polymer in wide use in the form of fibres and bulk structures. Fused filament fabrication (FFF) is an extrusion-based additive manufacturing (AM) method for rapid prototyping and final product manufacturing of thermoplastic polymer objects. The resultant microstructure of FFF-produced samples is strongly affected by the cooling rates and thermal gradients experienced across the part. The crystallisation behaviour during cooling and solidification influences the micro- and nano-structure, and deserves detailed investigation. A commercial Nylon-12 filament and FFF-produced Nylon-12 parts were studied by differential scanning calorimetry (DSC) and wide-angle X-ray scattering (WAXS) to examine the effect of cooling rates under non-isothermal crystallisation conditions on the microstructure and properties. Slower cooling rates caused more perfect crystallite formation, as well as alteration to the thermal properties.openopende Jager B.; Moxham T.; Besnard C.; Salvati E.; Chen J.; Dolbnya I.P.; Korsunsky A.M.de Jager, B.; Moxham, T.; Besnard, C.; Salvati, E.; Chen, J.; Dolbnya, I. P.; Korsunsky, A. M

Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam

In the present study, residual stress evaluation in thin films was achieved using a semi-destructive trench-cutting method. Focused Ion Beam (FIB) was employed to introduce the strain relief by ring-core milling, i.e. creating a trench around an "island". Either SEM or FIB imaging can be used to record sequences of images for strain change evaluation by Digital Image Correlation (DIC) analysis of micrographs. A regular array of shallow holes was drilled on a thin overlayer of Pt (∼100nm) deposited on to the film prior to patterning and trenching, in order to reduce the damage introduced by the ion beam during imaging and to assist the DIC strain evaluation by adding traceable markers. Finite Element (FE) simulation was also carried out to predict the curves for strain relief as a function of milling depth, and compared with the experimental measurements, which show good agreement with each other. An empirical mathematical description of the curves was proposed that allows efficient residual stress evaluation in thin solid films. © 2011 Published by Elsevier Ltd

Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis

Residual stresses play a crucial role in determining material properties and behaviour, in terms of structural integrity under monotonic and cyclic loading, and for functional performance, in terms of capacitance, conductivity, band gap, and other characteristics. The methods for experimental residual stress analysis at the macro- and micro-scales are well established, but residual stress evaluation at the nanoscale faces major challenges, e.g. the need for sample sectioning to prepare thin lamellae, by its very nature introducing major modifications to the quantity being evaluated. Residual stress analysis by micro-ring core Focused Ion Beam milling directly at sample surface offers lateral resolution better than 1 μm, and encodes information about residual stress depth variation. We report a new method for residual stress depth profiling at the resolution better than 50 nm by the application of a mathematically straightforward and robust approach based on the concept of eigenstrain. The results are validated by direct comparison with measurements by nano-focus synchrotron X-ray diffraction.</p

Ultrafast three-dimensional imaging of lattice dynamics in individual gold nanocrystals

Key insights into the behavior of materials can be gained by observing their structure as they undergo lattice distortion. Laser pulses on the femtosecond time scale can be used to induce disorder in a "pump-probe" experiment with the ensuing transients being probed stroboscopically with femtosecond pulses of visible light, x-rays, or electrons. Here we report three-dimensional imaging of the generation and subsequent evolution of coherent acoustic phonons on the picosecond time scale within a single gold nanocrystal by means of an x-ray free-electron laser, providing insights into the physics of this phenomenon. Our results allow comparison and confirmation of predictive models based on continuum elasticity theory and molecular dynamics simulations