Energies and widths of atomic core-levels in liquid mercury

High-resolution measurements of the photoinduced X-ray emission of liquid mercury were performed, using a transmission DuMond-type crystal spectrometer for transitions above 11 keV and a reflection von Hamos-type crystal spectrometer for transitions below 11 keV. The target X-ray fluorescence was produced by irradiating the sample with the Bremsstrahlung from X-ray tubes. The energies and natural linewidths of 6 K-shell, 26 L-shell and 2 M-shell X-ray transitions were determined. Using a least-squares-fit method to solve the two sets of equations derived from the observed transition energies and transition widths the binding energies of the subshells K to M5 and O1 and the level widths of the subshells K to N5 and O1 could also be determine

Double K-shell photoionization of low-Z atoms and He-like ions

We report on the investigation of the photon energy dependence of double 1s photoionization of light atoms and compare the cross sections for hollow atom and He-like ion production. Measurements of the Kα hypersatellite x-ray spectra of Mg, Al, and Si were carried out using the Fribourg high-resolution x-ray spectrometer installed at the ID21 and ID26 beam lines at the ESRF. The double-to-single photoionization cross section ratios were derived as a function of the incident photon beam energy and compared to convergent close-coupling (CCC) calculations for He-like ions. The dynamical electron-electron scattering contribution to the DPI cross-sections was found to be more important for neutral atoms than for the He isoelectronic serie

Application of the high-resolution grazing-emission x-ray fluorescence method for impurities control in semiconductor nanotechnology

We report on the application of synchrotron radiation based high-resolution grazing-emission x-ray fluorescence (GEXRF) method to measure low-level impurities on silicon wafers. The presented high-resolution GEXRF technique leads to direct detection limits of about 10¹²  atoms/cm². The latter can be presumably further improved down to 10⁷  atoms/cm² by combining the synchrotron radiation-based GEXRF method with the vapor phase decomposition preconcentration technique. The capability of the high-resolution GEXRF method to perform surface-sensitive elemental mappings with a lateral resolution of several tens of micrometers was probed