26 research outputs found

    X-ray anomalous scattering investigations on the charge order in α\alpha^\prime-NaV2_2O5_5

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    Anomalous x-ray diffraction studies show that the charge ordering in α\alpha^\prime-NaV2_2O5_5 is of zig-zag type in all vanadium ladders. We have found that there are two models of the stacking of layers along \emph{c-}direction, each of them consisting of 2 degenerated patterns, and that the experimental data is well reproduced if the 2 patterns appears simultaneously. We believe that the low temperature structure contains stacking faults separating regions corresponding to the four possible patterns.Comment: Submitted to Phys. Rev. Lett., 4 pages, 4 eps figures inserted in the tex

    X-Ray Scattering Measurements of the Transient Structure of a Driven Charge-Density-Wave

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    We report time-resolved x-ray scattering measurements of the transient structural response of the sliding {\bf Q}1_{1} charge-density-wave (CDW) in NbSe3_{3} to a reversal of the driving electric field. The observed time scale characterizing this response at 70K varies from \sim 15 msec for driving fields near threshold to \sim 2 msec for fields well above threshold. The position and time-dependent strain of the CDW is analyzed in terms of a phenomenological equation of motion for the phase of the CDW order parameter. The value of the damping constant, γ=(3.2±0.7)×1019\gamma = (3.2 \pm 0.7) \times 10^{-19} eV \cdot seconds \cdot \AA3^{-3}, is in excellent agreement with the value determined from transport measurements. As the driving field approaches threshold from above, the line shape becomes bimodal, suggesting that the CDW does not depin throughout the entire sample at one well-defined voltage.Comment: revtex 3.0, 7 figure

    The ThomX project status

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    Work supported by the French Agence Nationale de la recherche as part of the program EQUIPEX under reference ANR-10-EQPX-51, the Ile de France region, CNRS-IN2P3 and Université Paris Sud XI - http://accelconf.web.cern.ch/AccelConf/IPAC2014/papers/wepro052.pdfA collaboration of seven research institutes and an industry has been set up for the ThomX project, a compact Compton Backscattering Source (CBS) based in Orsay - France. After a period of study and definition of the machine performance, a full description of all the systems has been provided. The infrastructure work has been started and the main systems are in the call for tender phase. In this paper we will illustrate the definitive machine parameters and components characteristics. We will also update the results of the different technical and experimental activities on optical resonators, RF power supplies and on the electron gun

    RX & Matière (2015)

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    X-ray resonant powder diffraction

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    X-ray resonant diffraction can be applied in structural chemistry studies on powder samples. It enables an important limitation of powder diffraction to be overcome. This limitation is related to the low ability of powder diffraction to differentiate elements with close atomic numbers when they occupy the same or close crystallographic sites (mixed occupancy case) and also to discriminate cations with different valence states in different sites. However the resonant effect usually has a second order influence on the measured intensity. As a consequence, the efficiency of this method directly implies the need for excellent quality data collection and has generally been better assessed on elements present in single phase powder samples. In recent years, instrumental developments have been made in synchrotron radiation facilities which allow easier use of resonant powder diffraction for site-specific contrast and valence i.e. oxidation state analyses. Moreover, resonant contrast diffraction tools also have been proposed for better visualization of the anomalous effect both in direct and reciprocal space by using differences between electron density maps or diffraction patterns. Finally the potentialities of this technique for de novo structure solution on macromolecular systems are mentioned
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