976 research outputs found

    Energy Models for One-Carrier Transport in Semiconductor Devices

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    Moment models of carrier transport, derived from the Boltzmann equation, made possible the simulation of certain key effects through such realistic assumptions as energy dependent mobility functions. This type of global dependence permits the observation of velocity overshoot in the vicinity of device junctions, not discerned via classical drift-diffusion models, which are primarily local in nature. It was found that a critical role is played in the hydrodynamic model by the heat conduction term. When ignored, the overshoot is inappropriately damped. When the standard choice of the Wiedemann-Franz law is made for the conductivity, spurious overshoot is observed. Agreement with Monte-Carlo simulation in this regime required empirical modification of this law, or nonstandard choices. Simulations of the hydrodynamic model in one and two dimensions, as well as simulations of a newly developed energy model, the RT model, are presented. The RT model, intermediate between the hydrodynamic and drift-diffusion model, was developed to eliminate the parabolic energy band and Maxwellian distribution assumptions, and to reduce the spurious overshoot with physically consistent assumptions. The algorithms employed for both models are the essentially non-oscillatory shock capturing algorithms. Some mathematical results are presented and contrasted with the highly developed state of the drift-diffusion model

    Modeling and Simulation of Thermo-Fluid-Electrochemical Ion Flow in Biological Channels

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    In this article we address the study of ion charge transport in the biological channels separating the intra and extracellular regions of a cell. The focus of the investigation is devoted to including thermal driving forces in the well-known velocity-extended Poisson-Nernst-Planck (vPNP) electrodiffusion model. Two extensions of the vPNP system are proposed: the velocity-extended Thermo-Hydrodynamic model (vTHD) and the velocity-extended Electro-Thermal model (vET). Both formulations are based on the principles of conservation of mass, momentum and energy, and collapse into the vPNP model under thermodynamical equilibrium conditions. Upon introducing a suitable one-dimensional geometrical representation of the channel, we discuss appropriate boundary conditions that depend only on effectively accessible measurable quantities. Then, we describe the novel models, the solution map used to iteratively solve them, and the mixed-hybrid flux-conservative stabilized finite element scheme used to discretize the linearized equations. Finally, we successfully apply our computational algorithms to the simulation of two different realistic biological channels: 1) the Gramicidin-A channel considered in~\cite{JeromeBPJ}; and 2) the bipolar nanofluidic diode considered in~\cite{Siwy7}

    On the L2 n-width of certain classes of functions of several variables

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    Applicability of the High Field Model: A Preliminary Numerical Study

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    In a companion presentation, we have discussed the theory of a mesoscopic/ macroscopic model, which can be viewed as an augmented drift-diffusion model. Here, we describe how that model is used. The device we consider for this presentation is the one dimensional GaAs n+−n−n+ structure of length 0.8μm. First, a full Hydro- Dynamic (HD) model, proven reliable when compared with Monte Carlo simulations, is used to simulate the device via the ENO finite difference method. As applied to the full device, the new model is not necessarily superior to traditional Drift-Diffusion (DD). Indeed, when we plot the quantity η= μ0E/kT0/m, where μ0 is the mobility constant and E=−ϕ′ is the electric field, we verify that the high field assumption η › 1, required for the high field model, is satisfied only in an interval given approximately by [0.2, 0.5]. When we run both the DD model and the new high field model in this restricted interval, with boundary conditions of concentration n and potential ϕ provided by the HD results, we demonstrate that the new model outperforms the DD model. This indicates that the high field and DD models should be used only in parts of the device, connected by a transition kinetic regime. This will be a domain decomposition issue involving interface conditions and adequate numerical methods

    Simulating Quasi-Ballistic Transport in Si Nanotransistors

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    Electron transport in model Si nanotransistors is examined by numerical simulation using a hierarchy of simulation methods, from full Boltzmann, to hydrodynamic, energy transport, and drift-diffusion. The on-current of a MOSFET is shown to be limited by transport across a low-field region about one mean-free-path long and located at the beginning of the channel. Commonly used transport models based on simplified solutions of the Boltzmann equation are shown to fail under such conditions. The cause for this failure is related to the neglect of the carriers\u27 drift energy and to the collision-dominated assumptions typically used in the development of simplified transport models

    Mixed-RKDG Finite Element Methods for the 2-D Hydrodynamic Model for Semiconductor Device Simulation

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    In this paper we introduce a new method for numerically solving the equations of the hydrodynamic model for semiconductor devices in two space dimensions. The method combines a standard mixed finite element method, used to obtain directly an approximation to the electric field, with the so-called Runge-Kutta Discontinuous Galerkin (RKDG) method, originally devised for numerically solving multi-dimensional hyperbolic systems of conservation laws, which is applied here to the convective part of the equations. Numerical simulations showing the performance of the new method are displayed, and the results compared with those obtained by using Essentially Nonoscillatory (ENO) finite difference schemes. From the perspective of device modeling, these methods are robust, since they are capable of encompassing broad parameter ranges, including those for which shock formation is possible. The simulations presented here are for Gallium Arsenide at room temperature, but we have tested them much more generally with considerable success
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