Wavelength-multiplexed single-shot ptychography

Diagnostics capable of interrogating dynamics in harsh environments such as plasma have remained essentially unchanged in recent decades. Developments in advanced microscopy techniques will improve our understanding of the physics involved in these events. Recently developed single-shot ptychography (SSP) provides a pathway towards sophisticated plasma metrologies. Here we introduce wavelength-multiplexed single-shot ptychography (WM-SSP), which allows for hyperspectral, spatially and temporally resolved phase and amplitude contrast imaging. Furthermore, we introduce a novel probe constraint common to all wavelength multiplexed modalities in the single-shot geometry and present modifications to SSP that improve reconstruction fidelity and robustness. WM-SSP was experimentally realized and simulations show the technique's ability to deconvolve the electron and neutral densities within the plasma. WM-SSP will pave the way to a new generation of quantitative plasma imaging techniques.Comment: 12 Pages, 6 Figure

Ultrafast, Single-Event Ptychographic Imaging of Transient Electron Dynamics

Dynamic phenomena occurring on the ultrafast time scales are inherently difficult to image. While pump–probe techniques have been used for decades, probing nonrepeatable phenomena precludes this form of imaging. Additionally, many ultrafast phenomena, such as electron dynamics, exhibit low amplitude contrast in the optical wavelength range and thus require quantitative phase imaging. To better understand the underlying physics involved in a plethora of ultrafast phenomena, advanced imaging techniques must be developed to observe single events at an ultrafast time scale. Here, we present, to the best of our knowledge, the first ptychographic imaging system capable of observing ultrafast dynamics from a single event. We demonstrate ultrafast dynamic imaging by observing the conduction band electron population from a 2-photon absorption event in ZnSe pumped by a single femtosecond pulse. We verify experimental observations by comparing them to numeric solutions of a nonlinear envelope equation. Our imaging method represents a major step forward in ultrafast imaging, bringing the capabilities of ptychography to the ultrafast regime

Supplementary document for At-Focus Scanning Ptychography for High Resolution Imaging with a Wide Field of View - 6719937.pdf

Supplementary document supporting the main manuscript. The .zip files contains the default Optica Latex template files, main text document, and figures

Supplementary document for At-Focus Scanning Ptychography for High Resolution Imaging with a Wide Field of View - 6719937.pdf

Supplementary document supporting the main manuscript. The .zip files contains the default Optica Latex template files, main text document, and figures

Single-pulse, reference-free, spatiospectral measurement of ultrashort pulse-beams

High-intensity pulse-beams are ubiquitous in scientific investigations and industrial applications ranging from the generation of secondary radiation sources (e.g., high harmonic generation, electrons) to material processing (e.g., micromachining, laser-eye surgery). Crucially, pulse-beams can only be controlled to the degree to which they are characterized, necessitating sophisticated measurement techniques. We present a reference-free, full-field, single-shot spatiospectral measurement technique called broadband single-shot ptychography (BBSSP). BBSSP provides the complex wavefront for each spectral and polarization component in an ultrafast pulse-beam and should be applicable across the electromagnetic spectrum. BBSSP will dramatically improve the application and mitigation of spatiospectral pulse-beam structure

High-resolution ptychographic imaging at a seeded free-electron laser source using OAM beams

International audienceElectromagnetic waves possessing orbital angular momentum (OAM) are powerful tools for applications in optical communications, quantum technologies, and optical tweezers. Recently, they have attracted growing interest since they can be harnessed to detect peculiar helical dichroic effects in chiral molecular media and in magnetic nanostructures. In this work, we perform single-shot per position ptychography on a nanostructured object at a seeded free-electron laser, using extreme ultraviolet OAM beams of different topological charge orders ℓ generated with spiral zone plates. By controlling ℓ, we demonstrate how the structural features of OAM beam profiles determine an improvement of about 30% in image resolution with respect to conventional Gaussian beam illumination. This result extends the capabilities of coherent diffraction imaging techniques, and paves the way for achieving time-resolved high-resolution (below 100 nm) microscopy on large area samples