Resonant elastic X-ray scattering: Where from? where to?

Authors: A. Kirfel
A. Kirfel
A. Rogalev
A. Rogalev
A. Snigerev
A. Stunault
A.H. Moudden
B. Lee
B.T. Thole
B.T. Thole
C. Brouder
C. Giles
C. Gutt
C. Mazzoli
C. Vettier
C. Vettier
C. Wang
D. Gibbs
D. Gibbs
D. Gibbs
D. Mannix
D.B. McWhan
D.H. Bilderback
D.H. Templeton
D.H. Templeton
G. Beutier
G.H. Lander
G.M. Watson
H. Ade
H. Jang
H. Renevier
H. Stragier
H.B. Stuhrmann
I. Pickering
I. Zegkinoglou
I.J. Pickering
I.S. Elfimov
J. Blasco
J. Fernández-Rodríguez
J. Goulon
J. Goulon
J. Kokubun
J. Kokubun
J.-I. Igarashi
J.E. Lorenzo
J.L. Hodeau
J.M. Bijvoet
J.M. Tonnerre
J.P. Hannon
J.P. Hill
J.R. Helliwell
J.W. Kim
K. Kuzushita
K. Namikawa
K.D. Finkelstein
K.J. Thomas
L. Braicovich
L. Paolasini
L.J.P. Ament
L.S. Hirst
M. Altarelli
M. Benfatto
M. Guarise
M. Helliwell
M. Sztucki
M. Veenendaal van
N. Bernhoeft
N. Bernhoeft
N.A. Katcho
O. Bunau
P. Carra
P. Carra
R. Fourme
R. Kahn
R. Kahn
R. Magalhães-Paniago
S. Ferrer
S. Hosokawa
S. Langridge
S. Matteo Di
S. Swaraj
S.B. Wilkins
S.B. Wilkins
S.P. Collins
S.W. Lovesey
S.W. Lovesey
T. Araki
T. Vad
T.U. Schülli
U. Staub
V. Favre-Nicolin
V. Scagnoli
V.E. Dmitrienko
W.A. Hendrickson
Y. Endoh
Y. Joly
Y. Murakami
Y. Soejima
Y. Tanaka
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Publisher: 'Springer Science and Business Media LLC'
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Last time updated on 05/06/2019