Suppression of optical damage at 532 nm in Holmium doped congruent lithium niobate

Optical damage experiments were carried out in a series of Holmium doped congruent lithium niobate (Ho:cLN) crystals as a function of dopant concentration and laser intensity. The light induced beam distortion was recorded with a camera and a detector under the pseudo-Zscan configuration. At 532 nm, strong suppression of the optical damage was observed for the 0.94 mol. % doped crystal. Increased resistance to optical damage was also observed at 488 nm. The suppression of the optical damage is predominantly attributed to the reduction of the Nb antisites due to the holmium doping

A polaron approach to photorefractivity in Fe : LiNbO3

The thermally activated, incoherent hopping of small electron polarons generated by continuous illumination in iron-doped lithium niobate is simulated by a Marcus-Holstein model for which all the input parameters are known from literature. The results of the calculations are compared with a comprehensive set of data obtained from photorefractive, photogalvanic and photoconductive measurements under green light excitation on samples with different doping levels and stoichiometries in the temperature range between and room temperature. We show that the temperature and composition dependence of the photorefractive observables can be interpreted by a change in the abundance of the different hop types that a polaron performs before being captured by a deep Fe trap. Moreover, by a comparison between experimental and numerical data we obtain new insights on the initial photo-excitation part of the photorefractive process. In particular all results are consistent if a single value of the photogalvanic length is assumed for all the samples and all the temperatures. The photo-generation efficiency under green light excitation (somewhere denoted as quantum efficiency) is also estimated. It appears to decrease from 10%?15% at room temperature to about 5% at 150 K. This behavior is qualitatively interpreted in terms of a temperature-dependent re-trapping probability of the light-emitted particles from the initial Fe donor center

Low- Temperature Synthesis and Characteristics of Fractal Graphene Layers

International audienceLarge scale fractal graphene layers are obtained by complex method of liquid phase exfoliation and self-organization. Atomic force microscopy (AFM) is used to study the surface properties of formed layers and to assess their thickness. Surface potential of graphene and potential transition between the graphene and substrate is measured by Kelvin probe method. The influence of the effect of dielectric confinement on the optical properties of graphene is discussed in this work. Raman scattering spectra were used for structural analysis and assessment of the level of defects. Current-voltage characteristics of graphene ribbons were measured and discussed for different number of layers

Impurity Properties of Inversion Layers with Electronic and Substrate Quantum Screening

In this paper, the combined effect of electronic and substrate screening on impurity states in inversion layers is investigated theoretically. An explicit expression of the screened impurity interaction potential with an effective screening parameter, depending on the material and structural parameters, is established analytically for the first time. The main physical results are (a) an enhancement of the carrier saturation effect and (b) the dependence of the nature of the screening mechanism on the dielectric type (low-κ and high-κ) of the oxide layer. An experimentally measurable impurity binding energy is studied and numerically presented for realistic InSb/SiO2/SiO2/metal (ll-) and InSb/S(sulfur)/HfO2/metal (lh-κ type) multi-layer structures. A substantial enhancement of the binding energy is obtained with the non-degenerate Q2D EG for the ll-κ-type structure, reaching an almost fourfold value of the InSb bulk sample (~0.66 meV)

In this paper, the synthesis process an characterizations of self organized graphene layers are discussed. The Atomic force microscopy (AFM) and Raman spectroscopy is used to study surface and structural properties of obtained layers. Cross sectional and histogram analysis are used to describe obtained AFM images. The relationship between typical Raman peaks is discussed.

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Growth and properties of Zr-doped periodically poled lithium niobate crystals

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