Positive almost periodic type solutions to a class of nonlinear difference equation

This paper is concerned with positive almost periodic type solutions to a class of nonlinear difference equation with delay. By using a fixed point theorem in partially ordered Banach spaces, we establish several theorems about the existence and uniqueness of positive almost periodic type solutions to the addressed difference equation. In addition, in order to prove our main results, some basic and important properties about pseudo almost periodic sequences are presented

Benzaldehyde thio­semicarbazone monohydrate

In the title compound, C8H9N3S·H2O, intra­molecular N—H⋯N hydrogen bonding contributes to the mol­ecular conformation. Water mol­ecules are involved in inter­molecular N—H⋯O and O—H⋯S hydrogen bonds, which link the mol­ecules into ribbons extended along the a axis. Weak inter­molecular N—H⋯S hydrogen bonds link these ribbons into layers parallel to the ab plane with the phenyl rings pointing up and down

Further Study On U(1) Gauge Invariance Restoration

To further investigate the applicability of the projection scheme for eliminating the unphysical divergence $s/m_e^2$ due to U(1) gauge invariance violation, we study the process $e^-+W^+\to e^-+\bar t+b$ which possesses advantages of simplicity and clearness. Our study indicates that the projection scheme can indeed eliminate the unphysical divergence $s/m_e^2$ caused by the U(1) gauge invariance violation and the scheme can apply to very high energy region.Comment: Latex, 13 pages, 4 EPS fiure

Characterization of Human Metal ESD Reference Discharge Event and Correlation of Generator Parameters to Failure Levels-Part II: Correlation of Generator Parameters to Failure Levels

Most electrostatic discharge (ESD) generators are built in accordance with the IEC 61000-4-2 specifications. It is shown, that the voltage induced in a small loop correlates with the failure level observed in an ESD failure test on the systems comprised of fast CMOS devices, while rise time and derivative of the discharge current did not correlate well. The electric parameters of typical ESD generators and ESD generators that have been modified to reflect the current and field parameters of the human metal reference event are compared and the effect on the failure level of fast CMOS electronics is investigated. The consequences of aligning an ESD standard with the suggestions of the first paper, of this two-paper series, are discussed with respect to reproducibility and test severity

Characterization of Human Metal ESD Reference Discharge Event and Correlation of Generator Parameters to Failure Levels-Part I: Reference Event

Electrostatic discharge (ESD) generators are used for testing the robustness of electronics toward ESD. Most generators are built in accordance with the IEC 61000-4-2 specifications. Using only a few parameters, this standard specifies the peak current, the rise time and the falling edge. Lacking a transient field specification, test results vary depending on which generator is used, even if the currents are quite similar. Such a specification is needed to improve the test repeatability. As for the current, the specification should be based on a reference human metal ESD event. While keeping the presently set peak current and rise time values, such a reference ESD (5 kV, 850-µm arc length) is identified and specifications for current derivative, fields, and induced voltages are derived. The reference event parameters are compared to typical ESD generators

Ceramic Nano-particle/Substrate Interface Bonding Formation Derived from Dynamic Mechanical Force at Room Temperature: HRTEM Examination

The bonding of TiO nano-particle/substrate is a critical factor influencing the performance of dye-sensitized solar cells. In order to reveal the bonding properties at TiO nano-particle/substrate interface, high-resolution transmission electron microscopy (HRTEM) analysis was adopted to TiO coatings prepared by three different approaches. In the HRTEM analysis, the effective bonding mode is allowed to distinguish from the false image overlapping. Results show that large areas of effective bonding between nano-TiO particles and the substrate surface formed in the room temperature cold sprayed coating and mechanically pressed coating, while only limited interface areas with the effective bonding were observed in the coating deposited by non-pressed method. These results confirm that both high impact pressure during the room temperature cold spraying and mechanical pressure contribute to the bonding formation at the particle/substrate interface

Impact of ESD Generator Parameters on Failure Level in Fast CMOS System

Electrostatic discharge (ESD) generators are used for testing the robustness of electronics towards ESD. Most generators are built in accordance with the IEC 61000-4-2 specifications. It is shown that the voltage induced in a small loop correlates with the failure level observed in an ESD failure test on the systems comprising fast CMOS devices, while rise time and current derivative of the discharge current did not correlate well. The electric parameters are compared for typical and modified ESD generators and the effect on the failure level of fast CMOS electronics is investigated. The consequences of aligning an ESD standard with the suggestions of this paper are discussed with respect to reproducibility and test severity

4-Bromo-2-({4-[(hy­droxy­imino)­meth­yl]phen­yl}imino­meth­yl)phenol

In the title compound, C14H11BrN2O2, the mean planes of the two benzene rings are almost parallel to each other, making a dihedral angle of 4.09 (1)°. An intra­molecular O—H⋯N hydrogen bond occurs. In the crystal, inter­molecular O—H⋯N and C—H⋯O hydrogen bonds link the mol­ecules into a chain-like supra­molecular structure